Memory devices configured to test data path integrity

1. A memory device, comprising:

an array of memory cells;

a first register in communication with the array of memory cells;

a second register in communication with the first register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the first register;

load the first set of data into a first portion of the second register;

receive a set of test data from an external device;

write the set of test data to a second portion of the second register during a reading of a second set of data from the array of memory cells to the first register, wherein the second portion of the second register is different than the first portion of the second register;

read the set of test data from the second portion of the second register during the reading of the second set of data from the array of memory cells to the first register; and

output the set of test data, read from the second portion of the second register, from the memory device during the reading of the second set of data from the array of memory cells to the first register.

2. The memory device of claim 1 , wherein the reading of the second set of data from the array of memory cells to the first register comprises performing a read operation on the array of memory cells.

3. The memory device of claim 1 , wherein the controller is configured to accept the sequence of commands in a debug mode of the memory device.

4. The memory device of claim 1 , wherein the controller is further configured to accept a command to cause the memory device to enter a debug mode of the memory device prior to loading the first set of data to the first portion of the second register.

5. The memory device of claim 4 , wherein the controller is configured to accept the sequence of commands only in the debug mode.

6. The memory device of claim 1 , wherein the first register is a page register of the memory device and wherein the second register is a cache register of the memory device.

7. A memory device, comprising:

an array of memory cells;

a first register in communication with the array of memory cells;

a second resister in communication with the first register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the first register;

load the first set of data into a first portion of the second register;

write a set of test data to a second portion of the second register during a reading of a second set of data from the array of memory cells to the first register, wherein the second portion of the second register is different than the first portion of the second register;

read the set of test data from the second portion of the second register during the reading of the second set of from the array of memory cells to the first register; and

output the set of test data, read from the second portion of the second register, from the memory device during the reading of the second set of data from the array of memory cells to the first register; and

wherein the controller is further configured to accept commands to cause the memory device to:

enter a debug mode of the memory device prior to loading the first set of data into the first portion of the second register; and

exit the debug mode after outputting the set of test data read from the second portion of the second register.

8. A memory device, comprising:

an array of memory cells;

a first register in communication with the array of memory cells;

a second register in communication with the first register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the first register;

load the first set of data into a first portion of the second register;

write a set of test data to a second portion of the second register during a reading of a second set of data from the array of memory cells to the first register, wherein the second portion of the second register is different than the first portion of the second register;

read the set of test data from the second portion of the second register during the reading of the second set of data from the array of memory cells to the first register; and

output the set of test data, read from the second portion of the second register, from the memory device during the reading of the second set of data from the array of memory cells to the first register;

wherein the controller being configured to cause the memory device to read the set of test data from the second portion of the second register comprises the controller being configured to cause the memory device to read data from the first portion of the second register and from the second portion of the second register.

9. A memory device, comprising:

an array of memory cells;

a first register in communication with the array of memory cells;

a second register in communication with the first register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the first register;

load the first set of data into a first portion of the second register;

write a set of test data to a second portion of the second register during a reading of a second set of data from the array of memory cells to the first register, wherein the second portion of the second register is different than the first portion of the second register;

read the set of test data from the second portion of the second register during the reading of the second set of data from the array of memory cells to the first register; and

output the set of test data, read from the second portion of the second register, from the memory device during the reading of the second set of data from the array of memory cells to the first register;

wherein the controller being configured to cause the memory device to read the set of test data from the second portion of the second register comprises the controller being configured to cause the memory device to read the set of test data from the second portion of the second register without reading data from the first portion of the second register.

10. The memory device of claim 9 , wherein the controller is further configured to accept a command to cause the memory device to clear the second register during the reading of the second set of data and prior to writing the set of test data to the second portion of the second register.

11. A memory device, comprising:

an array of memory cells;

a first register in communication with the array of memory cells;

a second register in communication with the first register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the first register;

load the first set of data into a first portion of the second register;

clear the second register after loading the first set of data into the second register and during a reading of a second set of data from the array of memory cells to the first register, then write a set of test data to a second portion of the cleared second register during the reading of the second set of data from the array of memory cells to the first register;

read the set of test data from the second portion of the cleared second register during the reading of the second set of data from the array of memory cells to the first register; and

outputting the set of test data, read from the second portion of the cleared second register, from the memory device.

12. The memory device of claim 11 , wherein the controller being configured to cause the memory device to write the set of test data to the second portion of the cleared second register comprises the controller being configured to cause the memory device to write the set of test data to any portion of the cleared second register.

13. The memory device of claim 11 , wherein the controller being configured to cause the memory device to read the set of test data from the second portion of the second register comprises the controller being configured to cause the memory device to read only the set of test data that was written to the second portion of the second register.

14. A memory device, comprising:

an array of memory cells;

a page register in communication with the array of memory cells;

a cache register in communication with the page register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the page register;

load the first set of data into a first portion of the cache register;

receive a set of test data from an external device;

write the set of test data to a second portion of the cache register during a reading of a second set of data from the array of memory cells to the page register, wherein the second portion of the cache register is mutually exclusive from the first portion of the cache register;

read the set of test data from the second portion of the cache register during the reading of the second set of data from the array of memory cells to the page register; and

output the set of test data, read from the second portion of the cache register, from the memory device during the reading of the second set of data from the array of memory cells to the page register.

15. The memory device of claim 14 , wherein the controller is configured to accept the sequence of commands in a debug mode of the memory device.

16. The memory device of claim 14 , wherein the controller is further configured to accept a command to cause the memory device to enter a debug mode of the memory device prior to loading the first set of data to the first portion of the cache register.

17. The memory device of claim 16 , wherein the controller is configured to accept the sequence of commands only in the debug mode.

18. A memory device, comprising:

an array of memory cells;

a page register in communication with the array of memory cells;

a cache register in communication with the page register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the page register;

load the first set of data into a first portion of the cache register;

write a set of test data to a second portion of the cache register during a reading of a second set of data from the array of memory cells to the page register, wherein the second portion of the cache register is mutually exclusive from the first portion of the cache register;

read the set of test data from the second portion of the cache register during the reading of the second set of data from the array of memory cells to the page register; and

output the set of test data, read from the second portion of the cache register, from the memory device during the reading of the second set of data from the array of memory cells to the page register; and

wherein the controller is further configured to accept commands to cause the memory device to:

enter a debug mode of the memory device prior to loading the first set of data into the first portion of the cache register; and

exit the debug mode after outputting the set of test data read from the second portion of the cache register.

19. A memory device, comprising:

an array of memory cells;

a page register in communication with the array of memory cells;

a cache register in communication with the page register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the page register;

load the first set of data into a first portion of the cache register;

write a set of test data to a second portion of the cache register during a reading of a second set of data from the array of memory cells to the page register, wherein the second portion of the cache register is mutually exclusive from the first portion of the cache register;

read the set of test data from the second portion of the cache register during the reading of the second set of data from the array of memory cells to the page register; and

output the set of test data, read from the second portion of the cache register, from the memory device during the reading of the second set of data from the array of memory cells to the page register;

wherein the controller being configured to cause the memory device to read the set of test data from the second portion of the cache register comprises the controller being configured to cause the memory device to read the set of test data from the second portion of the cache register and to read the first set of data from the first portion of the cache register.

20. A memory device, comprising:

an array of memory cells;

a page register in communication with the array of memory cells;

a cache register in communication with the page register; and

a controller for access of the array of memory cells;

wherein the controller is configured to accept a sequence of commands to cause the memory device to:

read a first set of data from the array of memory cells into the page register;

load the first set of data into a first portion of the cache register;

write a set of test data to a second portion of the cache register during a reading of a second set of data from the array of memory cells to the page register, wherein the second portion of the cache register is mutually exclusive from the first portion of the cache register;

read the set of test data from the second portion of the cache register during the reading of the second set of data from the array of memory cells to the page register; and

output the set of test data, read from the second portion of the cache register, from the memory device during the reading of the second set of data from the array of memory cells to the page register;

wherein the controller being configured to cause the memory device to read the set of test data from the second portion of the cache register comprises the controller being configured to cause the memory device to read the set of test data from the second portion of the cache register without reading data from the first portion of the cache register.