Ultrasound probe with row-column addressed array

1. An inspection system comprising:

a pair of probes, including a transmitting and a receiving probe, configured to be placed on a testing surface;

the transmitting probe to transmit an ultrasound wave, including

a first row-column addressed (RCA) array,

a first wedge positioned to establish the first RCA array at a first wedge angle relative to the testing surface, and

a control circuit to operate the first RCA array to transmit the ultrasound wave in a first or second transmission configuration, wherein

in the first transmission configuration, the control circuit to drive a subset of columns with a pulse signal, couple a subset of rows to ground, and couple remaining rows and columns to a high impedance, and

in the second transmission configuration, the control circuit to drive the subset of rows with the pulse signal, couple the subset of columns to ground, and couple remaining rows and columns to a high impedance; and

the receiving probe to receive a reflection of the ultrasound wave, including

a second RCA array, and

a second wedge positioned to establish the second RCA array at a second wedge angle relative to the testing surface.

2. The inspection system of claim 1 , wherein the first RCA array includes a plurality of row and column electrodes, wherein the row and column electrodes are configurable to have at least four states: 1) a transmission state, 2) a reception state, 3) a ground state, and 4) a high impedance state.

3. The inspection system of claim 1 , wherein the second RCA array includes a plurality of row and column electrodes, wherein the row and column electrodes are configurable to have at least four states: 1) a transmission state, 2) a reception state, 3) a ground state, and 4) a high impedance state.

4. The inspection system of claim 1 , further comprising a receiving control circuit to operate the second RCA array in a first or second reception configuration, wherein

in the first reception configuration, the receiving control circuit to receive the reflection on a subset of columns, couple a subset of rows to ground, and couple remaining rows and columns to high impedance, and

in the second reception configuration, the receiving control circuit to receive the reflection on the subset of rows, couple the subset of columns to ground, and couple remaining rows and columns to high impedance.

5. The inspection system of claim 1 , wherein the transmitting probe is configured to operate in a linear scan mode.

6. The inspection system of claim 1 , wherein the transmitting probe is configured to operate in a transmission beam steering mode.

7. The inspection system of claim 1 , wherein the receiving probe is configured to operate in a reception beam steering mode.

8. A method to detect flaws in a testing object, the method comprising:

placing a first probe on a surface of the testing object at a first wedge angle;

placing a second probe on the surface at a second wedge angle;

selecting a first or second transmission configuration;

transmitting, from the first probe, an ultrasound wave into the testing object using a first row-column addressed (RCA) array based on the selecting, wherein the ultrasound wave is transmitted through a transmission aperture defined by an intersection of rows and columns of the first RCA array, wherein

in the first transmission configuration, driving a subset of columns with a pulse signal, coupling a subset of rows to ground, and coupling remaining rows and columns to high impedance; and

in the second transmission configuration, driving the subset of rows with the pulse signal, coupling the subset of columns to ground, and coupling remaining rows and columns to high impedance; and

receiving, at the second probe, a reflection of the ultrasound wave using a second RCA array.

9. The method of claim 8 , wherein the reflection is received through a reception aperture, which is defined by an intersection of rows and columns of the second RCA array.

10. The method of claim 9 , further comprising receiving the reflection in a first or second reception configuration, wherein

in the first reception configuration, receiving the reflection on the subset of columns, coupling the subset of rows to ground, and coupling remaining rows and columns to a high impedance; and

in the second reception configuration, receiving the reflection on the subset of rows with a pulse signal, coupling the subset of columns to ground, and coupling remaining rows and columns to a high impedance.

11. The method of claim 8 , further comprising:

operating the first probe in a linear scan mode.

12. The method of claim 8 , further comprising:

operating the second probe in a linear scan mode.

13. The method of claim 8 , further comprising:

operating the first probe in a beam steering mode.

14. The method of claim 8 , further comprising:

operating the second probe in a beam steering mode.

15. A method to detect imperfections in a testing object, the method comprising:

transmitting, from a transmitting probe, an ultrasound wave into a testing object using a first row-column addressed (RCA) array through a transmission aperture defined by selected elements in the first RCA array based on selecting a first or second transmission configuration, wherein

in the first transmission configuration, driving a subset of columns with a pulse signal, coupling a subset of rows to ground, and coupling remaining rows and columns to high impedance; and

in the second transmission configuration, driving the subset of rows with the pulse signal, coupling the subset of columns to ground, and coupling remaining rows and columns to high impedance; and

receiving, at a receiving probe positioned face-to-face with the transmitting probe, a reflection of the ultrasound wave using a second RCA array through a reception aperture defined by selected elements in the second RCA array.

16. The method of claim 15 , further comprising:

placing the transmitting probe at a first wedge angle on a surface of the testing object; and

placing the receiving probe at a second wedge angle on the surface of the testing object.

17. The method of claim 15 , further comprising:

selecting a first or second reception configuration, wherein

in the first reception configuration, receiving the reflection on a subset of columns of the second RCA array, coupling a subset of rows of the second RCA array to ground, and coupling remaining rows and columns of the second RCA array to high impedance; and

in the second reception configuration, receiving the reflection on the subset of rows of the second RCA array, coupling the subset of columns of the second RCA array to ground, and coupling remaining rows and columns of the second RCA array to high impedance.