IP Library Granted Patent US 11,038,082
Granted Patent B2
US 11,038,082 · App. 16/841,144 · Granted Jun 15, 2021

Method of separating light emitting devices formed on a substrate wafer

Inventors: Filip Ilievski (San Jose, CA); Norbertus Antonius Maria Sweegers (Eindhoven, NL); Kwong-Hin Henry Choy (San Jose, CA); Marc Andre De Samber (Lommel, BE)
Assignee: Lumileds LLC
H01L33/0095H01L33/007H01L33/0093H01L21/78H01L33/20
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Quick Facts
Patent No.
US 11,038,082
App. No.
16/841,144
Granted
Jun 15, 2021
Kind
B2
Abstract

A method comprises forming a mask on a first surface of a substrate. The mask is patterned to form openings on the first surface of the substrate. Notches are formed in the first surface of the substrate in the openings. The mask is removed from the first surface of the substrate A plurality of LEDs are provided on the first surface of the substrate and between notches. A second surface of the substrate is thinned to expose the notches and separate the LEDs. The second surface of the substrate is opposite of the first surface of the substrate.

Claims (30)

1. A method comprising:

forming a mask on a first surface of a substrate;

patterning the mask to form openings on the first surface of the substrate;

thinning a second surface of the substrate that is opposite of the first surface of the substrate;

forming cracks in the first surface of the substrate in the openings;

removing the mask from the first surface of the substrate;

providing a plurality of light emitting devices (LEDs) on the first surface of the substrate, such that an LED of the plurality of LEDs is between the cracks; and

thinning the second surface of the substrate to expose the cracks and separate the LEDs.

2. The method of claim 1 , wherein the cracks are formed using at least one of dry etching and wet etching.

3. The method of claim 1 , wherein forming cracks in the substrate comprises sawing or laser scribing the cracks in the substrate.

4. The method of claim 1 , wherein the cracks are at least one micron deep.

5. The method of claim 1 , wherein the cracks are at least one micron wide.

6. The method of claim 1 , wherein the substrate is sapphire.

7. The method of claim 1 , wherein, after thinning the second surface of the substrate to expose the cracks and separate the LEDs, a portion of the substrate remains attached to each of the LEDs.

8. The method of claim 1 , wherein an LED comprises at least an n-type region, an active region, and a p-type region.

9. The method of claim 1 further comprising connecting the plurality of LEDs to wafer handling tape before thinning the second surface of the substrate to expose the cracks and separate the LEDs.

10. A method comprising:

providing a semiconductor structure on a first surface of a substrate;

forming openings in the semiconductor structure to expose portions of the first surface of the substrate and to separate the semiconductor structure into a plurality of light emitting devices (LEDs);

thinning a second surface of the substrate that is opposite of the first surface of the substrate;

forming cracks in the first surface of the substrate in the openings; and

thinning the second surface of the substrate to expose the cracks and separate the LEDs.

11. The method of claim 10 , wherein the cracks are formed using at least one of dry etching and wet etching.

12. The method of claim 10 , wherein forming cracks in the substrate comprises sawing or laser scribing the cracks in the substrate.

13. The method of claim 10 , wherein the cracks are at least one micron deep.

14. The method of claim 10 , wherein the cracks are at least one micron wide.

15. The method of claim 10 , wherein the substrate is sapphire.

16. The method of claim 10 , wherein, after thinning the second surface of the substrate to expose the cracks and separate the LEDs, a portion of the substrate remains attached to each of the LEDs.

17. The method of claim 10 , wherein an LED comprises at least an n-type region, an active region, and a p-type region.

18. The method of claim 10 further comprising connecting the plurality of LEDs to wafer handling tape before thinning the second surface of the substrate to expose the cracks and separate the LEDs.

Assignments (8)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 10, 2025
From: LUMILEDS LLC
To: LUMILEDS SINGAPORE PTE. LTD.
Reel/Frame 071888/0086 →
RELEASE OF SECURITY INTEREST Recorded Jan 29, 2025
From: SOUND POINT AGENCY LLC
To: LUMILEDS LLC; LUMILEDS HOLDING B.V.
Reel/Frame 070046/0001 →
SECURITY INTEREST Recorded Jan 5, 2023
From: LUMILEDS LLC; LUMILEDS HOLDING B.V.
To: SOUND POINT AGENCY LLC
Reel/Frame 062299/0338 →
PATENT SECURITY AGREEMENT Recorded Dec 9, 2022
From: LUMILEDS, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 062114/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE SPELLING OF THE FIRST ASSIGNOR'S NAME ILIEVSKY, FILIP PREVIOUSLY RECORDED ON REEL 055375 FRAME 0532. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Mar 1, 2021
From: ILIEVSKI, FILIP; SWEEGERS, NORBERTUS ANTONIUS MARIA; CHOY, KWONG-HIN HENRY; DE SAMBER, MARC ANDRE
To: KONINKLIJKE PHILIPS N.V.
Reel/Frame 055468/0109 →
SECURITY INTEREST Recorded Feb 23, 2021
From: LUMILEDS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 055381/0529 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2021
From: KONINKLIJKE PHILIPS N.V.
To: LUMILEDS LLC
Reel/Frame 055375/0560 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 23, 2021
From: ILIEVSKY, FILIP; SWEEGERS, NORBERTUS ANTONIUS MARIA; CHOY, KWONG-HIN HENRY; DE SAMBER, MARC ANDRE
To: KONINKLIJKE PHILIPS N.V.
Reel/Frame 055375/0532 →