In situ determination of refractive index of materials
A laser eye surgery system focuses light along a beam path to a focal point having a location within a lens of the eye. The refractive index of the lens is determined in response to the location. The lens comprises a surface adjacent a second material having a second refractive index. The beam path extends a distance from the surface to the focal point. The index is determined in response to the distances from the surface to the targeted focal point and from the surface to the actual focal point, which corresponds to a location of a peak intensity of an optical interference signal of the focused light within the lens. The determined refractive index is mapped to a region in the lens, and may be used to generate a gradient index profile of the lens to more accurately place laser beam pulses for incisions.
1. An apparatus for determining an index of refraction of a material, comprising:
a tomography system comprising a light source to generate a beam of light; and
a processor comprising a tangible medium coupled to the tomography system and configured to receive data from the tomography system,
wherein the tangible medium embodies instructions to determine an index of refraction of the material in response to a location of a focal point of the beam, including to:
focus the light beam into the material to an intended focal point having an intended location;
identify a location of an interference signal of the focused light;
determine an index of refraction of the target material in response to the intended focal point location and the determined interference signal location; and
map the determined index of refraction to the location of the material.
2. The apparatus of claim 1 , further comprising:
a pulsed laser to generate a pulsed laser beam to incise the material; and
an optical delivery system coupled to the laser beam, the tomography system, and the processor,
wherein the tangible medium further comprises instructions to
determine a treatment profile in response to the index of refraction.
3. The apparatus of claim 2 , wherein the tangible medium further embodies instructions to determine a profile of the material in response to the mapping of the determined index of refraction to the location of the material and to incise the material in response to the profile of the material with the laser.
4. The apparatus of claim 1 ,
wherein the tomography system comprises one or more of an optical coherence tomography system, a spectral optical coherence tomography system, a time domain optical coherence tomography system, a Scheimpflug imaging tomography system, a confocal tomography system, or a low coherence reflectometry system and wherein the location of the focal point is determined with the tomography system.
5. An apparatus for determining an index of refraction of a material, comprising:
a tomography system comprising a light source to generate a beam of light;
a processor comprising a tangible medium coupled to the tomography system and configured to receive data from the tomography system;
a pulsed laser to generate a pulsed laser beam which comprises first one or more wavelengths to incise the material and to generate a second pulsed laser beam which comprises second one or more wavelengths different from said first one or more wavelengths; and
an optical delivery system coupled to the laser beam, the tomography system, and the processor,
wherein the tangible medium comprises instructions to:
determine an index of refraction of the material for the first one or more wavelengths in response to a location of a focal point of the beam,
determine a treatment profile in response to the index of refraction, and
determine a plurality of focus positions of the second pulsed laser beam comprising the second one or more wavelengths in response to the index of refraction of the material for the first one or more wavelengths.
6. The apparatus of claim 5 , wherein the tomography system comprises one or more of an optical coherence tomography system, a spectral optical coherence tomography system, a time domain optical coherence tomography system, a Scheimpflug imaging tomography system, a confocal tomography system, or a low coherence reflectometry system and wherein the location of the focal point is determined with the tomography system.
7. An apparatus for determining an index of refraction of a material, comprising:
a tomography system comprising a light source to generate a beam of light;
a processor comprising a tangible medium coupled to the tomography system and configured to receive data from the tomography system;
a pulsed laser to generate a pulsed laser beam to incise the material; and
an optical delivery system coupled to the laser beam, the tomography system, and the processor,
wherein the tangible medium comprises instructions to:
determine an index of refraction of the material in response to a location of a focal point of the beam,
determine a treatment profile in response to the index of refraction, and
determine instructions of an incision profile of a second structure posterior to the material in response to the index of refraction of the material.
8. The apparatus of claim 7 , wherein the tomography system comprises one or more of an optical coherence tomography system, a spectral optical coherence tomography system, a time domain optical coherence tomography system, a Scheimpflug imaging tomography system, a confocal tomography system, or a low coherence reflectometry system and wherein the location of the focal point is determined with the tomography system.
9. An apparatus for determining an index of refraction of a material, comprising:
a tomography system comprising a light source to generate a beam of light; and
a processor comprising a tangible medium coupled to the tomography system and configured to receive data from the tomography system,
wherein the tangible medium embodies instructions to:
determine at least one index of refraction of the material in response to at least one location of a focal point of the beam,
determine a plurality of indices of refraction of a plurality of tissue structures of an eye along an optical path to a targeted tissue structure of an eye, and
determine a focus position of a pulsed laser beam to incise tissue in response to the plurality of indices of refraction along the optical path, the plurality of tissue structures comprising one or more of a tear film, a cornea, an aqueous humor, a lens, an anterior lens capsule, an anterior lens cortex, a lens nucleus, a posterior lens cortex, a posterior lens capsule or a vitreous humor of the eye.
10. The apparatus of claim 9 , further comprising:
a pulsed laser to generate a pulsed laser beam to incise the material; and
an optical delivery system coupled to the laser beam, the tomography system, and the processor,
wherein the tangible medium further comprises instructions to determine a treatment profile in response to the index of refraction.
11. The apparatus of claim 9 , wherein the tomography system comprises one or more of an optical coherence tomography system, a spectral optical coherence tomography system, a time domain optical coherence tomography system, a Scheimpflug imaging tomography system, a confocal tomography system, or a low coherence reflectometry system and wherein the location of the focal point is determined with the tomography system.