Tactile touch sensor system and method
A tactile touch sensor (TTS) system and method allowing physical augmentation of a high-resolution touch sensor array (TSA) is disclosed. Physical augmentation is accomplished using a TSA physical overlay (TPO) placed on top of the TSA. The TPO is constructed to transmit forces to the underlying TSA. Force transmission is accomplished by either using a flexible overlay or with a rigid mechanical overlay that transmits user forces exerted on the overlay to the underlying TSA. Incorporation of TPO identifiers (TPI) within the TPO permits identification of the TPO by a TPO detector (TPD) allowing operational characteristics of the TSA to be automatically reconfigured to conform to the currently applied TPO structure by a user computing device (UCD). The UCD may be configured to automatically load an appropriate application software driver (ASD) in response to a TPI read by the TPD from the currently applied TPO.
1. A system comprising:
a touch sensor comprising a surface, wherein the surface is configured to receive a first interface overlay, and wherein the first interface overlay is configured to receive a first force; and
a magnetometer configured to:
scan for the presence of a first magnet comprised with the first interface overlay at a periodic interval, wherein the periodic interval is selected based on an estimated time to replace the first interface overlay with a second interface overlay, and
based on a characteristic of the first magnet, identify the first interface overlay, resulting in an identified overlay, wherein the touch sensor is configured to generate touch data based on the first force and the identified overlay.
2. The system of claim 1 , wherein the receiving of the first interface overlay comprises releasably attaching the first interface overlay to the surface by employing the first magnet.
3. The system of claim 2 , wherein the surface is further configured to receive the second interface overlay by employing a second magnet with the second interface overlay, wherein the second magnet is with the second interface overlay at a different position than the first magnet, relative to the surface.
4. The system of claim 1 , wherein the characteristic of the first magnet comprises a placement of the first magnet with the first interface overlay.
5. The system of claim 4 , wherein the identifying the first interface overlay is further based on a third magnet comprised with the first interface overlay, wherein the characteristic of the first magnet comprises the placement of the first magnet in relation to the third magnet.
6. The system of claim 1 , wherein the first magnet is embedded in the first interface overlay.
7. The system of claim 1 , wherein the magnetometer is further configured to be activated to identify the first interface overlay based on a detection of a presence of the first magnet.
8. A method comprising:
receiving, by a system comprising a processor, a first interface overlay configured to receive a force;
scanning for the presence of a first magnet comprised with the first interface overlay at a periodic interval, wherein the periodic interval is selected based on an estimated time to replace the first interface overlay with a second interface overlay;
identifying, by the system, the first interface overlay based on a characteristic of the first magnet comprised with the first interface overlay, resulting in an identified overlay; and
generating, by the system, a touch data based on a characteristic of the force and the identified overlay.
9. The method of claim 8 , wherein the receiving of the first interface overlay comprises releasably attaching the first interface overlay by employing the first magnet.
10. The method of claim 9 , further comprising, receiving the second interface overlay by employing a second magnet with the second interface overlay, wherein the second magnet is with the second interface overlay at a different position relative to the surface.
11. The method of claim 8 , wherein the characteristic of the first magnet comprises a placement of the first magnet with the first interface overlay.
12. The method of claim 11 , wherein the identifying the first interface overlay is further based on a second magnet comprised with the first interface overlay, wherein the characteristic of the first magnet comprises the placement of the first magnet in relation to the second magnet.
13. The method of claim 8 , wherein the first magnet is embedded in the first interface overlay.
14. A system comprising,
a first interface overlay configured to be received by a surface of a device, wherein the device is configured to receive first force based on a second force received via the first interface overlay;
a magnet with the interface overlay, wherein the device is first configured to generate an interface event based on the first force and a characteristic of the magnet detected by the device; and
a magnetometer configured to scan for the presence of the first magnet at a periodic interval, wherein the periodic interval is selected based on an estimated time to replace the first interface overlay with a second interface overlay.
15. The system of claim 14 , wherein the characteristic of the magnet comprises a placement of the magnet with the interface overlay.
16. The system of claim 14 , wherein the magnet is embedded in the interface overlay.
17. The system of claim 14 , wherein the interface overlay is configured to be received by the surface of the device by releasably attaching to the surface.
18. The system of claim 17 , wherein the interface overlay is configured to be releasably attached to the surface via a magnetic force of the magnet.