IP Library Granted Patent US 11,568,173
Granted Patent B2
US 11,568,173 · App. 16/892,347 · Granted Jan 31, 2023

Method and apparatus for processing test execution logs to detremine error locations and error types

Inventors: Malak Alshawabkeh (Franklin, MA); Motasem Awwad (Franklin, MA); Samer Badran (Wakefield, MA); Swapnil Chaudhari (Franklin, MA)
Assignee: Dell Products, L.P.
G06K9/6259G06F11/006G06F11/3692G06F40/30G06K9/6223G06K9/6282G06N3/0454G06F11/3608G06F11/3684G06F11/3688G06K9/6215G06K9/6227G06K9/6228G06K9/6256G06K9/6263G06K9/6267G06K9/6269G06N3/088
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Quick Facts
Patent No.
US 11,568,173
App. No.
16/892,347
Granted
Jan 31, 2023
Kind
B2
Abstract

A method of processing test execution logs to determine error location and source includes creating a set of training examples based on previously processed test execution logs, clustering the training examples into a set of clusters using an unsupervised learning process, and using training examples of each cluster to train a respective supervised learning process to label data where each generated cluster is used as a class/label to identify the type of errors in the test execution log. The labeled data is then processed by supervised learning processes, specifically a classification algorithm. Once the classification model is built it is used to predict the type of the errors in future/unseen test execution logs. In some embodiments, the unsupervised learning process is a density-based spatial clustering of applications with noise clustering application, and the supervised learning processes are random forest deep neural networks.

Claims (28)

1. A method of processing test execution logs to determine error locations and types, comprising:

creating training examples from labeled test execution logs, the test execution logs describing actions that occurred in connection with execution of one or more tests on a storage system;

clustering the training examples into two or more clusters based on features of the test execution logs using an unsupervised learning process;

using the training examples of each cluster to train a separate respective supervised learning process for the cluster to learn a regression between features of the test execution logs and error types associated with the labels;

assigning a new unlabeled test execution log to one of the clusters based on features of the new unlabeled test execution log; and

using the trained supervised learning process for the respective one of the clusters to determine a label for the new unlabeled test execution log.

2. The method of claim 1 , wherein the step of clustering is implemented using a DBSCAN (Density-Based Spatial Clustering of Applications with Noise) clustering process.

3. The method of claim 1 , wherein creating training examples comprises parsing the test execution logs, performing a keyword identification on each of the test execution logs, constructing a feature space based on the keyword identification, and performing a similarity comparison between the training examples.

4. The method of claim 3 , wherein the step of performing the keyword identification comprises extracting the features from the test execution logs using a statistical text mining algorithm.

5. The method of claim 4 , wherein the statistical text mining algorithm is a bag-of-words algorithm.

6. The method of claim 1 , wherein each separate respective supervised learning process is a deep neural network.

7. The method of claim 6 , wherein each separate respective supervised learning process is a random forest of deep neural networks.

8. The method of claim 1 , wherein the label is an error type and location of an error describe by the new unlabeled test execution log.

9. The method of claim 1 , further comprising attaching the determined label to the new unlabeled test execution log.

10. A non-transitory tangible computer readable storage medium having stored thereon a computer program for processing test execution logs to determine error locations and types, the computer program including a set of instructions which, when executed by a computer, cause the computer to perform a method comprising the steps of:

creating training examples from labeled test execution logs, the test execution logs describing actions that occurred in connection with execution of one or more tests on a storage system;

clustering the training examples into two or more clusters based on features of the test execution logs using an unsupervised learning process;

using the training examples of each cluster to train a separate respective supervised learning process for the cluster to learn a regression between features of the test execution logs and error types associated with the labels;

assigning a new unlabeled test execution log to one of the clusters based on features of the new unlabeled test execution log; and

using the trained supervised learning process for the respective one of the clusters to determine a label for the new unlabeled test execution log.

11. The non-transitory tangible computer readable storage medium of claim 10 , wherein the step of clustering is implemented using a DBSCAN (Density-Based Spatial Clustering of Applications with Noise) clustering process.

12. The non-transitory tangible computer readable storage medium of claim 10 , wherein creating training examples comprises parsing the test execution logs, performing a keyword identification on each of the test execution logs, constructing a feature space based on the keyword identification, and performing a similarity comparison between the training examples.

13. The non-transitory tangible computer readable storage medium of claim 12 , wherein the step of performing the keyword identification comprises extracting the features from the test execution logs using a statistical text mining algorithm.

14. The non-transitory tangible computer readable storage medium of claim 13 , wherein the statistical text mining algorithm is a bag-of-words algorithm.

15. The non-transitory tangible computer readable storage medium of claim 10 , wherein each separate respective supervised learning process is a deep neural network.

16. The non-transitory tangible computer readable storage medium of claim 15 , wherein each separate respective supervised learning process is a random forest of deep neural networks.

17. The non-transitory tangible computer readable storage medium of claim 10 , wherein the label is an error type and location of an error describe by the new unlabeled test execution log.

18. The non-transitory tangible computer readable storage medium of claim 10 , further comprising attaching the determined label to the new unlabeled test execution log.

Assignments (9)
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL/FRAME (053578/0183) Recorded Jun 10, 2022
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
To: DELL PRODUCTS L.P.; EMC IP HOLDING COMPANY LLC
Reel/Frame 060332/0864 →
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL/FRAME (053574/0221) Recorded Jun 10, 2022
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
To: DELL PRODUCTS L.P.; EMC IP HOLDING COMPANY LLC
Reel/Frame 060333/0001 →
RELEASE OF SECURITY INTEREST IN PATENTS PREVIOUSLY RECORDED AT REEL/FRAME (053573/0535) Recorded Jun 10, 2022
From: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
To: DELL PRODUCTS L.P.; EMC IP HOLDING COMPANY LLC
Reel/Frame 060333/0106 →
RELEASE OF SECURITY INTEREST AT REEL 053531 FRAME 0108 Recorded Nov 2, 2021
From: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH
To: DELL PRODUCTS L.P.; EMC IP HOLDING COMPANY LLC
Reel/Frame 058001/0371 →
SECURITY INTEREST Recorded Aug 21, 2020
From: DELL PRODUCTS L.P.; EMC IP HOLDING COMPANY LLC
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 053578/0183 →
SECURITY INTEREST Recorded Aug 21, 2020
From: DELL PRODUCTS L.P.; EMC IP HOLDING COMPANY LLC
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 053573/0535 →
SECURITY INTEREST Recorded Aug 21, 2020
From: DELL PRODUCTS L.P.; EMC IP HOLDING COMPANY LLC
To: THE BANK OF NEW YORK MELLON TRUST COMPANY, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 053574/0221 →
SECURITY AGREEMENT Recorded Aug 18, 2020
From: DELL PRODUCTS L.P.; EMC IP HOLDING COMPANY LLC
To: CREDIT SUISSE AG, CAYMAN ISLANDS BRANCH
Reel/Frame 053531/0108 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 10, 2020
From: ALSHAWABKEH, MALAK; AWWAD, MOTASEM; BADRAN, SAMER; CHAUDHARI, SWAPNIL
To: EMC IP HOLDING COMPANY LLC
Reel/Frame 052892/0488 →