Systems and methods for machine control
A region of space may be monitored for the presence or absence of one or more control objects, and object attributes and changes thereto may be interpreted as control information provided as input to a machine or application. In some embodiments, the region is monitored using a combination of scanning and image-based sensing.
1. A computer-implemented method for conducting machine control, the method comprising:
directing an emission cycle to a region of interest in accordance with a scan pattern;
detecting a time-variable reflection signal indicative of a reflection of the emission cycle by an object in the region of interest;
acquiring images of the region of interest;
coordinating operation of the directing of the emission cycle, the detecting of the time-variable reflection signal and the acquiring of the images by varying the scan pattern according to a detected attribute of the object, wherein the varied scan pattern varies intensities of the emission cycle according to the detected attribute of the object; and
processing the time-variable reflection signal and the images to (i) determine therefrom a presence of the object and object attributes associated therewith and (ii) infer machine-control information from the object attributes.
2. The computer-implemented method of claim 1 , wherein the acquiring of the images implements one or more cameras to acquire the images of the region of interest.
3. The computer-implemented method of claim 1 , wherein the detecting of the time-variable reflection signal indicative of the reflection implements a photosensitive element to detect the reflection.
4. The computer-implemented method of claim 1 , wherein the detecting of the time-variable reflection signal indicative of the reflection extracts the time-variable reflection signal based at least in part upon the reflection.
5. The computer-implemented method of claim 1 , wherein the detected attribute of the object is at least one of a color of the object, a translucence of the object, an opacity of the object, a reflectivity of the object and an absorptivity of the object.
6. The computer-implemented method of claim 5 , wherein the detected attribute of the object dictates whether a finer or coarser scan pattern is required.
7. The computer-implemented method of claim 1 , further comprising:
detecting that the object is of a certain minimum size; and
responsive to the detection that the object is of the certain minimum size, varying the scan pattern to cover only a fraction of the region of interest.
8. A non-transitory computer-readable recording medium having a program recorded thereon, the program, when executed by a computer, causes the computer to perform a method comprising:
directing an emission cycle to a region of interest in accordance with a scan pattern;
detecting a time-variable reflection signal indicative of a reflection of the emission cycle by an object in the region of interest;
acquiring images of the region of interest;
coordinating operation of the directing of the emission cycle, the detecting of the time-variable reflection signal and the acquiring of the images by varying the scan pattern according to a detected attribute of the object, wherein the varied scan pattern varies intensities of the emission cycle according to the detected attribute of the object; and
processing the time-variable reflection signal and the images to (i) determine therefrom a presence of the object and object attributes associated therewith and (ii) infer machine-control information from the object attributes.
9. The non-transitory computer-readable recording medium of claim 8 , wherein the acquiring of the images implements one or more cameras to acquire the images of the region of interest.
10. The non-transitory computer-readable recording medium of claim 8 , wherein the detecting of the time-variable reflection signal indicative of the reflection implements a photosensitive element to detect the reflection.
11. The non-transitory computer-readable recording medium of claim 8 , wherein the detecting of the time-variable reflection signal indicative of the reflection extracts the time-variable reflection signal based at least in part upon the reflection.
12. A system for conducting machine control, the system comprising:
an emission module including a processor configured to direct an emission cycle to a region of interest in accordance with a scan pattern;
a detection module including a processor configured to (i) detect a time-variable reflection signal indicative of a reflection of the emission cycle by an object in the region of interest, and (ii) acquire images of the region of interest;
a controller including a processor configured to coordinate operation of the emission and detection modules by varying the scan pattern according to a detected attribute of the object, wherein the varied scan pattern varies intensities of the emission cycle according to the detected attribute of the object; and
a computational facility including a processor configured to (i) process the time-variable reflection signal and the images to determine a presence of the object and object attributes associated therewith and (ii) infer machine-control information from the object attributes.
13. The system according to claim 12 , wherein the detection module comprises one or more cameras configured to acquire the images of the region of interest.
14. The system according to claim 12 , wherein the detection module comprises a photosensitive element configured to detect the reflection.
15. The system according to claim 12 , wherein the detection module further comprises circuitry configured to extract the time-variable reflection signal based at least in part upon the reflection.