Systems and methods for management of organic light-emitting diode display degradation
An information handling system may include a display comprising an organic light-emitting diode (OLED) panel and an OLED degradation management subsystem configured to, responsive to a condition for initiating a calibration of the OLED panel, logically divide the OLED panel into a plurality of non-overlapping test windows of a defined size, measure a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows to determine a deviation of the at least one test window from a linear degradation profile, and correct for non-linear degradation occurring in the at least one test window based on the deviation.
1. An information handling system comprising:
a display comprising an organic light-emitting diode (OLED) panel; and
an OLED degradation management subsystem configured to, responsive to a condition for initiating a calibration of the OLED panel:
logically divide the OLED panel into a plurality of non-overlapping test windows of a defined size wherein the defined size decreases over a lifecycle of the OLED panel;
obtain a measured value of a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows;
determine a deviation of the at least one test window based on a difference between the measured value and a profile value associated with a linear degradation profile of the physical quantity, wherein the linear degradation profile indicates projected values of the physical property as a function of time; and
correct for non-linear degradation occurring in the at least one test window based on the deviation.
2. The information handling system of claim 1 , wherein a condition for initiating the correcting includes one or more of a group of conditions, wherein the group of conditions include:
whether a workload of a processor of the information handling system is below a threshold workload; and
an identity of one or more applications executing on the processor.
3. The information handling system of claim 1 , wherein the physical quantity is a luminosity.
4. The information handling system of claim 1 , wherein the OLED degradation management subsystem measures the physical quantity for each of the plurality of non-overlapping test windows.
5. The information handling system of claim 1 , wherein the OLED degradation management subsystem measures the physical quantity for each of a subset of the plurality of non-overlapping test windows, wherein the subset is selected based on a determination of which of the plurality of non-overlapping test windows are at a greater risk of degradation.
6. The information handling system of claim 5 , wherein the determination of which of the plurality of non-overlapping test windows are at the greater risk of degradation is based on at least one of proximity of the test windows to sources of heat and test windows with pixels having a frequency of use exceeding a threshold frequency.
7. A method comprising:
logically dividing an organic light-emitting diode (OLED) panel into a plurality of non-overlapping test windows of a defined size wherein the defined size decreases over a lifecycle of the OLED panel;
obtaining a measured value of a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows;
determining a deviation of the at least one test window based on a difference between the measured value and a profile value associated with a linear degradation profile of the physical Quantity, wherein the linear degradation profile indicates projected values of the physical property as a function of time; and
correcting for non-linear degradation occurring in the at least one test window based on the deviation.
8. The method of claim 7 , wherein a condition for initiating the correcting includes one or more of a group of conditions, wherein the group of conditions include:
whether a workload of a processor of the information handling system is below a threshold workload; and
an identity of one or more applications executing on the processor.
9. The method of claim 7 , wherein the physical quantity is a luminosity.
10. The method of claim 7 , further comprising measuring the physical quantity for each of the plurality of non-overlapping test windows.
11. The method of claim 7 , further comprising measuring the physical quantity for each of a subset the plurality of non-overlapping test windows, wherein the subset is selected based on a determination of which of the plurality of non-overlapping test windows are at a greater risk of degradation.
12. The method of claim 11 , wherein the determination of which of the plurality of non-overlapping test windows are at the greater risk of degradation is based on at least one of proximity of the test windows to sources of heat and test windows with pixels having a frequency of use exceeding a threshold frequency.
13. An article of manufacture comprising:
a non-transitory computer-readable medium; and
computer-executable instructions carried on the computer-readable medium, the instructions readable by a processor, the instructions, when read and executed, for causing the processor to:
logically divide an organic light-emitting diode (OLED) panel into a plurality of non-overlapping test windows of a defined size wherein the defined size decreases over a lifecycle of the OLED panel;
obtain a measured value of a physical quantity for a pixel of at least one of the plurality of non-overlapping test windows;
determine a deviation of the at least one test window based on a difference between the measured value and a profile value associated with a linear degradation profile of the physical quantity, wherein the linear degradation profile indicates values of the physical property as a function of time; and
correct for non-linear degradation occurring in the at least one test window based on the deviation.
14. The article of claim 13 , wherein a condition for initiating the correcting includes one or more of a group of conditions, wherein the group of conditions include:
whether a workload of a processor of the information handling system is below a threshold workload; and
an identity of one or more applications executing on the processor.
15. The article of claim 13 , wherein the physical quantity is a luminosity.
16. The article of claim 13 , the instructions for further causing the processor to measure the physical quantity for each of the plurality of non-overlapping test windows.
17. The article of claim 13 , the instructions for further causing the processor to measure the physical quantity for each of a subset the plurality of non-overlapping test windows, wherein the subset is selected based on a determination of which of the plurality of non-overlapping test windows are at a greater risk of degradation.
18. The article of claim 17 , wherein the determination of which of the plurality of non-overlapping test windows are at the greater risk of degradation is based on at least one of proximity of the test windows to sources of heat and test windows with pixels having a frequency of use exceeding a threshold frequency.