Multi-view imaging system
The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.
1. An X-ray inspection system for scanning an object, the inspection system comprising:
at least two X-ray sources configured to simultaneously emit X-ray beams, each of said X-ray beams defining an emission path through the inspection system;
a first scatter detector array, wherein the first scatter detector array is placed on a same side of the inspection system as a first of the at least two X-ray sources;
a second scatter detector array, wherein the second scatter detector array is placed on a same side of the inspection system as a second of the at least two X-ray sources; and
at least one controller for controlling each of the X-ray sources to scan the object in a coordinated manner, such that the X-ray beams of the at least two X-ray sources do not cross emission paths.
2. The X-ray inspection system of claim 1 , wherein each of the emitted X-ray beams is a pencil beam and wherein each of the at least two X-ray sources rotates over a predetermined angle of rotation.
3. The X-ray inspection system of claim 1 , wherein at least one of the first scatter detector array or the second scatter detector array is a non-pixellated detector.
4. The X-ray inspection system of claim 1 , wherein the at least two X-ray sources comprise a first X-ray source, a second X-ray source and a third X-ray source and wherein the first X-ray source, the second X-ray source and the third X-ray source are each configured to simultaneously emit rotating X-ray beams such that wherein the first X-ray source is caused to scan the object by starting at a substantially vertical position and moving in a clockwise manner, the second X-ray source is caused to scan the object by starting at a substantially downward vertical position and moving in a clockwise manner, and the third X-ray source is caused to scan the object by starting at a substantially horizontal position and moving in a clockwise manner.
5. The X-ray inspection system of claim 1 , wherein the controller is configured to cause each of the at least two X-ray sources to begin scanning the object in a direction that does not overlap with an initial scanning direction of any of the remaining at least two X-ray sources, thereby eliminating cross talk among each of the at least two X-ray sources.
6. The X-ray inspection system of claim 1 wherein a plurality of scanned views of the object are collected simultaneously.
7. The X-ray inspection system of claim 1 wherein a volume of the first scatter detector array and the second scatter detector array is independent of a number of scanned views of the object obtained.
8. The X-ray inspection system of claim 1 wherein the X-ray inspection system is further configured to generate an image having an intrinsic spatial resolution and wherein said intrinsic spatial resolution is determined by a degree of collimation of each of the X-ray beams.
9. The X-ray inspection system of claim 1 wherein at least one of the first scatter detector array or the second scatter detector array comprise gas ionization detectors having a Xenon or any other pressurized gas.
10. The X-ray inspection system of claim 1 wherein at least one of the first scatter detector array or the second scatter detector array comprise at least one of CdZnTe, CdTe, HgI, Si or Ge.
11. The X-ray inspection system of claim 1 wherein the X-ray inspection system is configured to detect gamma rays by turning off each of the at least two X-ray sources and switching at least one of the first scatter detector array or the second scatter detector array from a current integrating mode to a pulse counting mode.
12. An X-ray inspection system for scanning an object, the inspection system comprising:
at least two X-ray sources configured to simultaneously emit X-ray beams for irradiating the object, wherein each of said X-ray beams defines an emission path;
a detector array comprising at least two backscatter detectors, wherein each of said backscatter detectors detects backscattered X-rays emitted by a first of the at least two X-ray sources placed on a first side of the object; and
at least one controller for controlling each of the at least two X-ray sources to concurrently scan the object in a coordinated, non-overlapping, manner such that the emission paths of each of said X-ray beams does not cross.
13. The X-ray inspection system as claimed in claim 12 wherein the detector array comprises at least two rectangular profile backscatter detectors and further comprises a square profile transmission detector positioned between said at least two rectangular profile backscatter detectors.
14. The X-ray inspection system as claimed in claim 12 wherein the detector array comprises a transmission detector positioned between each of the at least two backscatter detectors and wherein the transmission detector and backscatter detectors are placed within a single plane facing the object being scanned and the transmission detector has a smaller exposed surface area than each of the at least two backscatter detectors.
15. The X-ray inspection system as claimed in claim 14 further comprising a pair of fixed collimators positioned between the transmission detector and one of said at least two backscatter detectors.
16. The X-ray inspection system as claimed in claim 12 wherein each of the at least two X-ray sources comprises an extended anode X-ray tube, a rotating collimator assembly, a bearing, a drive motor, and a rotary encoder.
17. The X-ray inspection system as claimed in claim 12 wherein each of the at least two X-ray sources comprises:
an extended anode X-ray tube coupled with a cooling circuit, the anode being at ground potential;
a rotating collimator assembly comprising at least one collimating ring with slots cut at predefined angles around a circumference of the collimator, a length of each slot being greater than a width and an axis of rotation of the slot, and the width of the slots defining an intrinsic spatial resolution of the X-ray inspection system in a direction of the scanning;
a bearing for supporting a weight of the collimator assembly and transferring a drive shaft from the collimator assembly to a drive motor;
a rotary encoder for determining an absolute angle of rotation of the X-ray beams; and
a secondary collimator set for improving spatial resolution in a perpendicular scanning direction.
18. The X-ray inspection system as claimed in claim 12 wherein the controller is configured to receive data comprising a speed of the object and, based upon said data, is further configured to adjust at least one of a movement speed of an X-ray source, a data acquisition rate, or an X-ray tube current based upon said data.