Read retry scratch space

1. A memory device comprising:

a memory array having multiple blocks of memory cells; and

a memory controller operably coupled to the memory array, the memory controller configured to perform operations comprising:

receive a first read request;

read data from the memory array corresponding to the first read request;

determine if the read data corresponding to the first read request includes a detectable error;

in response to a detected error in the read data corresponding to the first read request, recover data corresponding to the first read request using one of a set of read retry features; and

load the one of the set of read retry features used to recover data corresponding to the first read request in a scratch space of the memory array as a custom read retry feature in the memory device for a second read request subsequent to the first read request.

2. The memory device of claim 1 , wherein the memory controller is configured to perform operations comprising:

default to the custom read retry feature, if loaded, to recover data.

3. The memory device of claim 1 , wherein the set of read retry features includes a set of read retry offset settings,

wherein, to recover data corresponding to the first read request, the memory controller performs operations comprising:

determine an optimal read retry offset setting from the set of read retry offset settings to recover data in the read data corresponding to the first read request, and

wherein, to load the one of the set of read retry features, the memory controller performs operations comprising:

load the determined optimal read retry offset setting to recover data in the read data corresponding to the first read request as the custom read retry feature.

4. The memory device of claim 1 , wherein the set of read retry features includes first and second read retry offset settings,

wherein, to recover data corresponding to the first read request, the memory controller performs operations comprising:

determine if one of the first and second read retry offset settings recovers the detected error, and

wherein, to load the one of the set of read retry features, the memory controller performs operations comprising:

load the determined one of the first and second read retry offset settings as a custom read retry feature.

5. The memory device of claim 1 , wherein the memory controller is configured to perform operations comprising:

receive the second read request;

read second data from the memory array corresponding to the second read request;

determine if the read second data corresponding to the second read request includes a detectable error; and

in response to a detected error in the read second data corresponding to the second read request, attempt to recover data corresponding to the second read request using the custom read retry feature before attempting to recover data using the set of read retry features.

6. A memory device comprising:

a memory array having multiple blocks of memory cells; and

a memory controller operably coupled to the memory array, the memory controller configured to perform operations comprising:

store a custom read retry feature in a scratch space of the memory array;

determine if read data corresponding to a read request includes a detectable error; and

recover data from a detected error in the read data corresponding to the read request using the custom read retry feature stored in the scratch space of the memory array, the scratch space separate from read retry offset registers of the memory device configured to store a set of read retry offsets for error correction.

7. The memory device of claim 6 , wherein the memory controller is configured to perform operations comprising:

receiving the custom read retry feature prior to storing the custom read retry feature in the scratch space of the memory array.

8. The memory device of claim 6 , wherein the memory controller is configured to perform operations comprising:

determine an optimal read retry feature for read data associated with a first read command,

wherein, to store the custom read retry feature, the memory controller is configured to perform operations comprising:

store the determined optimal read retry feature for read data associated with the first read command as the custom read retry feature in the scratch space of the memory array, and

wherein, to recover data from the detected error, the memory controller is configured to perform operations comprising:

recover data from a detected error in read data associated with a second read command, subsequent to the first read command, using the custom read retry feature stored in the scratch space of the memory array.

9. The memory device of claim 6 , wherein, to recover data from the detected error, the memory controller performs operations comprising:

attempt to recover data from the detected error using the custom read retry feature before attempting to recover data from the detected error using one of the set of read retry features stored in the read retry offset registers separate from the scratch space of the memory array.

10. A method to recover data from a memory array, the method comprising:

receiving a first read request at a memory controller;

reading data from the memory array corresponding to the first read request;

determining if the read data corresponding to the first read request includes a detectable error;

recovering data, in response to a detected error in the read data corresponding to the first read request, using one of a set of read retry features; and

loading, using the memory controller, the one of the set of read retry features used to recover data corresponding to the first read request in a scratch space of the memory array as a custom read retry feature in a memory device for a second read request subsequent to the first read request.

11. The method of claim 10 , comprising:

defaulting to the custom read retry feature, if loaded, to recover data.

12. The method of claim 10 , wherein the set of read retry features includes a set of read retry offset settings,

wherein recovering data corresponding to the first read request comprises determining an optimal read retry offset setting from the set of read retry offset settings to recover data in the read data corresponding to the first read request, and

wherein loading the one of the set of read retry features as the custom read retry feature comprises loading the determined optimal read retry offset setting to recover data in the read data corresponding to the first read request as the custom read retry feature.

13. The method of claim 10 , wherein the set of read retry features includes first and second read retry offset settings,

wherein recovering data corresponding to the first read request comprises:

determining if one of the first and second read retry offset settings recovers the detected error, and

wherein loading the one of the set of read retry features comprises:

loading the determined one of the first and second read retry offset settings as a custom read retry feature.

14. The method of claim 10 , comprising:

receiving the second read request;

reading second data from the memory array corresponding to the second read request;

determining if the read second data corresponding to the second read request includes a detectable error; and

in response to a detected error in the read second data corresponding to the second read request, attempting to recover data corresponding to the second read request using the custom read retry feature before attempting to recover data using the set of read retry features.

15. A method to recover data from a memory array, the method comprising:

storing a custom read retry feature in a scratch space of the memory array;

determining if read data corresponding to a read request includes a detectable error; and

recovering data from a detected error in the read data corresponding to the read request using the custom read retry feature stored in the scratch space of the memory array, the scratch space separate from read retry offset registers of the memory device configured to store a set of read retry offsets for error correction.

16. The method of claim 15 , comprising:

receiving the custom read retry feature prior to storing the custom read retry feature in the scratch space of the memory array.

17. The method of claim 15 , comprising:

determining an optimal read retry feature for read data associated with a first read command,

wherein storing the custom read retry feature comprises:

storing the determined optimal read retry feature for read data associated with the first read command as the custom read retry feature in the scratch space of the memory array, and

wherein recovering data from the detected error comprises:

recovering data from a detected error in read data associated with a second read command, subsequent to the first read command, using the custom read retry feature stored in the scratch space of the memory array.

18. The method of claim 15 , wherein recovering data from the detected error comprises:

attempting to recover data from the detected error using the custom read retry feature before attempting to recover data from the detected error using one of the set of read retry features stored in the read retry offset registers separate from the scratch space of the memory array.

19. A memory device comprising:

a memory array having multiple blocks of memory cells; and

a memory controller operably coupled to the memory array, the memory controller configured to perform operations comprising:

receive a first read request;

read data from the memory array corresponding to the first read request;

determine if the read data corresponding to the first read request includes a detectable error;

in response to a detected error in the read data corresponding to the first read request, recover data corresponding to the first read request using one of a set of read retry features;

load the one of the set of read retry features used to recover data corresponding to the first read request as a custom read retry feature in the memory device for a second read request subsequent to the first read request; and

default to the custom read retry feature, if loaded, to recover data.

20. The memory device of claim 19 , wherein to load the one of the set of read retry features comprises to load the one of the set of read retry features in a scratch space of the memory array.

21. The memory device of claim 19 , wherein the set of read retry features includes first and second read retry offset settings,

wherein, to recover data corresponding to the first read request, the memory controller performs operations comprising:

determine if one of the first and second read retry offset settings recovers the detected error, and

wherein, to load the one of the set of read retry features, the memory controller performs operations comprising:

load the determined one of the first and second read retry offset settings as a custom read retry feature.

22. The memory device of claim 19 , wherein the memory controller is configured to perform operations comprising:

receive the second read request;

read second data from the memory array corresponding to the second read request;

determine if the read second data corresponding to the second read request includes a detectable error; and

in response to a detected error in the read second data corresponding to the second read request, attempt to recover data corresponding to the second read request using the custom read retry feature before attempting to recover data using the set of read retry features.