IP Library Granted Patent US 12,162,090
Granted Patent B2
US 12,162,090 · App. 16/961,733 · Granted Dec 10, 2024

Method for selectively irradiating a material layer, method for providing a data set, device and computer program product

Inventor: Ole Geisen (Berlin, DE)
Assignee: Siemens Energy Global GmbH & Co. KG
B23K26/0622B22F10/00B22F10/36B22F10/366B23K26/0608B23K26/342B33Y10/00B33Y30/00B33Y50/00B22F10/25B22F10/28B22F10/385B22F12/43B23K26/082B23K2101/001B23K2103/08
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Quick Facts
Patent No.
US 12,162,090
App. No.
16/961,733
Granted
Dec 10, 2024
Kind
B2
Abstract

A method for selectively irradiating a material layer in additive production. The method includes: providing geometry data having geometry information of individual layers of a component that is to be produced by additive means, and defining an irradiation pattern for the layers by a computer-supported production method, wherein the irradiation pattern has a contour and a surface region in layers, wherein first contour vectors of the contour are specified for continuous irradiation operation and second contour vectors of the contour are specified for pulsed irradiation operation. A method for providing a data set, an additive production method, a corresponding device and a corresponding computer program product selectively irradiate a material layer in additive production.

Claims (37)

1. A method for selectively irradiating at least one material layer in additive production, the method comprising:

providing geometrical data comprising geometrical information of any one of the of the material layers of a component to be additively produced,

defining an irradiation pattern for any one of the material layers by means of a computer-aided manufacturing method, the irradiation pattern layerwise comprising a contour and a surface region of the component,

wherein first contour vectors of the contour for continuous irradiation operation and second contour vectors of the contour for pulsed irradiation operation are established, and

wherein the first contour vectors continuously irradiate a first portion of the surface region of the component, and independently the second contour vectors pulse irradiate a second portion of the surface region of the component,

wherein further irradiation parameters for the irradiation pattern comprising vector length, pulse length, scan or irradiation speed, laser power, track or strip distance and/or strip width are established,

wherein anyone of the material layers of the component is manufactured using the irradiation pattern,

wherein the first contour vectors of contour are irradiated before the second contour vectors of contour.

2. The method as claimed in claim 1 ,

wherein the contour comprises regions of the component having a defined surface quality or structural quality and/or a defined dimensional accuracy.

3. The method as claimed in claim 1 ,

wherein the irradiation pattern is defined as a function of an overhang angle of individual cross-sectional regions of the component.

4. The method as claimed in claim 1 ,

wherein a vector length of the first and/or second contour vectors of the contour has a length of between 50 and 200 pm, and wherein the irradiation parameters comprise a scan speed of less than 200 mm/s.

5. A method for providing a data set for the selective irradiation of a material layer claimed in claim 1 , further comprising:

linking irradiation parameters at least of the second contour vectors with the geometrical data in a common data set.

6. The method as claimed in claim 5 ,

wherein the data set additionally contains material information of the component and/or of a starting material therefor, and wherein this is likewise linked in the data set.

7. A device for selectively irradiating a material layer in additive production, adapted for carrying out a method as claimed in claim 1 , comprising:

an energy beam source for selectively irradiating a material layer,

wherein the device is configured to allow continuous as well as pulsed irradiation operation.

8. The device as claimed in claim 7 , further comprising: a pulse generator.

9. The device as claimed in claim 7 ,

wherein the energy beam source is a first energy beam source for continuous irradiation operation, and

wherein the device comprises at least one second energy beam source for pulsed irradiation operation of the contour.

10. An additive production method comprising:

the method selectively irradiating a material layer as claimed in claim 1 ,

wherein the selective irradiation is carried out by means of a laser or an electron beam, and the material layer is a powder layer.

11. The additive production method as claimed in claim 10 ,

wherein the powder layer is a hardened nickel-based or cobalt-based superalloy, and

wherein the component is a component part which is to be used in the hot-gas path of a turbomachine.

12. The component which is produced or producible as claimed in claim 10 , furthermore comprising:

in comparison with a prior art component produced according to the prior art, a surface quality or structural quality and/or dimensional accuracy improved by 50 to 100%.

13. A computer program product stored on a non-transitory computer readable media comprising:

instructions which, when the program is executed by a computer, cause the computer to carry out the layerwise establishment of the irradiation pattern as claimed in claim 1 .

14. The computer program product of claim 13 , further comprising:

instructions which, when the program is executed by a computer, cause the computer to carry out linking of irradiation parameters at least of the second contour vectors with the geometrical data in a common data set.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 28, 2021
From: SIEMENS AKTIENGESELLSCHAFT
To: SIEMENS ENERGY GLOBAL GMBH & CO. KG
Reel/Frame 058597/0317 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 21, 2020
From: GEISEN, OLE
To: SIEMENS AKTIENGESELLSCHAFT
Reel/Frame 053557/0869 →