Methods and systems for fast field zeroing for magnetoencephalography (MEG)
A method of operating an optically pumped magnetometer (OPM) includes directing a light beam through a vapor cell of the OPM including a vapor of atoms; applying RF excitation to cause spins of the atoms to precess; measuring a frequency of the precession; for each of a plurality of different axes relative to the vapor cell, directing a light beam through the vapor cell, applying a magnetic field through the vapor cell along the axis, applying RF excitation to cause spins of the atoms to precess, and measuring a frequency of the precession in the applied magnetic field; determining magnitude and components of an ambient background magnetic field along the axes using the measured frequencies; and applying a magnetic field based on the components around the vapor cell to counteract the ambient background magnetic field to facilitate operation of the OPM in a spin exchange relaxation free (SERF) mode.
1. A method of operating an optically pumped magnetometer (OPM), the method comprising:
directing a first light beam through a vapor cell of the OPM comprising a vapor of atoms;
while directing the first light beam through the vapor cell, applying radiofrequency (RF) excitation to the atoms to cause spins of the atoms of the vapor to precess;
measuring a first frequency of the precession by observing the first light beam after passing through the vapor cell;
determining a magnitude of an ambient background magnetic field from the first frequency;
for each axis of a plurality of different axes relative to the vapor cell,
directing another light beam through the vapor cell,
applying a magnetic field through the vapor cell along the axis,
while directing the other light beam through the vapor cell, applying RF excitation to the atoms to cause spins of the atoms of the vapor to precess,
measuring another frequency of the precession in the applied magnetic field by observing the other light beam after passing through the vapor cell, and
determining a vector field component of the ambient background magnetic field along the axis using the measured other frequency, the determined magnitude of the ambient background magnetic field, and a magnitude of the magnetic field applied along the axis; and
applying a counteracting magnetic field, based on the determined vector field components of the ambient background magnetic field, around the vapor cell to counteract the ambient background magnetic field to facilitate operation of the OPM in a spin exchange relaxation free (SERF) mode.
2. The method of claim 1 , wherein the plurality of different axes is three axes.
3. The method of claim 2 , wherein the three axes are three orthogonal axes.
4. The method of claim 1 , wherein each instance of applying RF excitation comprises applying RF excitation through an auxiliary coil of the OPM.
5. The method of claim 1 , wherein each instance of applying a magnetic field comprises applying a magnetic field using a magnetic field generator of the OPM.
6. The method of claim 5 , wherein each instance of applying RF excitation comprises applying RF excitation through the magnetic field generator of the OPM.
7. The method of claim 1 , wherein each instance of directing a first light beam or directing another light beam comprises generating the first light beam or the other light beam, respectively, using a laser of the OPM.
8. The method of claim 1 , wherein each instance of applying RF excitation comprises applying RF excitation through one or more RF pulses.
9. The method of claim 1 , wherein each instance of applying RF excitation comprises applying RF excitation by sweeping through a frequency range.
10. The method of claim 1 , wherein the atoms are alkali metal atoms.
11. A magnetic field measurement system, comprising:
an optically pumped magnetometer (OPM) comprising
a vapor cell comprising a housing and a vapor of atoms disposed in the housing,
a light source,
a detector, and
a magnetic field generator;
a memory having instructions stored thereon; and
a processor coupled to the OPM and the memory and configured execute the instructions to perform actions, the actions comprising
directing a first light beam through the vapor cell of the OPM;
while directing the first light beam through the vapor cell, applying radiofrequency (RF) excitation to the atoms to cause spins of the atoms of the vapor to precess;
measuring a first frequency of the precession by observing the first light beam after passing through the vapor cell;
determining a magnitude of an ambient background magnetic field from the first frequency;
for each axis of a plurality of different axes relative to the vapor cell,
directing another light beam through the vapor cell,
applying a magnetic field through the vapor cell along the axis,
while directing the other light beam through the vapor cell, applying RF excitation to the atoms to cause spins of the atoms of the vapor to precess,
measuring another frequency of the precession in the applied magnetic field by observing the other light beam after passing through the vapor cell, and
determining a vector field component of the ambient background magnetic field along the axis using the measured other frequency, the determined magnitude of the ambient background magnetic field, and a magnitude of the magnetic field applied along the axis; and
applying a counteracting magnetic field, based on the determined vector field components of the ambient background magnetic field, around the vapor cell to counteract the ambient background magnetic field to facilitate operation of the OPM in a spin exchange relaxation free (SERF) mode.
12. The magnetic field measurement system of claim 11 , wherein the processor is configured so that the plurality of different axes is three axes.
13. The magnetic field measurement system of claim 11 , wherein the processor is configured so that the three axes are three orthogonal axes.
14. The magnetic field measurement system of claim 11 , wherein the processor is configured so that each instance of applying RF excitation comprises applying RF excitation through an auxiliary coil of the OPM.
15. The magnetic field measurement system of claim 11 , wherein the processor is configured so that each instance of applying a magnetic field comprises applying a magnetic field using the magnetic field generator of the OPM.
16. The magnetic field measurement system of claim 15 , wherein the processor is configured so that each instance of applying RF excitation comprises applying RF excitation through the magnetic field generator of the OPM.
17. The magnetic field measurement system of claim 11 , wherein the processor is configured so that each instance of directing a first light beam or directing another light beam comprises generating the first light beam or the other light beam, respectively, using a laser of the OPM.
18. The magnetic field measurement system of claim 11 , wherein the processor is configured so that each instance of applying RF excitation comprises applying RF excitation through one or more RF pulses.
19. The magnetic field measurement system of claim 11 , wherein the processor is configured so that each instance of applying RF excitation comprises applying RF excitation by sweeping through an RF frequency range.
20. The magnetic field measurement system of claim 11 , wherein the atoms are alkali metal atoms.