System for monitoring a switchgear

1. A method for monitoring a switchgear, the method comprising:

acquiring at least one infrared image of the switchgear, wherein the at least one image comprises a first infrared image and a second infrared image acquired after the first infrared image;

determining a pixel in the at least one infrared image associated with a hottest temperature, wherein determining the pixel further comprises determining a pixel in the first infrared image associated with a hottest temperature of the first infrared image and determining a pixel in the second infrared image associated with a hottest temperature of the second infrared image;

determining pixels in the at least one infrared image associated with a temperature that is within a threshold temperature of the hottest temperature, wherein determining pixels further comprises determining pixels in the first infrared image associated with a temperature that is within the threshold temperature of the hottest temperature in the first infrared image and determining pixels in the second infrared image associated with a temperature that is within the threshold temperature of the hottest temperature in the second infrared image;

determining that a hot spot exists in the switchgear as a determination, the determination comprising a utilization of the determined pixels in the at least one infrared image, wherein the determining that the hotspot exists further comprises determining that the hot spot exists in the switchgear based on a comparison of the determined pixels in the first infrared image with the determined pixels in the second infrared image; and

outputting an indication of a fault in the switchgear based on the determined hot spot.

2. The method according to claim 1 , wherein the threshold temperature comprises a fixed temperature range.

3. The method according to claim 1 , wherein determining that the hot spot exists comprises an analysis of one or more of:

a shape of at least one region within the determined pixels in the at least one infrared image,

a size of the at least one region within the determined pixels in the at least one infrared image,

a position of the at least one region within the determined pixels in the at least one infrared image,

a number of the at least one region within the determined pixels in the at least one infrared image,

a number of pixels within the determined pixels in the at least one infrared image.

4. The method according to claim 3 , wherein determining that the hot spot exists comprises determining that a region in the second infrared image is smaller than a corresponding region in the first infrared image.

5. The method according to claim 3 , wherein determining that the hot spot exists comprises determining that a number of regions in the second infrared image is smaller than a number of regions in the first infrared image.

6. The method according to claim 5 , wherein determining that the hot spot exists comprises determining that the number of regions in the second image is one.

7. The method according to claim 3 , wherein the switchgear comprises two or more components of a same type that are loaded with substantially a same current,

wherein determining that the hot spot exists comprises determining of one or more of:

a shape of a first region within the determined pixels in the at least one infrared image is different than a shape of a second region within the determined pixels in the at least one infrared image,

a size of a first region within the determined pixels in the at least one infrared image is different than a size of a second region within the determined pixels in the at least one infrared image,

a position within the determined pixels in the at least one infrared image is not associated with a position of the two or more components,

a number of the at least one region within the determined pixels in the at least one infrared image is less than a number of the two or more components.

8. The method according to claim 7 , wherein determining that the hot spot exists comprises determining that there is only one region within the determined pixels in the at least one infrared image.

9. The method according to claim 1 , wherein determining that the hot spot exists comprises generating of at least one binary image, and

wherein the determined pixels in the at least one infrared image are given a different binary value than remaining pixels in the at least one infrared image.

10. The method according to claim 1 , wherein determining that the hot spot exists comprises a utilization of a machine learning algorithm.

11. The method according to claim 10 , wherein the machine learning algorithm comprises a trained neural network.

12. The method according to claim 1 , wherein the method further comprises:

acquiring a visible image of the switchgear, and

overlaying the determined pixels in the at least one infrared image onto a corresponding at least one location in the visible image.

13. The method according to claim 1 , wherein the at least one image comprises a plurality of images acquired at different times,

determining a pixel in each of the plurality of infrared images associated with a hottest temperature in each of the plurality of infrared images,

determining pixels in each of the plurality of infrared images associated with a temperature that is within the threshold temperature of the hottest temperature in each of the plurality of infrared images and calculate a number of determined pixels in each of the plurality of infrared images, and wherein the determination that the hot spot exists comprises a determination of a rate of change of the number of determined pixels with time.

14. The system according to claim 13 , wherein the determination that the hot spot exists comprises a comparison of the rate of change of the number of determined pixels with time against a baseline rate of change of the number of determined pixels with time.

15. A method for monitoring a switchgear, the method further comprising:

acquiring at least one infrared image of the switchgear, wherein the at least one image comprises a first infrared image and a second infrared image acquired after the first infrared image;

determining a pixel in the at least one infrared image associated with a hottest temperature, wherein the determining the pixel further comprises determining a pixel in the first infrared image associated with a hottest temperature of the first infrared image and determining a pixel in the second infrared image associated with a hottest temperature of the second infrared image;

determining pixels in the at least one infrared image associated with a temperature that is within a threshold temperature of the hottest temperature, wherein determining the pixels further comprises determining pixels in the first infrared image associated with a temperature that is within the threshold temperature of the hottest temperature in the first infrared image and determining pixels in the second infrared image associated with a temperature that is within the threshold temperature of the hottest temperature in the second infrared image;

determining that a hot spot exists in the switchgear as a determination, the determination comprising a utilization of the determined pixels in the at least one infrared image, wherein determining that the hotspot exists further comprises determining that the hot spot exists in the switchgear based on a comparison of the determined pixels in the first infrared image with the determined pixels in the second infrared image, and wherein determining that the hot spot exists comprises an analysis of one or more of:

a shape of at least one region within the determined pixels in the at least one infrared image;

a size of the at least one region within the determined pixels in the at least one infrared image;

a position of the at least one region within the determined pixels in the at least one infrared image;

a number of the at least one region within the determined pixels in the at least one infrared image;

a number of pixels within the determined pixels in the at least one infrared image;

wherein determining that the hot spot exists comprises determining that a region in the second infrared image is smaller than a corresponding region in the first infrared image; and

outputting an indication of a fault in the switchgear based on the determined hot spot.