Liquid crystal cell assembly
Method of forming and patterning in situ on a film component of a layer of spacer structure material to define spacer structures in at least active areas of a liquid crystal (LC) cell array. Applying counter component to the film component after dispensing sealant material onto one or more of the components in areas around each active area of the array, and after dispensing one or more drops of LC material onto one or more of the components in each active area of the array. The components are pressed together to spread the drops of LC material over the active areas so the sealant material for each LC cell interfaces with the LC material for the respective LC cell. Each deposition area has an inner perimeter, which is controllably varied across the array to compensate for variations in one or more properties of the spacer structures across the array.
1. A method, comprising:
forming a layer of spacer structure material in situ on a film component, and patterning the layer of spacer structure material in situ on the film component to define spacer structures for an array of liquid crystal (LC) cells in at least the active areas of the LC cells;
applying a counter component to the film component, after having dispensed sealant material onto one or more of the two components in respective sealant deposition areas around each active area of the array of LC cells, and after having dispensed one or more drops of LC material onto one or more of the two components in each active area of the array of LC cells;
pressing the two components together so as to spread the drops of LC material over the active areas;
wherein, after pressing, the sealant material for each LC cell interfaces with the LC material for the respective LC cell; and
wherein each of the sealant deposition areas has a respective inner perimeter and an inner perimeter size, bound by the respective inner perimeter, and the method further comprises controllably varying the inner perimeter size across the array of LC cells, so as to compensate for variations in one or more properties of the spacer structures across the array of LC cells.
2. The method according to claim 1 , comprising:
predicting variations in the one or more properties of the spacer structures based on spacer structure measurements in one or more production tests; and
wherein controllably varying the inner perimeter size across the array of LC cells is based on the predicted variations.
3. The method according to claim 1 , wherein the one or more properties of the spacer structures comprises the height of the spacer structures.