IP Library Granted Patent US 11,715,815
Granted Patent B2
US 11,715,815 · App. 17/053,800 · Granted Aug 1, 2023

Optoelectronic semiconductor device comprising a first and a second current spreading structure

Inventors: Michael Völkl (Regensburg, DE); Siegfried Herrmann (Neukirchen, DE)
Assignee: OSRAM OLED GMBH
H01L33/14H01L33/10H01L33/502
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Quick Facts
Patent No.
US 11,715,815
App. No.
17/053,800
Granted
Aug 1, 2023
Kind
B2
Abstract

An optoelectronic semiconductor device may include a first semiconductor layer, a second semiconductor layer, first and second current spreading structures, and an insulating intermediate layer. The second semiconductor layer may be arranged over a substrate. The first semiconductor layer may be arranged between the second semiconductor layer and the substrate. The first current spreading structure may be electrically connected to the first semiconductor layer, and the second current spreading structure electrically may be connected to the second semiconductor layer. The insulating intermediate layer may include a dielectric mirror and may be arranged between the second current spreading structure and the second semiconductor layer. The current spreading structures may overlap one another in a plane perpendicular to a main surface of the substrate. The first current spreading structure may be arranged at a larger distance from the first semiconductor layer than the second current spreading structure.

Claims (32)

1. An optoelectronic semiconductor device comprising:

a first semiconductor layer of a first conductivity type;

a second semiconductor layer of a second conductivity type arranged over a substrate;

wherein the first semiconductor layer is arranged between the second semiconductor layer and the substrate;

a first current spreading structure electrically connected to the first semiconductor layer;

a second current spreading structure electrically connected to the second semiconductor layer;

wherein the first current spreading structure is arranged at a larger distance from the first semiconductor layer than the second current spreading structure;

an insulating intermediate layer arranged between the second current spreading structure and the second semiconductor layer; wherein the insulating intermediate layer comprises a dielectric mirror layer, and wherein the first current spreading structure and the second current spreading structure overlap one another in a plane perpendicular to a main surface of the substrate; and

wherein the optoelectronic semiconductor device is configured to emit radiation via a main surface of the optoelectronic semiconductor device facing away from the substrate.

2. The optoelectronic semiconductor device according to claim 1 , wherein the insulating intermediate layer is interrupted in sections.

3. The optoelectronic semiconductor device according to claim 1 , wherein the first dielectric mirror layer directly contacts the second current spreading structure.

4. The optoelectronic semiconductor device according to claim 1 , wherein the first current spreading structure is connected to the first semiconductor layer via contact elements.

5. The optoelectronic semiconductor device according to claim 4 , wherein the contact elements penetrate the second current spreading structure.

6. The optoelectronic semiconductor device according to claim 4 , further comprising a vertical dielectric mirror layer arranged on the side walls of the contact elements.

7. The optoelectronic semiconductor device according to claim 1 , further comprising a first transparent conductive layer in an area outside the first current spreading structure and the second current spreading structure.

8. The optoelectronic semiconductor device according to claim 5 , wherein the first transparent conductive layer is arranged in a plane between the first current spreading structure and the second current spreading structure.

9. The optoelectronic semiconductor device according to claim 8 , further comprising:

a second transparent conductive layer arranged between the second semiconductor layer and the first transparent conductive layer; and

an insulating intermediate layer arranged between the first transparent conductive layer and the second transparent conductive layer.

10. The optoelectronic semiconductor device according to claim 1 , further comprising a second dielectric mirror layer arranged between the first current spreading structure and the second current spreading structure.

11. The optoelectronic semiconductor device according to claim 10 , wherein the second dielectric mirror layer directly contacts the first current spreading structure.

12. The optoelectronic semiconductor device according to claim 1 , further comprising a third dielectric mirror layer arranged over the first current spreading structure.

13. The optoelectronic semiconductor device according to claim 1 , further comprising an insulating layer between the first current spreading structure and the second current spreading structure, the insulating layer comprising a converter material.

14. The optoelectronic semiconductor device according to claim 13 , wherein the converter material comprises quantum dots, quantum wells, quantum wires, or combinations thereof.

15. The optoelectronic semiconductor device according to claim 13 , wherein the converter material comprises an epitaxially grown semiconductor layer.

16. The optoelectronic semiconductor device according to claim 1 , further comprising a nanostructured outcoupling layer over the second semiconductor layer.

17. The optoelectronic semiconductor device according to claim 1 , further comprising:

a first contact region contacting the first current spreading structure; and

a second contact region contacting the second current spreading structure, wherein the first contact region and the second contact region protrude from a surface of the optoelectronic semiconductor device.

18. An optoelectronic device comprising:

an optoelectronic semiconductor device according to claim 1 ; and

a carrier, wherein the optoelectronic semiconductor device is connected to the carrier in such a manner that the second semiconductor layer is arranged at a shorter distance from the carrier than the first semiconductor layer.

Assignments (4)
MERGER Recorded Feb 17, 2026
From: OSRAM OLED GMBH
To: AMS-OSRAM INTERNATIONAL GMBH
Reel/Frame 074881/0104 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2022
From: VOELKL, MICHAEL; HERRMANN, SIEGFRIED
To: OSRAM OPTO SEMICONDUCTORS GMBH
Reel/Frame 058823/0299 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2022
From: OSRAM OPTO SEMICONDUCTORS GMBH
To: OSRAM OLED GMBH
Reel/Frame 058823/0302 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2020
From: VOELKL, MICHAEL; HERRMANN, SIEGFRIED
To: OSRAM OLED GMBH
Reel/Frame 054612/0315 →
Priority Claims (1)
DE 10 2018 111 168.1 · May 9, 2018 · national
Continuity (1)
Related Publication 20210242367A1 · Aug 5, 2021