Memory devices and methods of controlling an auto-refresh operation of the memory devices

1. A memory device comprising:

a memory medium configured to perform a self-refresh operation and an auto-refresh operation in response to a self-refresh signal and an auto-refresh control signal, respectively; and

a memory controller configured to control the auto-refresh operation by transmitting the auto-refresh control signal to the memory medium,

wherein the memory medium includes a self-refresh controller, the self-refresh controller configured to control the self-refresh operation based on a self-refresh cycle varying according to an internal temperature of the memory medium and transmit the self-refresh signal to the memory controller,

wherein the memory controller configured to generate the auto-refresh control signal based on an auto-refresh cycle which is determined by the self-refresh signal transmitted from the memory medium, and

wherein the self-refresh cycle is determined by comparing the self-refresh signal with a clock signal.

2. The memory device of claim 1 ,

wherein the memory controller is configured to determine the self-refresh cycle by comparing the self-refresh signal with a clock signal.

3. The memory device of claim 1 ,

wherein the memory medium includes a plurality of output pins, and

wherein the self-refresh signal is transmitted in the form of a one-bit pulse signal to the memory controller through an unused pin among the plurality of output pins of the memory medium.

4. The memory device of claim 1 , wherein the self-refresh controller includes:

a temperature sensor configured to output a voltage signal having a voltage level corresponding to the internal temperature of the memory medium;

a voltage adjustment oscillator configured to generate a base clock signal, a frequency of the base clock signal varying according to the voltage level of the voltage signal;

a self-refresh cycle adjuster configured to apply a predetermined division factor to the base clock signal to generate the self-refresh signal; and

an address counter configured to receive the self-refresh signal to generate a self-refresh address.

5. The memory device of claim 1 , wherein the memory controller includes:

a self-refresh cycle counter configured to receive the self-refresh signal to generate a counted value corresponding to a cycle of the self-refresh signal;

a temperature information converter configured to receive the counted value to generate a temperature code corresponding to the counted value; and

an auto-refresh controller configured to generate the auto refresh control signal for the auto-refresh operation performed by the memory medium based on the auto-refresh cycle varying according to the temperature code.

6. The memory device of claim 5 , wherein the self-refresh signal is a one-bit pulse signal.

7. The memory device of claim 5 , wherein the temperature information converter includes a storage table that stores the temperature code having a binary number form which is set to correspond to the counted value.

8. The memory device of claim 5 , wherein the auto-refresh controller reduces the auto-refresh cycle if the temperature code increases and increases the auto-refresh cycle if the temperature code is reduced.