IP Library Granted Patent US 11,309,001
Granted Patent B2
US 11,309,001 · App. 17/071,107 · Granted Apr 19, 2022

Apparatuses and methods for setting a duty cycle adjuster for improving clock duty cycle

Inventor: Kang-Yong Kim (Boise, ID)
Assignee: Micron Technology, Inc.
G11C7/222G11C7/109G11C7/1063G11C7/225G11C11/4076H03K5/1565
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Quick Facts
Patent No.
US 11,309,001
App. No.
17/071,107
Granted
Apr 19, 2022
Kind
B2
Abstract

Apparatuses and methods for setting a duty cycler adjuster for improving clock duty cycle are disclosed. The duty cycle adjuster may be adjusted by different amounts, at least one smaller than another. Determining when to use the smaller adjustment may be based on duty cycle results. A duty cycle monitor may have an offset. A duty cycle code for the duty cycle adjuster may be set to an intermediate value of a duty cycle monitor offset. The duty cycle monitor offset may be determined by identifying duty cycle codes for an upper and for a lower boundary of the duty cycle monitor offset.

Claims (41)

1. A method, comprising:

issuing from a controller via a command/address bus, commands to a memory to perform a first duty cycle monitor sequence to determine a first duty cycle result;

changing with the controller, a duty cycle adjuster code stored in the memory to decrease the duty cycle adjuster code to decrease a high duty cycle based on the first duty cycle result by providing a mode register write command to the memory via the command/address bus;

issuing from the controller via the command/address bus commands to the memory to perform a second duty cycle monitor sequence to determine a second duty cycle result; and

changing the duty cycle adjuster code stored in the memory to increase the duty cycle adjuster code to increase the high duty cycle based on the second duty cycle result by providing a second mode register write command to the memory via the command/address bus, wherein a magnitude of the increase is different than a magnitude of the decrease.

2. The method of claim 1 , wherein the first duty cycle result comprises: a first result from a first duty cycle input flip condition; and

a second result from a second duty cycle input flip condition that is different than the first duty cycle input flip condition.

3. The method of claim 1 , wherein the first duty cycle result indicates a first high duty cycle greater than 50% and the second duty cycle result indicates a second high duty cycle less than 50%.

4. The method of claim 1 , further comprising issuing commands to the memory to perform a third duty cycle monitor sequence to determine a third duty cycle result.

5. The method of claim 4 , wherein issuing commands to the memory to perform the third duty cycle monitor sequence is performed before changing the duty cycle adjuster code.

6. The method of claim 1 , wherein changing the duty cycle adjuster code comprises changing one or more bits stored in a mode register.

7. The method of claim 1 ; wherein the magnitude of the increase is greater than the magnitude of the decrease.

8. The method of claim 1 , further comprising providing a clock signal from the controller to the memory via a clock bus.

9. The method of claim 8 , wherein the duty cycle adjuster code is based, at least in part, on the clock signal.

10. A method, comprising:

changing a duty cycle adjuster code stored in a memory by a fast speed to change a duty cycle based on a first duty cycle result of a first duty cycle monitor sequence; and

changing the duty cycle adjuster code stored in the memory by a slow speed to change the duty cycle based on a second duty cycle result of a second duty cycle monitor sequence,

wherein changing the duty cycle adjuster code comprises providing the duty cycle adjuster code and a mode register write command to the memory by a controller via a command/address bus.

11. The method of claim 10 , wherein the first duty cycle result indicates a high duty cycle less than 50% and the second duty cycle result indicates a high duty cycle greater than 50%.

12. The method of claim 10 , wherein the fast speed corresponds to a first number of steps of a duty cycle adjuster range and the slow speed corresponds to a second number of steps of the duty cycle adjuster range, wherein the second number is less than the first number.

13. The method of claim 12 , wherein the first number is double the second number.

14. The method of claim 10 , further comprising:

issuing commands to the memory to perform the first duty cycle monitor sequence to determine the first duty cycle result; and

issuing commands to the memory to perform the second duty cycle monitor sequence to determine the second duty cycle result.

15. The method of claim 10 , further comprising issuing commands to the memory to read at least one of the first duty cycle result or the second duty cycle result.

16. The method of claim 15 , wherein at least one of the first duty cycle result or the second duty cycle result are stored as one or more bits in a mode register.

17. The method of claim 10 , further comprising providing a clock signal from the controller to the memory via a clock bus.

18. An apparatus, comprising:

a memory;

a memory controller coupled to the memory, the memory controller configured to:

issue commands to the memory to perform a first duty cycle monitor sequence to determine a first duty cycle result;

change a duty cycle adjuster code of the memory by a first step size to change a duty cycle based on the first duty cycle result;

issue commands to the memory to perform a second duty cycle monitor sequence to determine a second duty cycle result; and

change the duty cycle adjuster code of the memory by a second step size to change a duty cycle based on the second duty cycle result, wherein the second step size is different than the first step size;

a command/address bus;

a data bus; and

a clock bus, wherein the memory controller is coupled to the memory through the command/address bus, the data bus, and the clock bus.

19. The apparatus of claim 18 , wherein the memory comprises a mode register, wherein the duty cycle adjuster code is stored as one or more bits in the mode register.

20. The apparatus of claim 18 , wherein the second step size is less than the first step size.

21. The apparatus of claim 18 , wherein the first duty cycle result indicates a first high duty cycle greater than 50% and the second duty cycle result indicates a second high duty cycle less than 50%.

22. The apparatus of claim 18 , wherein changing the duty cycle adjuster code of the memory by the first step size decreases a high duty cycle and changing the duty cycle adjuster code of the memory by the second step size increases the duty cycle adjuster code to increase the high duty cycle.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 15, 2020
From: KIM, KANG-YONG
To: MICRON TECHNOLOGY, INC.
Reel/Frame 054061/0640 →
Continuity (3)
Division 16167326 · Oct 22, 2018
Provisional Application 62677585 · May 29, 2018
Related Publication 20210027819A1 · Jan 28, 2021
Cited By (3)
US 12,573,443 US 12,586,621 US 12,615,050