IP Library Granted Patent US 11,619,601
Granted Patent B2
US 11,619,601 · App. 17/073,798 · Granted Apr 4, 2023

Sorbent based gas concentration monitor

Inventors: Jianer Bao (Sunnyvale, CA); Clinton Smith (San Francisco, CA); Eric Cocker (Redwood City, CA); David Schwartz (Concord, MA)
Assignee: Palo Alto Research Center Incorporated
G01N25/482G01N25/4826G01N25/4873G01N25/4893G01N33/004G01K3/14G01K7/22G01K2213/00
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Quick Facts
Patent No.
US 11,619,601
App. No.
17/073,798
Granted
Apr 4, 2023
Kind
B2
Abstract

A gas monitor apparatus includes a sorbent material that adsorbs a target gas based on a concentration of the target gas in a monitored environment and a reference material that does not respond to the target gas. The gas monitor also includes a first thermistor disposed within the sorbent material and a second thermistor disposed within the reference material, the first thermistor to provide a first indication of a first temperature of the sorbent material and the second thermistor to provide a second indication of a second temperature of the reference material. A processing device determines a concentration of the target gas based at least in part on a differential measurement between the first temperature and the second temperature.

Claims (41)

1. A gas monitor comprising:

a sorbent material that selectively adsorbs a target gas based on a concentration of the target gas in a monitored environment, wherein the sorbent material is configured to passively adsorb the target gas without heat being provided to the sorbent material;

a reference material that is not responsive to the target gas;

a first thermistor disposed within the sorbent material, wherein the first thermistor shares an available contact surface area with the sorbent material to achieve a high thermal conductivity;

a second thermistor disposed within the reference material, the first thermistor to provide a first indication of a first temperature of the sorbent material and the second thermistor to provide a second indication of a second temperature of the reference material; and

a processing device to determine a concentration of the target gas based at least in part on a differential measurement between the first temperature and the second temperature.

2. The gas monitor of claim 1 , further comprising:

a first heating element to provide heat to the sorbent material; and

a second heating element to provide heat to the reference material, wherein the first heating element and the second heating element are to provide periodic heating to the sorbent material and the reference material to determine an absolute value of the concentration of the target gas or calibrate the gas monitor.

3. The gas monitor of claim 2 , wherein the processing device is to determine the concentration of the target gas based on mapping the differential measurements to an isotherm curve for the target gas and sorbent.

4. The gas monitor of claim 1 , wherein the sorbent material comprises a microporous or nano-porous carbon material and the target gas is carbon dioxide.

5. The gas monitor of claim 1 , wherein the target gas is one of carbon dioxide, carbon monoxide, benzene, or Formaldehyde.

6. The gas monitor of claim 1 , wherein the sorbent material comprises a printed sorbent ink with a binder.

7. The gas monitor of claim 1 , further comprising a chamber allowing gas flow along the sorbent material and the reference material.

8. The gas monitor of claim 1 , further comprising:

a second sorbent material that selectively adsorbs a second target gas; and

a third thermistor disposed within the second sorbent material, wherein the processing device is further to determine a concentration of the second target gas based at least in part on an output of the third thermistor.

9. The gas monitor of claim 1 , wherein the first thermistor is disposed by pressure within the sorbent material, along with the available contact surface area, to achieve a high thermal conductivity.

10. A method comprising:

receiving, from a first thermistor, an indication of a first temperature of a sorbent, wherein the sorbent changes temperature based on a heat of adsorption of a target gas, wherein the sorbent is configured to passively adsorb the target gas without heat being provided to the sorbent, wherein the first thermistor shares an available contact surface area with the sorbent material to achieve a high thermal conductivity;

determining a second temperature based on a second indication of the second temperature received from a second thermistor coupled to a reference material; and

determining, based at least in part on the indication of the first temperature of the sorbent and the second temperature of the reference material, a concentration of the target gas in a monitored environment in contact with the sorbent.

11. The method of claim 10 ,

wherein determining the concentration of the sorbent comprises calculating a differential between the indication of the first temperature of the sorbent and the second indication of the second temperature of the reference material.

12. The method of claim 10 , further comprising:

periodically driving a heating element operatively coupled to the sorbent,

wherein determining the concentration of the sorbent comprises determining an absolute value of the concentration based on a difference in the indication of the first temperature of the sorbent relative to a third temperature due to the heating element.

13. The method of claim 12 , wherein periodically driving the heating element comprising driving the heating element at a rate greater 0.1 Hz and less than 100 Hz.

14. The method of claim 10 , wherein the target gas is one of carbon dioxide, carbon monoxide, benzene, or Formaldehyde.

15. The method of claim 12 further comprising comparing changes in the difference to an isotherm curve for the sorbent in the presence of the target gas.

16. A method comprising:

coupling a first thermistor and a second thermistor to a substrate;

depositing a sorbent material on the substrate to couple the sorbent material to the first thermistor, wherein the first thermistor shares an available contact surface area with the sorbent material and is pressure calendared with the deposited sorbent material to achieve a high thermal conductivity, and wherein the sorbent material selectively adsorbs a target gas based on a concentration of the target gas in a monitored environment, and wherein the sorbent material is configured to passively adsorb the target gas without heat being provided to the sorbent material;

depositing a reference material on the substrate to couple the reference material to the second thermistor; and

coupling the first thermistor and the second thermistor to a processing device.

17. The method of claim 16 , wherein the method further comprises:

providing a first heating element coupled to the sorbent material; and

providing a second heating element coupled to the reference material, wherein the first heating element and the second heating element are to provide periodic heating to the sorbent material and the reference material to determine an absolute value of the concentration of the target gas.

18. The method of claim 16 , wherein depositing the sorbent material comprises printing the sorbent material mixed with at least one of a binder or a solvent.

19. The method of claim 16 , wherein depositing the sorbent material further comprises depositing the sorbent material with a porous glassy solid binder.

20. The method of claim 16 , wherein depositing the sorbent material further comprises depositing a sorbent ink comprising the sorbent material, a styrene acrylic-based polymer latex, and a solvent.

Assignments (10)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 14, 2025
From: XEROX CORPORATION
To: GENESEE VALLEY INNOVATIONS, LLC
Reel/Frame 073562/0677 →
SECOND LIEN NOTES PATENT SECURITY AGREEMENT Recorded Jul 2, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 071785/0550 →
FIRST LIEN NOTES PATENT SECURITY AGREEMENT Recorded Apr 11, 2025
From: XEROX CORPORATION
To: U.S. BANK TRUST COMPANY, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 070824/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT RF 064760/0389 Recorded Feb 13, 2024
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: XEROX CORPORATION
Reel/Frame 068261/0001 →
SECURITY INTEREST Recorded Feb 13, 2024
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 066741/0001 →
SECURITY INTEREST Recorded Nov 20, 2023
From: XEROX CORPORATION
To: JEFFERIES FINANCE LLC, AS COLLATERAL AGENT
Reel/Frame 065628/0019 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVAL OF US PATENTS 9356603, 10026651, 10626048 AND INCLUSION OF US PATENT 7167871 PREVIOUSLY RECORDED ON REEL 064038 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jun 28, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064161/0001 →
SECURITY INTEREST Recorded Jun 22, 2023
From: XEROX CORPORATION
To: CITIBANK, N.A., AS COLLATERAL AGENT
Reel/Frame 064760/0389 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 20, 2023
From: PALO ALTO RESEARCH CENTER INCORPORATED
To: XEROX CORPORATION
Reel/Frame 064038/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2020
From: BAO, JIANER; SMITH, CLINTON; COCKER, ERIC; SCHWARTZ, DAVID
To: PALO ALTO RESEARCH CENTER INCORPORATED
Reel/Frame 054124/0572 →
Continuity (2)
Continuation 15800788 · Nov 1, 2017
Related Publication 20210041382A1 · Feb 11, 2021