CsI(Tl) scintillator crystal including multi valence cations to reduce afterglow, and a radiation detection apparatus including the scintillation crystal

1. A scintillator crystal comprising:

a cesium iodide host material;

a first dopant comprising a thallium cation, a molar concentration of said first dopant being less than 10%; and

a second dopant selected from the group consisting of chromium (Cr), zirconium (Zr), cobalt (Co), manganese (Mn), cadmium (Cd), dysprosium (Dy), thulium (Tm), tantalum (Ta), and erbium (Er), the dopant concentration of the element selected from the group consisting of chromium (Cr), zirconium (Zr), cobalt (Co), manganese (Mn), cadmium (Cd), dysprosium (Dy), thulium (Tm), tantalum (Ta), and erbium (Er) is at least partially in its 3+ or 2+ or 4+ or 5+ oxidation state, wherein the quantity of the second dopant in the scintillator comprises between 1×10 −7 mol % and 0.1 mol %, wherein the scintillator crystal has a light output intensity of less than 0.3% at 500 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation.

2. The scintillator crystal of claim 1 , further comprising a third dopant, and wherein the third dopant comprises an oxidation state different from the second dopant.

3. The scintillator crystal of claim 1 , further comprising a third dopant, and wherein the second dopant comprises trivalent oxidation state and the third dopant comprises divalent oxidation state.

4. The scintillator crystal of claim 1 , wherein the second dopant selected from the group consisting of chromium (Cr), cobalt (Co), manganese (Mn), and cadmium (Cd) is at least partially in its 2+ oxidation state.

5. The scintillator crystal of claim 1 , wherein the second dopant selected from the group consisting dysprosium (Dy), thulium (Tm), and erbium (Er) is at least partially in its 3+ oxidation state.

6. The scintillator crystal of claim 1 , wherein the second dopant selected from the group consisting of zirconium (Zr) is at least partially in its 4+ oxidation state.

7. The scintillator crystal of claim 1 , wherein the second dopant selected from the group consisting of tantalum (Ta) is at least partially in its 5+ oxidation state.

8. The scintillator crystal of claim 1 , wherein the scintillator crystal comprises at least 9×10 −4 mol % of the second dopant.

9. The scintillator crystal of claim 1 , wherein the scintillator crystal comprises less than 1×10 −3 mol % second dopant and wherein the scintillator crystal has a light output intensity of less than 0.5% at 100 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation.

10. The scintillator crystal of claim 1 , wherein the scintillator crystal comprises less than 1×10 −3 mol % second dopant and.

11. The scintillator crystal of claim 1 , wherein the scintillator crystal contains more than 1×10 −6 mol % of a co-dopant cation capable of existing in more than one oxidation state within the crystal matrix.

12. The scintillator crystal of claim 1 , wherein the scintillator crystal comprises no greater than 0.1 mol % of the second dopant.

13. A scintillator crystal comprising:

a cesium iodide host material;

a first dopant comprising a thallium cation, a molar concentration of said first dopant being less than 10%; and

a second dopant comprising a chromium cation, the second dopant resulting in the scintillator having a reduced afterglow, wherein the scintillator crystal has a light output intensity of less than 0.3% at 500 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation.

14. The scintillator crystal of claim 13 , wherein the quantity of the chromium in the scintillator crystal comprises between 1×10 −7 mol % and 1×10 −3 mol % chromium.

15. The scintillator crystal of claim 13 , wherein the scintillator crystal comprises less than 1×10 −3 mol % chromium and wherein the scintillator crystal has a light output intensity of less than 0.3% at 100 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation.

16. The scintillator crystal of claim 13 , wherein the scintillator crystal comprises less than 1×10 −3 mol % chromium and wherein the scintillator crystal has a light output intensity of less than 0.2% at 500 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation.

17. A radiation detection apparatus comprising:

a housing;

a scintillator within the housing, the scintillator comprising:

a cesium iodide host material;

a first dopant comprising a thallium cation, a molar concentration of said first dopant being less than 10%; and

a second dopant selected from the group consisting of chromium (Cr), zirconium (Zr), cobalt (Co), manganese (Mn), cadmium (Cd), dysprosium (Dy), thulium (Tm), tantalum (Ta) and erbium (Er), the dopant concentration of the element selected from the group consisting of chromium (Cr), zirconium (Zr), cobalt (Co), manganese (Mn), cadmium (Cd), dysprosium (Dy), thulium (Tm), tantalum (Ta) and erbium (Er), the second dopant resulting in the scintillator having a reduced afterglow, wherein the scintillator crystal has a light output intensity of less than 0.3% at 500 ms after exposure to an X-ray irradiation, relative to a light output intensity measured during the X-ray irradiation.

18. The radiation detection apparatus of claim 17 , a second dopant comprising a zirconium cation, the second dopant resulting in the scintillator having a reduced afterglow.

19. The radiation detection apparatus of claim 18 , wherein the afterglow is reduced by at least 30%.

20. The radiation detection apparatus of claim 17 , wherein the scintillator crystal comprises no greater than 0.1 mol % of the second dopant.