Methods and system with dynamic ECC voltage and frequency
Apparatus and methods are disclosed, including using a memory controller to monitor at least one parameter related to power level of a host processor of a host device, and dynamically adjusting at least one of a clock frequency and a voltage level of an error-correcting code (ECC) subsystem of the memory controller based on the at least one parameter to control power usage of the host device.
1. A storage system comprising:
a memory array; and
a memory controller configured to communicate with a host processor of a host device, wherein the memory controller is programmed to perform operations including:
monitoring at least one parameter related to processing demand of the host processor; and
dynamically adjusting a clock frequency of an error-correcting code (ECC) subsystem of the memory controller including selecting a channel of the ECC subsystem having a per channel frequency system that supports different frequencies for operation of the ECC subsystem on different channels in response to the at least one parameter related to processing demand of the host device.
2. The storage system of claim 1 , wherein the memory controller is further programmed to perform operations including:
comparing the at least one parameter to a programmable threshold; and
dynamically adjusting the clock frequency of the ECC subsystem based on the comparison.
3. The storage system of claim 2 , wherein the programmable threshold includes a setting that is configured through a ROM setting.
4. The storage system of claim 2 , wherein the programmable threshold includes a setting that is configured through a bootstrap hardware select pin.
5. The storage system of claim 2 , wherein the programmable threshold includes a setting that is configured through a substrate wiring option.
6. The storage system of claim 2 , wherein the programmable threshold includes a setting that is configured through a fuse.
7. The storage system of claim 2 , the programmable threshold includes a setting that is configured through a metal mask.
8. The storage system of claim 1 , wherein dynamically adjusting the clock frequency the ECC subsystem includes adjusting the clock frequency between 100 MHz and 1000 MHz.
9. The storage system of claim 1 , wherein the memory controller is further programmed to perform operations comprising:
saving a last setting of the clock frequency of the ECC subsystem of the memory controller; and
restoring the last setting when entering or exiting sleep mode for the storage system.
10. A method comprising:
monitoring, by a memory controller, at least one parameter related to processing demand of a host processor of a host device configured to communicate with the memory controller; and
dynamically adjusting, by the memory controller, a clock frequency of an error-correcting code (ECC) subsystem of the memory controller including selecting a channel of the ECC subsystem having a per channel frequency system that supports different frequencies for operation of the ECC subsystem on different channels in response to the at least one parameter related to processing demand of the host device.
11. The method of claim 10 , further comprising:
comparing the at least one parameter to a programmable threshold; and
dynamically adjusting the clock frequency of the ECC subsystem based on the comparison.
12. The method of claim 11 , wherein the programmable threshold includes a setting that is configured through a fuse or a metal mask.
13. The method of claim 10 , wherein dynamically adjusting the clock frequency of the ECC subsystem includes using ring buffers to adjust for clock domain differences for the ECC subsystem.
14. The method of claim 10 , wherein dynamically adjusting the clock frequency of the ECC subsystem including using glitch-less clocking to support dynamic frequency changes for the ECC subsystem.
15. The method of claim 10 , wherein the ECC subsystem includes a per channel voltage system that supports different voltages for operation of the ECC subsystem on different channels.
16. The method of claim 10 , wherein the ECC subsystem includes a ECC generation logic and a ECC checking logic, and wherein the ECC generation logic is configured to operate at a different voltage level than the ECC checking logic.
17. The method of claim 10 , wherein the ECC subsystem includes a ECC generation logic and a ECC checking logic, and wherein the ECC generation logic is configured to operate at a different frequency level than the ECC checking logic.
18. A method comprising:
monitoring, by a memory controller, at least one parameter related to processing demand of a host processor of a host device configured to communicate with the memory controller; and
selecting, by the memory controller in response to the at least one parameter related to processing demand of the host device, a channel of an error-correcting code (ECC) subsystem of the memory controller having a per channel frequency system that supports different frequencies for operation of the ECC subsystem on different channels.
19. The method of claim 18 , further comprising:
saving a last setting of a frequency of operation of the ECC subsystem of the memory controller.
20. The method of claim 19 , further comprising:
restoring the last setting when entering or exiting sleep mode for the memory controller.