Electrical test device and method
An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The power supply may be connected to an external power source. The conductive probe element may be connected to the power supply and may be configured to be energized by the power supply. The probe element may be configured to be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may be configured to receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may be configured to analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system.
1. An electrical test device, comprising:
a processor electrically connected to a single conductive probe element configured to be in electrical contact with an electrical path of an electrical system, and the processor being configured to receive an output signal from the electrical path and determine a first voltage across the electrical path in response to applying, via the conductive probe element, a current pulse at a first amperage;
the processor being configured to determine a second voltage across the electrical path in response to applying, via the single conductive probe element, a second voltage across the electrical path in response to application of a second current pulse, wherein the first current pulse has a different amperage magnitude than the second current pulse;
the processor being configured to determine a voltage drop across the electrical path based on the difference between the first voltage and the second voltage; and
the processor being configured to prevent the application of the second current pulse to the electrical path when the first voltage is outside of a normal operating range of the electrical path.
2. The electrical test device of claim 1 wherein:
the electrical path comprises a power feed having a high-voltage side and a low-voltage side;
the single conductive probe element being configured to be placed in contact with the low-voltage side; and
the single conductive probe element being configured to sink current into the test device during application of the second current pulse.
3. The electrical test device of claim 1 wherein:
the electrical path comprises a power ground having a high-voltage side and a low-voltage side;
the single conductive probe element being configured to be placed in contact with the high-voltage side; and
the single conductive probe element being configured to source current into the electrical path during application of the second current pulse.
4. The electrical test device of claim 1 wherein:
the processor being configured to determine an electrical resistance of the electrical path based on the voltage drop.
5. A method of measuring a voltage drop in a relatively low-impedance electrical path, comprising the steps of:
determining, using a processor electrically connected to a conductive probe element, a first voltage across an electrical path in response to the application of a first current pulse applied via the conductive probe element to the electrical path;
determining, using the processor, a second voltage across the electrical path in response to the application of a second current pulse applied via the conductive probe element to the electrical path;
determining, using the processor, a voltage drop across the electrical path based on the difference between the first voltage and the second voltage;
wherein the determining of the voltage drop facilitates indicating, using an indicating device, the voltage drop across the electrical path; and
wherein the processor prevents the application of the second current pulse to the electrical path when the first voltage is outside of a normal operating range.
6. A method of measuring a voltage drop in a relatively low-impedance electrical path, comprising the steps of:
determining, using a processor, a first voltage across an electrical path in response to applying, via a conductive probe element electrically connected to the processor, a first current pulse to the electrical path;
determining, using the processor, a second voltage across the electrical path in response to applying, via the conductive probe element, a second current pulse to the electrical path;
determining, using the processor, a voltage drop across the electrical path based on the difference between the first voltage and the second voltage, wherein the determining the voltage drop facilitates indicating, using an indicating device, the voltage drop across the electrical path;
wherein the electrical path comprises a power feed having a high-voltage side and a low-voltage side that is in contact with the conductive probe element to facilitate sinking current from the electrical path into the test device during application of the second current pulse.
7. A method of measuring a voltage drop in a relatively low-impedance electrical path, comprising the steps of:
determining, using a processor, a first voltage across an electrical path in response to applying, via a conductive probe element electrically connected to the processor, a first current pulse to the electrical path;
determining, using the processor, a second voltage across the electrical path in response to applying, via the conductive probe element, a second current pulse to the electrical path;
determining, using the processor, a voltage drop across the electrical path based on the difference between the first voltage and the second voltage, wherein the determining the voltage drop facilitates indicating, using an indicating device, the voltage drop across the electrical path;
wherein the electrical path comprises a power ground having a high-voltage side that is in contact with the conductive probe element to facilitate sourcing current from the test device into the electrical path during application of the current pulse and a low-voltage side.