IP Library › Granted Patent US 11,650,581
Granted Patent B2
US 11,650,581 · App. 17/102,811 · Granted May 16, 2023

Intelligent condition monitoring and fault diagnostic system for preventative maintenance

Inventors: Martin Hosek (Lowell, MA); Jay Krishnasamy (Billerica, MA); Jan Prochazka (Hudson, NH)
Assignee: Brooks Automation US, LLC
G05B23/0283B25J9/1674G05B19/41875G05B23/0221G06F11/2257
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Quick Facts
Patent No.
US 11,650,581
App. No.
17/102,811
Granted
May 16, 2023
Kind
B2
Abstract

A system for condition monitoring and fault diagnosis includes a data collection function that acquires time histories of selected variables for one or more of the components, a pre-processing function that calculates specified characteristics of the time histories, an analysis function for evaluating the characteristics to produce one or more hypotheses of a condition of the one or more components, and a reasoning function for determining the condition of the one or more components from the one or more hypotheses.

Claims (42)

1. A continuous health monitoring system comprising:

a non-transitory medium embodying:

a data collection function that acquires unparameterized time histories of one or more variables of a vacuum component related to operation of a vacuum device during component operations;

a pre-processing function that calculates specific characteristics of the unparameterized time histories by independently characterizing each of the unparameterized time histories of the one or more variables of the vacuum component;

an analysis function for evaluating the specific characteristics of the unparameterized time histories to produce one or more hypotheses about a condition of the vacuum component; and

a reasoning function for determining the condition of the vacuum component from the one or more hypotheses,

wherein the data collection, pre-processing, and analysis functions operate in parallel with the component operations.

2. The system of claim 1 , wherein the vacuum device includes an edge gripper.

3. The system of claim 1 , wherein the vacuum device includes a suction gripper.

4. The system of claim 1 , wherein the one or more vacuum component variables include vacuum pressure readings.

5. The system of claim 1 , wherein the one or more vacuum component variables include vacuum pressure transition times.

6. The system of claim 1 , wherein the one or more vacuum component variables include operation times of the vacuum component.

7. The system of claim 1 , wherein the one or more vacuum component variables include positions of the vacuum component.

8. The system of claim 1 , wherein the one or more vacuum component variables include states of a vacuum component.

9. The system of claim 1 , wherein the specific characteristics of the unparameterized time histories include changes in vacuum pressure readings.

10. The system of claim 1 , wherein the specific characteristics of the unparameterized time histories include changes in vacuum pressure transition times.

11. The system of claim 1 , wherein the specific characteristics of the unparameterized time histories include changes in operation times of the vacuum component.

12. The system of claim 1 , wherein the specific characteristics of the unparameterized time histories include changes in positions of the vacuum component.

13. The system of claim 1 , wherein the specific characteristics of the unparameterized time histories include state changes of the vacuum component.

14. The system of claim 1 , wherein one or more hypotheses about a condition of the vacuum component includes a vacuum leak or a vacuum obstruction in the component.

15. The system of claim 1 , wherein one or more hypotheses about a condition of the vacuum component includes energy dissipation or power in the component.

16. The system of claim 1 , wherein one or more hypotheses about a condition of the vacuum component includes a component part failure.

17. A method of continuously monitoring system health comprising:

acquiring unparameterized time histories of one or more variables of a vacuum component related to operation of a vacuum device during component operations;

calculating specific characteristics of the unparameterized time histories during the component operations by independently characterizing each of the unparameterized time histories of the one or more variables of the vacuum component;

in parallel with the component operations, evaluating the specific characteristics of the unparameterized time histories to produce one or more hypotheses about a condition of the vacuum component; and

determining the condition of the vacuum component from the one or more hypotheses.

18. The method of claim 17 , wherein the vacuum device includes an edge gripper.

19. The method of claim 17 , wherein the vacuum device includes a suction gripper.

20. The method of claim 17 , wherein the one or more vacuum component variables include vacuum pressure readings.

21. The method of claim 17 , wherein the one or more vacuum component variables include vacuum pressure transition times.

22. The method of claim 17 , wherein the one or more vacuum component variables include operation times of the vacuum component.

23. The method of claim 17 , wherein the one or more vacuum component variables include positions of the vacuum component.

24. The method of claim 17 , wherein the one or more vacuum component variables include states of the vacuum component.

25. The method of claim 17 , wherein the specific characteristics of the unparameterized time histories include changes in vacuum pressure readings.

26. The method of claim 17 , wherein the specific characteristics of the unparameterized time histories include changes in vacuum pressure transition times.

27. The method of claim 17 , wherein the specific characteristics of the unparameterized time histories include changes in operation times of the vacuum component.

28. The method of claim 17 , wherein the specific characteristics of the unparameterized time histories include changes in positions of the vacuum component.

29. The method of claim 17 , wherein the specific characteristics of the unparameterized time histories include state changes of the vacuum component.

30. The method of claim 17 , wherein one or more hypotheses about a condition of the vacuum component includes a vacuum leak in the component.

31. The method of claim 17 , wherein one or more hypotheses about a condition of the vacuum component includes a vacuum obstruction in the component.

32. The method of claim 17 , wherein one or more hypotheses about a condition of the vacuum component includes a part failure in the component.