Spectral analysis of electronic circuits
A method of designing a filter to meet a set of specifications. The set of specifications is received, and a filter design is established. Analysis of the filter design is performed by: determining a part admittance matrix; determining a circuit admittance matrix based on the part admittance matrices; reducing interior nodes of the circuit admittance matrix; reducing algebraic nodes to transform the circuit admittance matrix into a Green's Function; evaluating the Green's Function to determine a circuit exterior node admittance matrix; and transforming the circuit exterior node admittance matrix to a circuit scattering matrix. The circuit scattering matrix is compared to the set of specifications to determine whether the filter design is satisfactory. When a determination is made that the design is not satisfactory, the filter design is modified and the process is repeated. When a determination is made that the design is satisfactory, a filter design description is output.
1. A method, comprising:
receiving, by a computing system, an initial microwave filter design and a set of specifications, the microwave filter design including a plurality of resonators, each resonator represented by a respective equivalent circuit model comprising resistive and reactive circuit components;
iteratively modifying the microwave filter design, by the computing system, until a circuit scattering matrix of the microwave filter design over a predetermined frequency range corresponds to the set of specifications; and
generating, by the computing system, a filter design description file for input to a manufacturing process.
2. The method of claim 1 , wherein the circuit scattering matrix is generated from a circuit exterior node admittance matrix of the microwave filter design over the predetermined frequency range.
3. The method of claim 2 , wherein the circuit exterior node admittance matrix is generated via a Green's Function from a circuit admittance matrix for exterior nodes and algebraic nodes of the microwave filter design.
4. The method of claim 3 , further comprising:
calculating a part admittance matrix with algebraic nodes for each circuit component; and
calculating the circuit admittance matrix based on the part admittance matrices.
5. The method of claim 4 , wherein calculating the circuit admittance matrix further comprises reducing interior nodes of the circuit admittance matrix.
6. The method of claim 3 , further comprising reducing the algebraic nodes of the circuit admittance matrix.
7. The method of claim 6 , further comprising:
calculating a time evolution of exterior node to algebraic node admittance using an exponential of a Hurwitz matrix; and
filtering diagonalization of the time evolution to generate the circuit exterior node admittance matrix.
8. The method of claim 3 , further comprising evaluating the Green's Function by linear algebra one frequency at a time over the predetermined frequency range to determine the circuit exterior node admittance matrix.
9. The method of claim 1 , wherein each resonator of the plurality of resonators is a surface acoustic wave resonator, a bulk acoustic wave resonator, a film bulk acoustic wave resonator, a thin-film bulk acoustic wave resonator, or a micro-electro-mechanical system resonator.
10. The method of claim 1 , wherein each resonator of the plurality of resonators is a surface acoustic wave resonator.
11. A system, comprising:
a computing system comprising at least one processor configured to:
receive an initial microwave filter design and a set of specifications, the microwave filter design including a plurality of resonators, each resonator represented by a respective equivalent circuit model comprising resistive and reactive circuit components,
iteratively modify the microwave filter design until a circuit scattering matrix of the microwave filter design over a predetermined frequency range corresponds to the set of specifications; and
generate a filter design description file for input to a manufacturing process.
12. The system of claim 11 , wherein the circuit scattering matrix is generated from a circuit exterior node admittance matrix of the microwave filter design over the predetermined frequency range.
13. The system of claim 12 , wherein the circuit exterior node admittance matrix is generated via a Green's Function from a circuit admittance matrix for exterior nodes and algebraic nodes of the microwave filter design.
14. The system of claim 13 , wherein the processor is further configured to:
calculate a part admittance matrix with algebraic nodes for each circuit component; and
calculate the circuit admittance matrix based on the part admittance matrices.
15. The system of claim 14 , wherein the processor is further configured to reduce interior nodes of the circuit admittance matrix.
16. The system of claim 13 , wherein the processor is further configured to reduce the algebraic nodes of the circuit admittance matrix.
17. The system of claim 16 , wherein the processor is further configured to:
calculate a time evolution of exterior node to algebraic node admittance using an exponential of a Hurwitz matrix; and
filter diagonalization of the time evolution to generate the circuit exterior node admittance matrix.
18. The system of claim 13 , wherein the processor is further configured to evaluate the Green's Function by linear algebra one frequency at a time over the predetermined frequency range to determine the circuit exterior node admittance matrix.
19. The system of claim 11 , wherein each resonator of the plurality of resonators is a surface acoustic wave resonator, a bulk acoustic wave resonator, a film bulk acoustic wave resonator, a thin-film bulk acoustic wave resonator, or a micro-electro-mechanical system resonator.
20. The system of claim 11 , wherein each resonator of the plurality of resonators is a surface acoustic wave resonator.