Transversely-excited film bulk acoustic resonators with three-layer electrodes
There is disclosed acoustic resonators and filter devices. An acoustic resonator includes a substrate having a surface and a single-crystal piezoelectric plate having front and back surfaces, the back surface attached to the surface of the substrate except for a portion of the piezoelectric plate forming a diaphragm that spans a cavity in the substrate. An interdigital transducer (IDT) is formed on the front surface of the single-crystal piezoelectric plate such that interleaved fingers of the IDT are disposed on the diaphragm. The piezoelectric plate and the IDT are configured such that a radio frequency signal applied to the IDT excites a primary shear acoustic mode in the diaphragm. The interleaved fingers comprise a first layer proximate the diaphragm, a second layer over the first layer, and a third layer over the second layer, wherein adjacent layers are different materials.
1. An acoustic resonator device comprising:
a substrate having a surface;
a piezoelectric layer attached to the surface of the substrate either directly or via one or more intermediate layers, the piezoelectric layer having a portion that forms a diaphragm that is over a cavity of the acoustic resonator device; and
an interdigital transducer (IDT) on a surface of the piezoelectric layer and having interleaved fingers on the diaphragm, the IDT configured such that a radio frequency signal applied to the IDT excites a primary shear acoustic mode in the diaphragm,
wherein the interleaved fingers comprise a first layer proximate the diaphragm, a second layer over the first layer, and a third layer over the second layer such that the second layer is between the first and third layers, wherein adjacent layers are comprised of different metals and a thickness of the second layer is in a range from 25% to 75% of a thickness of the diaphragm, and
wherein the primary shear acoustic mode is a bulk shear mode where acoustic energy propagates in a direction predominantly orthogonal to the surface of the piezoelectric layer and transverse to a direction of an electric field created by the interleaved fingers of the IDT that is predominantly lateral to the surface of the piezoelectric layer.
2. The device of claim 1 , wherein the first layer comprises a low transverse acoustic impedance metal, wherein the second layer comprises a high transverse acoustic impedance metal, wherein the third layer comprises an intermediate transverse acoustic impedance metal.
3. The device of claim 1 , wherein a thickness of the first layer is in a range from 25% to 75% of thickness of the diaphragm.
4. The device of claim 1 , wherein a thickness of the third layer is in a range from 25% to 75% of a thickness of the diaphragm.
5. The device of claim 1 , wherein the first layer comprises aluminum or titanium.
6. The device of claim 1 , wherein the second layer comprises chromium or tungsten.
7. The device of claim 1 , wherein the third layer comprises aluminum, titanium, copper, molybdenum, gold, or platinum.
8. The device of claim 1 , further comprising an adhesion layer between the first layer and the diaphragm.
9. The device of claim 1 , wherein the diaphragm is contiguous with the piezoelectric layer around at least 50% of a perimeter of the cavity.
10. A filter device comprising:
a plurality of acoustic resonators that each comprise:
a substrate having a surface;
a piezoelectric layer attached to the surface of the substrate either directly or via one or more intermediate layers, the piezoelectric layer having a portion that forms a diaphragm over a cavity of the respective acoustic resonator; and
a conductor pattern on a surface of the piezoelectric layer, the conductor pattern including an interdigital transducer (IDT) having interleaved fingers that are disposed on the respective diaphragm, the piezoelectric layer and the IDT configured such that a radio frequency signal applied to the IDT excites a primary shear acoustic mode in the respective diaphragm,
wherein the interleaved fingers of the IDT of each of the plurality of acoustic resonators comprise a first layer proximate the respective diaphragm, a second layer over the first layer, and a third layer over the second layer such that the second layer is between the first and third layers, wherein adjacent layers are comprised of different metals,
wherein the primary shear acoustic mode is a bulk acoustic wave having an electric field that is predominantly lateral in the piezoelectric layer, wherein the bulk acoustic wave propagates in a direction orthogonal to the piezoelectric layer and predominantly orthogonal to a surface of the piezoelectric layer, and
wherein, for each of the plurality of acoustic resonators, a thickness of the first layer is in a range from 25% to 75% of a thickness of the respective diaphragm.
11. The device of claim 10 , wherein, for each of the plurality of acoustic resonators, the first layer comprises a low transverse acoustic impedance metal, the second layer comprises a high transverse acoustic impedance metal, and the third layer comprises an intermediate transverse acoustic impedance metal.
12. The device of claim 10 , wherein, for each of the plurality of acoustic resonators, a thickness of the second layer is in a range from 25% to 75% of a thickness of the respective diaphragm.
13. The device of claim 10 , wherein, for each of the plurality of acoustic resonators, a thickness of the third layer is in a range from 25% to 75% of a thickness of the respective diaphragm.
14. The device of claim 10 , wherein, for each of the plurality of acoustic resonators, the first layer comprises aluminum or titanium.
15. The device of claim 10 , wherein, for each of the plurality of acoustic resonators, the second layer comprises chromium or tungsten.
16. The device of claim 10 , wherein, for each of the plurality of acoustic resonators, the third layer comprises aluminum, titanium, copper, molybdenum, gold, or platinum.
17. The device of claim 10 , wherein each of the plurality of acoustic resonators further comprises an adhesion layer between the first layer and the respective diaphragm.
18. The device of claim 10 , wherein, for each of the plurality of acoustic resonators, the respective diaphragm is contiguous with the piezoelectric layer around at least 50% of a perimeter of the cavity.
19. The device of claim 1 , wherein at least a portion of the interleaved fingers of the IDT have a mark that is greater than 0.05 times and less than 0.5 times a pitch of the interleaved fingers, wherein the mark is a width of each of the interleaved fingers and the pitch is a center-to-center spacing between adjacent fingers of the interleaved fingers.
20. The device of claim 10 , wherein, for each of the plurality of acoustic resonators, at least a portion of the interleaved fingers of the IDT have a mark that is greater than 0.05 times and less than 0.5 times a pitch of the interleaved fingers, wherein the mark is a width of each of the interleaved fingers and the pitch is a center-to-center spacing between adjacent fingers of the interleaved fingers.
21. A filter device comprising:
a plurality of acoustic resonators that each comprise:
a substrate having a surface;
a piezoelectric layer attached to the surface of the substrate either directly or via one or more intermediate layers, the piezoelectric layer including a diaphragm over a cavity of the acoustic resonator; and
a conductor pattern on a surface of the piezoelectric layer, the conductor pattern including an interdigital transducer (IDT) having interleaved fingers that are disposed on the respective diaphragm, the piezoelectric layer and the IDT configured such that a radio frequency signal applied to the IDT excites a primary shear acoustic mode in the respective diaphragm,
wherein the interleaved fingers of the IDT of each of the plurality of acoustic resonators comprise a first layer proximate the respective diaphragm, a second layer over the first layer, and a third layer over the second layer such that the second layer is between the first and third layers, wherein adjacent layers are comprised of different metals,
wherein, for each of the plurality of acoustic resonators, a thickness of the first layer is in a range from 25% to 75% of a thickness of the respective diaphragm, and
wherein, for each of the plurality of acoustic resonators, the first layer comprises a low transverse acoustic impedance metal, the second layer comprises a high transverse acoustic impedance metal, and the third layer comprises an intermediate transverse acoustic impedance metal.
22. The filter device of claim 21 , wherein the primary shear acoustic mode is a bulk acoustic wave that propagates in a direction predominantly orthogonal to the respective surface of each of the piezoelectric layers and transverse to a direction of an electric field created by the interleaved fingers of the respective IDT.
23. The filter device of claim 21 , wherein, for each of the plurality of acoustic resonators, a thickness of the second layer is in a range from 25% to 75% of a thickness of the respective diaphragm.
24. The filter device of claim 21 , wherein, for each of the plurality of acoustic resonators, a thickness of the third layer is in a range from 25% to 75% of a thickness of the respective diaphragm.
25. The filter device of claim 21 , wherein, for each of the plurality of acoustic resonators, the first layer comprises aluminum or titanium.
26. The device of claim 21 , wherein, for each of the plurality of acoustic resonators, the second layer comprises chromium or tungsten, and the third layer comprises aluminum, titanium, copper, molybdenum, gold, or platinum.
27. The device of claim 21 , wherein each of the plurality of acoustic resonators further comprises an adhesion layer between the first layer and the respective diaphragm.
28. The device of claim 21 , wherein, for each of the plurality of acoustic resonators, the respective diaphragm is contiguous with the piezoelectric layer around at least 50% of a perimeter of the cavity.