STACKED SEMICONDUCTOR LASERS WITH CONTROLLED SPECTRAL EMISSION
Stacked edge-emitting lasers having multiple active regions coupled together using tunnel junctions. The composition of each of the active regions (quantum wells and/or barriers) differs to provide a controlled different emission wavelength for each junction, when each junction is individually operated at the same fixed temperature. When the device is under operation, a thermal gradient exists across the junctions, and the emission wavelengths of each junction coincide as the different temperature for each junction causes relative wavelength shifts. Thus, the effect of temperature on the emission wavelength of the device is compensated for, producing a narrower linewidth emission.
1 . A multi junction edge emitting laser structure comprising:
a first laser junction having a first wavelength;
a second laser junction having a second wavelength; and
a tunnel junction coupling the first laser junction and the second laser junction,
wherein a first material composition of a first quantum well of the first laser junction and a second material composition of a second quantum well of the second laser junction differ such that a thermal gradient is formed across the first laser junction and the second laser junction when the laser structure is externally maintained at a temperature,
wherein the thermal gradient causes the first wavelength and the second wavelength to substantially coincide.
2 . The multi junction edge emitting laser structure of claim 1 ,
wherein at least one of: the first laser junction and the second laser junction includes a quantum-well structure that includes at least one of:
a) a quantum well that is substantially nitrogen-free and has a material composition of In x Ga 1-x As 1-y Sb y , wherein 0≤x≤0.4 and 0≤y≤0.4 and x+y≤0.4, and
b) a barrier that includes at least one of GaAs, GaAs 1-y N y , wherein 0<y<0.1, and GaAs 1-y P y , wherein 0<y≤0.35;
wherein the quantum-well structure has an emission wavelength in a range from about 900 nm to about 1300 nm.
3 . The multi junction edge emitting laser structure of claim 1 ,
wherein at least one of: the first laser junction and the second laser junction includes a quantum-well structure that includes at least one of:
i) a quantum well having a material composition of In x Ga 1-x N y As 1-y-z Sb z , wherein either (a) 0≤x≤0.45, 0<y≤0.1, 0≤z≤0.45 and x+z≤0.45, or (b) 0.1≤x≤0.45, 0<y≤0.1, 0≤z≤0.1 and x+z≤0.45, and
ii) a barrier that includes at least one of GaAs, GaAs 1-y N y wherein 0<y<0.1, and GaAs 1-y P y wherein 0<y≤0.35;
wherein the quantum-well structure has an emission wavelength in a range from about 1100 nm and about 1600 nm.
4 . The multi junction edge emitting laser structure of claim 1 , wherein:
the first laser junction includes a first active region having a first composition level, the first composition level being at least one of: a first In-composition level, a first Sb-composition level, and a first sum of the first In-composition level and the first Sb-composition level,
the second laser junction includes a second active region having a second composition level, the second composition level being at least one of: a second In-composition level, a second Sb-composition level, and a second sum of the second In-composition level and the second Sb-composition level, and
the first composition level is between 0.1% and 1.2% lower than the second composition level.
5 . The multi junction edge emitting laser structure of claim 4 , further comprising:
a heatsink, wherein the first active region is located farther away from the heatsink than the second active region.
6 . The multi junction edge emitting laser structure of claim 4 , wherein the first composition level is between 0.25% and 0.9% lower than the second composition level.
7 . The multi junction edge emitting laser structure of claim 1 , wherein:
the first laser junction includes a first active region having a first nitrogen composition level,
the second laser junction includes a second active region having a second nitrogen composition level, and
the first nitrogen composition level is less than 0.2% lower than the second composition nitrogen level.
8 . The multi junction edge emitting laser structure of claim 1 , wherein:
the first quantum well has a first width,
the second quantum well has a second width, and
the first width is 1 nm or less than the second width.
9 . The multi junction edge emitting laser structure of claim 8 , further comprising:
a heatsink, wherein the first quantum well is located farther away from the heatsink than the second quantum well.
10 . The multi junction edge emitting laser structure of claim 1 , further comprising:
a third laser junction having a third wavelength;
a second tunnel junction coupling the second laser junction and the third laser junction,
wherein a third material composition of a third quantum well of the third laser junction and the second material composition differ such that a second thermal gradient is formed across the second laser junction and the third laser junction when the laser structure is externally maintained at the temperature,
wherein the second thermal gradient causes the second wavelength and the third wavelength to substantially coincide.
11 . The multi junction edge emitting laser structure of claim 10 , wherein:
the first material composition and the third material composition are different, and
the first wavelength and third wavelength substantially coincide when the laser structure is externally maintained at the temperature.
12 . The multi junction edge emitting laser structure of claim 10 , wherein:
the first laser junction includes a first active region having a first composition level, the first composition level being at least one of: a first In-composition level, a first Sb-composition level, and a first sum of the first In-composition level and the first Sb-composition level,
the second laser junction includes a second active region having a second composition level, the second composition level being at least one of: a second In-composition level, a second Sb-composition level, and a second sum of the second In-composition level and the second Sb-composition level,
the third laser junction includes a third active region having a third composition level, the third composition level being at least one of: a third In-composition level, a third Sb-composition level, and a third sum of the third In-composition level and the third Sb-composition level,
the first composition level is between 0.1% and 1.2% lower than the second composition level, and
the second composition level is between 0.1% and 1.2% lower than the third composition level.
13 . The multi junction edge emitting laser structure of claim 10 , wherein:
the first laser junction includes a first active region having a first nitrogen composition level,
the second laser junction includes a second active region having a second nitrogen composition level,
the third laser junction includes a third active region having a third nitrogen composition level,
the first nitrogen composition level is less than 0.2% lower than the second composition nitrogen level, and
the second nitrogen composition level is less than 0.2% lower than the third composition nitrogen level.
14 . The multi junction edge emitting laser structure of claim 10 , wherein:
the first quantum well has a first width,
the second quantum well has a second width,
the third quantum well has a third width,
the first width is 1 nm or less than the second width, and
the second width is 1 nm or less than the third width.
15 . A multi junction edge emitting laser structure comprising:
a first laser junction having a first threshold current density and including a first lateral confinement region;
a second laser junction having a second threshold current density and including a second lateral confinement region; and
a tunnel junction coupling the first laser junction to the second laser junction;
wherein the first threshold current density and the second threshold current density are substantially matched.
16 . The multi junction edge emitting laser structure of claim 15 , wherein:
the first lateral confinement region has a first width,
the second lateral confinement region has a second width, and
the first width is different from the second width.
17 . The multi junction edge emitting laser structure of claim 15 , wherein:
the first lateral confinement region has a first thickness and a first composition,
the second lateral confinement region has a second thickness and a second composition, and
at least one or more of: the first thickness is different from the second thickness, and the first composition is different from the second composition.
18 . The multi junction edge emitting laser structure of claim 15 , wherein at least one of: the first lateral confinement region and the second lateral confinement region is an oxidized Al y Ga 1-y As layer, where y>0.9.
19 . The multi junction edge emitting laser structure of claim 18 , wherein:
the first lateral confinement region has a first oxidation length,
the second lateral confinement region has a second oxidation length, and
the first oxidation length is greater than the second oxidation length.
20 . The multi junction edge emitting laser structure of claim 15 , wherein a thermal gradient is formed across the first laser junction and the second laser junction when the laser structure is externally maintained at a temperature.