System and method for detecting oily residue in two-phase immersion cooling systems
A system for detecting residue in a two-phase immersion cooling system based on contact resistance. A structure is formed to represent a type of connection between a component and a connector. The structure is positioned near a heat source in the two phase fluid in its liquid state. As the fluid boils, residues are deposited on the structure. An increase in the current resistance across the structure may indicate the presence of a residue or corrosion caused by the residue. Structures may be formed using materials that are similar to existing connections in the information handling system. A heating element may generate more heat than existing components such that the system detects the presence of contaminants with sufficient time to allow less expensive and less intensive corrective measures.
1. A system for detecting residue in an immersion cooling system, the system comprising:
a structure configured to represent a type of contact point in an information handling system installed in the immersion cooling system;
a current source for applying a fixed current through the structure;
a heat source proximate to the structure, the heat source configured to heat a two- phase fluid to a boiling point;
a sensor for outputting a signal corresponding to a voltage drop across the structure; and
a processor coupled to the sensor and configured to:
receive the signal from the sensor;
determine an increase in a contact resistance based on the signal indicating a decrease in the voltage drop across the structure; and
communicate an indication that a residue in the two-phase fluid has exceeded a threshold level based on the increase in the contact resistance.
2. The system of claim 1 , wherein the structure connects at least two pin receivers of the plurality of pin receivers to form a contact chain.
3. The system of claim 2 , wherein a contact resistance associated with the contact chain is more sensitive to the change in current resistance than any pin of the first plurality of pins.
4. The system of claim 1 , wherein the second plurality of pins is configured for coupling to a PCIe card.
5. The system of claim 1 , wherein the structure is integrated with the connector or the component.
6. The system of claim 1 , wherein the structure comprises a multiple terminal resistance structure.
7. The system of claim 6 , wherein the structure comprises a Kelvin structure.
8. The system of claim 1 , wherein the system is a stand-alone system comprising:
a heating card comprising a first plurality of pins and a heating element, wherein the heating element is the heat source; and
a sensor card for coupling to the heating card, the sensor card comprising:
the sensor;
a plurality of pin receivers for connecting to the first plurality of pins on the heating card, wherein the structure comprises a plurality of contact points between the first plurality of pins and the plurality of pin receivers; and
a multiplexer coupled to the plurality of pin receivers and coupled to a second plurality of pins less than the first plurality of pins, wherein the second plurality of pins are configured for coupling to the connector in the information handling system.
9. A system for detecting residue in an immersion cooling system, the system comprising:
a structure configured to represent a type of contact point in an information handling system installed in the immersion cooling system;
a voltage source for applying a voltage across the structure;
a heat source proximate to the structure, the heat source configured to heat a two-phase fluid to a boiling point;
a sensor for outputting a signal corresponding to a current passing through the structure; and
a processor coupled to the sensor and configured to:
receive the signal from the sensor;
determine an increase in a contact resistance based on the signal indicating a decrease in the current passing through the structure; and
communicate an indication that a residue in the two-phase fluid has exceeded a threshold level based on the increase in the contact resistance.
10. The system of claim 9 , wherein the structure connects at least two pin receivers of the plurality of pin receivers to form a contact chain.
11. The system of claim 10 , wherein a contact resistance associated with the contact chain is more sensitive to the change in current resistance than any pin of the first plurality of pins.
12. The system of claim 9 , wherein the second plurality of pins is configured for coupling to a PCIe card.
13. The system of claim 9 , wherein the structure is integrated with the connector or the component.
14. The system of claim 9 , wherein the structure comprises a multiple terminal resistance structure.
15. The system of claim 14 , wherein the structure comprises a Kelvin structure.
16. The system of claim 9 , wherein the system is a stand-alone system comprising:
a heating card comprising a first plurality of pins and a heating element, wherein the heating element is the heat source; and
a sensor card for coupling to the heating card, the sensor card comprising:
the sensor;
a plurality of pin receivers for connecting to the first plurality of pins on the heating card, wherein the structure comprises a plurality of contact points between the first plurality of pins and the plurality of pin receivers; and
a multiplexer coupled to the plurality of pin receivers and coupled to a second plurality of pins less than the first plurality of pins, wherein the second plurality of pins are configured for coupling to the connector in the information handling system.
17. A two-phase immersion cooling system, comprising:
a tank containing a two-phase fluid;
a printed circuit board comprising a heat generating component installed in the tank; and
a system for detecting residue in the two-phase fluid, comprising:
a structure configured to represent a type of contact point between a component and a connector in an information handling system installed in the immersion cooling system;
one of a current source for applying a current through the structure or a voltage source for applying a voltage to the structure;
a heat source proximate to the structure, the heat source configured to heat the two-phase fluid to a boiling point;
a sensor for outputting a signal corresponding to the current passing through the structure or a voltage drop across the structure; and
a processor coupled to the sensor and configured to:
receive the signal from the sensor;
determine an increase in a contact resistance based on the signal indicating a decrease in the current passing through the structure or a voltage drop across the structure; and
communicate an indication that a residue in the two-phase fluid has exceeded a threshold level based on the increase in the contact resistance.
18. The two-phase immersion cooling system of claim 17 , wherein:
the system for detecting residue in the two-phase fluid is a stand-alone system comprising:
a heating card comprising a first plurality of pins and a heating element, wherein the heating element is the heat source; and
a sensor card for coupling to the heating card, the sensor card comprising:
the sensor;
a plurality of pin receivers for connecting to the first plurality of pins on the heating card to form a plurality of contact points; and
a multiplexer coupled to the plurality of pin receivers and coupled to a second plurality of pins less than the first plurality of pins, wherein the second plurality of pins are configured for coupling to the connector in the information handling system.