Operating method of memory controller to reduce lifespan damage, operating method of host and storage device

1. A method of operating a memory controller, the method comprising:

receiving a state analysis request of a memory from a host;

determining a fragment state of the memory;

determining a desired lifespan of the memory;

determining an expected lifespan of the memory;

determining a restriction section of the memory based on a difference between the desired lifespan and the expected lifespan of the memory;

generating an analysis result indicating garbage collection is restricted based on the fragment state and a host write count being within the restriction section;

providing the analysis result to the host;

receiving a garbage collection execution request from the host, in response to providing the analysis result to the host; and

performing a garbage collection operation on a garbage-collected memory region of the memory, in response to the garbage collection execution request.

2. The method of claim 1 , wherein generating the analysis result further comprises:

generating the analysis result such that the analysis result indicates that the garbage collection is required, in response to the host write count exceeding the restriction section.

3. The method of claim 1 , further comprising:

adjusting a size of the restriction section based on the expected lifespan of the memory.

4. The method of claim 1 , wherein generating the analysis result comprises:

generating the analysis result that the analysis result indicates the garbage collection is not required, in response to the fragment state of the memory being below a fragmentation threshold.

5. The method of claim 1 , further comprising:

adjusting a size of the garbage-collected memory region based on the expected lifespan of the memory.

6. The method of claim 1 , further comprising:

providing the host with the fragment state and the expected lifespan.

7. The method of claim 1 , wherein the determining the expected lifespan comprises:

calculating an expected lifespan based on a Write Amplification Factor (WAF).

8. The method of claim 1 , further comprising:

receiving a mode control signal from the host, and wherein the generating the analysis result comprises:

generating the analysis result based on the fragment state and the expected lifespan, in response to the mode control signal indicating a first mode, and

generating the analysis result based on the fragment state without consideration of the expected lifespan, in response to the mode control signal indicating a second mode.

9. The method of claim 1 , wherein the memory is included in one of an eMMC (embedded multimedia card), a UFS (universal flash storage) or a SSD (solid state drive).

10. A method of operating a memory controller, the method comprising:

receiving a first state analysis request of a memory from a host;

providing a first analysis result of the memory to the host, in response to the first state analysis request;

receiving a first garbage collection execution request of the memory from the host;

performing a garbage collection operation on a first memory region of the memory, the first memory region being a first size;

receiving a second state analysis request of the memory from the host after performing the garbage collection operation on the first memory region;

providing a second analysis result of the memory to the host, in response to the second state analysis request, the second analysis result indicating that the garbage collection operation on the memory is restricted;

receiving a third state analysis request of the memory from the host after providing the second analysis result to the host;

providing a third analysis result of the memory to the host, in response to the third state analysis request;

receiving a third garbage collection execution request of the memory from the host; and

performing the garbage collection operation on a second memory region of the memory, the second memory region being a second size different from the first size of the first memory region.

11. The method of claim 10 , wherein the second size is smaller than the first size.

12. The method of claim 10 , further comprising:

generating the second analysis result such that the second analysis result indicates that the garbage collection operation is restricted, in response to the memory being fragmented, an expected lifespan of the memory is determined not to fulfill a desired lifespan, and a host write count is within a restriction section.

13. A storage device comprising:

a memory; and

a memory controller configured to,

determine a fragment state, a desired lifespan and an expected lifespan of the memory in response to a state analysis request from a host,

determine a restriction section of the memory based on a difference between the desired lifespan and the expected lifespan of the memory,

generate an analysis result indicating garbage collection is restricted based on the fragment state and a host write count being within the restriction section,

receive a garbage collection execution request from the host, in response to providing the analysis result to the host, and

perform a garbage collection operation on a garbage-collected memory region of the memory, in response to the garbage collection execution request.

14. The storage device of claim 13 , wherein the memory controller is configured to generate the analysis result such that the analysis result indicates that the garbage collection is required, in response to the host write count being outside the restriction section.

15. The storage device of claim 14 , wherein the memory controller is configured to adjust a size of the restriction section based on the expected lifespan of the memory.