System and Method for Generating Defect Identifiers
A method, computer program product, and computing system for receiving one or more defect characteristics associated with one or more computing device-related defects. Information associated with the one or more defect characteristics may be extracted from unstructured defect data based upon, at least in part, the one or more defect characteristics. A defect identifier for the one or more defect characteristics may be generated based upon, at least in part, the extracted information associated with the one or more defect characteristics.
1 . A computer-implemented method, executed on a computing device, comprising:
receiving one or more defect characteristics associated with one or more computing device-related defects;
extracting information associated with the one or more defect characteristics from unstructured defect data based upon, at least in part, the one or more defect characteristics; and
generating a defect identifier for the one or more defect characteristics based upon, at least in part, the extracted information associated with the one or more defect characteristics.
2 . The computer-implemented method of claim 1 , wherein receiving the one or more defect characteristics include receiving a defect type and a reporting component associated with the one or more computing device-related defects.
3 . The computer-implemented method of claim 1 , wherein extracting the information associated with the one or more defect characteristics from the unstructured defect data includes:
identifying one or more source files within the unstructured defect data based upon, at least in part, the one or more defect characteristics;
identifying one or more defect characteristic field extraction expressions based upon, at least in part, the one or more defect characteristics; and
extracting, via the one or more defect characteristic field extraction expressions, one or more defect characteristic fields associated with the one or more defect characteristics.
4 . The computer-implemented method of claim 3 , wherein extracting the information associated with the one or more defect characteristics from the unstructured defect data includes:
identifying one or more defect characteristic field value extraction expressions based upon, at least in part, the one or more defect characteristic fields; and
extracting, via the one or more defect characteristic field value extraction expressions, one or more defect characteristic field values associated with the one or more defect characteristic fields.
5 . The computer-implemented method of claim 4 , wherein generating the defect identifier for the one or more defect characteristics includes generating the defect identifier with the one or more defect characteristic fields and the one or more data characteristic field values extracted from the unstructured defect data.
6 . The computer-implemented method of claim 1 , further comprising:
determining whether the one or more defect identifiers are duplicative of one or more existing defect identifiers of a defect identifier database.
7 . The computer-implemented method of claim 6 , further comprising:
in response to determining that the one or more defect identifiers are not duplicative of the one or more existing defect identifiers, assigning the one or more defect identifiers to at least one defect resolution resource of a plurality of defect resolution resources.
8 . A computer program product residing on a non-transitory computer readable medium having a plurality of instructions stored thereon which, when executed by a processor, cause the processor to perform operations comprising:
receiving one or more defect characteristics associated with one or more computing device-related defects;
extracting information associated with the one or more defect characteristics from unstructured defect data based upon, at least in part, the one or more defect characteristics; and
generating a defect identifier for the one or more defect characteristics based upon, at least in part, the extracted information associated with the one or more defect characteristics.
9 . The computer program product of claim 8 , wherein receiving the one or more defect characteristics include receiving a defect type and a reporting component associated with the one or more computing device-related defects.
10 . The computer program product of claim 8 , wherein extracting the information associated with the one or more defect characteristics from the unstructured defect data includes:
identifying one or more source files within the unstructured defect data based upon, at least in part, the one or more defect characteristics;
identifying one or more defect characteristic field extraction expressions based upon, at least in part, the one or more defect characteristics; and
extracting, via the one or more defect characteristic field extraction expressions, one or more defect characteristic fields associated with the one or more defect characteristics.
11 . The computer program product of claim 10 , wherein extracting the information associated with the one or more defect characteristics from the unstructured defect data includes:
identifying one or more defect characteristic field value extraction expressions based upon, at least in part, the one or more defect characteristic fields; and
extracting, via the one or more defect characteristic field value extraction expressions, one or more defect characteristic field values associated with the one or more defect characteristic fields.
12 . The computer program product of claim 11 , wherein generating the defect identifier for the one or more defect characteristics includes generating the defect identifier with the one or more defect characteristic fields and the one or more data characteristic field values extracted from the unstructured defect data.
13 . The computer program product of claim 8 , wherein the operations further comprise:
determining whether the one or more defect identifiers are duplicative of one or more existing defect identifiers of a defect identifier database
14 . The computer program product of claim 13 , wherein the operations further comprise:
in response to determining that the one or more defect identifiers are not duplicative of the one or more existing defect identifiers, assigning the one or more defect identifiers to at least one defect resolution resource of a plurality of defect resolution resources.
15 . A computing system comprising:
a memory; and
a processor configured to receive one or more defect characteristics associated with one or more computing device-related defects, wherein the processor is further configured to extract information associated with the one or more defect characteristics from unstructured defect data based upon, at least in part, the one or more defect characteristics, and wherein the processor is further configured to generate a defect identifier for the one or more defect characteristics based upon, at least in part, the extracted information associated with the one or more defect characteristics.
16 . The computing system of claim 15 , wherein receiving the one or more defect characteristics include receiving a defect type and a reporting component associated with the one or more computing device-related defects.
17 . The computing system of claim 15 , wherein extracting the information associated with the one or more defect characteristics from the unstructured defect data includes:
identifying one or more source files within the unstructured defect data based upon, at least in part, the one or more defect characteristics;
identifying one or more defect characteristic field extraction expressions based upon, at least in part, the one or more defect characteristics; and
extracting, via the one or more defect characteristic field extraction expressions, one or more defect characteristic fields associated with the one or more defect characteristics.
18 . The computing system of claim 17 , wherein extracting the information associated with the one or more defect characteristics from the unstructured defect data includes:
identifying one or more defect characteristic field value extraction expressions based upon, at least in part, the one or more defect characteristic fields; and
extracting, via the one or more defect characteristic field value extraction expressions, one or more defect characteristic field values associated with the one or more defect characteristic fields.
19 . The computing system of claim 18 , wherein generating the defect identifier for the one or more defect characteristics includes generating the defect identifier with the one or more defect characteristic fields and the one or more data characteristic field values extracted from the unstructured defect data.
20 . The computing system of claim 15 , wherein the processor is further configured to:
determine whether the one or more defect identifiers are duplicative of one or more existing defect identifiers of a defect identifier database.