Methods and circuitry for built-in self-testing of circuitry and/or transducers in ultrasound devices
Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.
1. An apparatus, comprising:
a processing device in operative communication with an ultrasound device, the processing device configured to:
receive, from the ultrasound device, sets of measurements of capacitances or a parameter related to the capacitances of one or more CMUTs in the ultrasound device at each of multiple bias voltages applied to membranes of the CMUTs;
determine collapse voltages of the one or more CMUTs based on the capacitances of the CMUTs at each of the multiple bias voltages; and
cause the ultrasound device to apply a bias voltage to the membranes of the CMUTs based at least in part on the collapse voltages of the one or more CMUTs,
wherein each of the measurements of the parameter related to the capacitances of the one or more CMUTs in the ultrasound device comprises a measurement of a time for a ramp voltage to cross a reference voltage, and wherein a current is integrated onto one of the CMUTs to generate the ramp voltage when a particular bias voltage of the multiple bias voltages is applied to the CMUT.
2. The apparatus of claim 1 , wherein the processing device is further configured to compute the capacitances of the one or more CMUTs in the ultrasound device based on the measurements of the parameter related to the capacitances of the one or more CMUTs in the ultrasound device.
3. The apparatus of claim 1 , wherein the processing device is configured, when determining the collapse voltages of the one or more CMUTs based on the capacitances of the one or more CMUTs at each of the multiple bias voltages, to determine a particular bias voltage at which a discontinuity occurs in a curve of capacitance versus bias voltage for each of the one or more CMUTs.
4. The apparatus of claim 1 , wherein the processing device is further configured to average the collapse voltages of the one or more CMUTs to produce an average of the collapse voltages.
5. The apparatus of claim 4 , wherein the processing device is configured, when causing the ultrasound device to apply the bias voltage to the membranes of the one or more CMUTs based at least in part on the collapse voltages of the one or more CMUTs, to cause the ultrasound device to apply a bias voltage to the membranes of the one or more CMUTs that is greater than the average of the collapse voltages by an offset voltage.
6. The apparatus of claim 5 , wherein the membranes of the one or more CMUTs comprise one shared membrane.
7. The apparatus of claim 5 , wherein the offset voltage is approximately equal to or between 25-30V.
8. The apparatus of claim 5 , wherein the processing device is further configured to use different offset voltages when the ultrasound device is imaging different anatomical regions.
9. A method, comprising:
receiving, by a processing device in operative communication with an ultrasound device and from the ultrasound device, sets of measurements of capacitances or a parameter related to the capacitances of one or more CMUTs in the ultrasound device at each of multiple bias voltages applied to membranes of the one or more CMUTs;
determining collapse voltages of the one or more CMUTs based on the capacitances of the one or more CMUTs at each of the multiple bias voltages; and
causing the ultrasound device to apply a bias voltage to the membranes of the one or more CMUTs based at least in part on the collapse voltages of the one or more CMUTs,
wherein each of the measurements of the parameter related to the capacitances of the one or more CMUTs in the ultrasound device comprises a measurement of a time for a ramp voltage to cross a reference voltage, and wherein a current is integrated onto one of the one or more CMUTs to generate the ramp voltage when a particular bias voltage of the multiple bias voltages is applied to the CMUT.
10. An apparatus, comprising:
a processing device in operative communication with an ultrasound device, the processing device configured to:
receive, from the ultrasound device, sets of measurements of a capacitance or a parameter related to the capacitance of one or more CMUTs in the ultrasound device at each of multiple bias voltages applied to membranes of the one or more CMUTs; and
generate a notification based on the sets of measurements,
wherein each of the measurements of the parameter related to the capacitances of the one or more CMUTs in the ultrasound device comprises a measurement of a time for a ramp voltage to cross a reference voltage, and wherein a current is integrated onto one of the CMUTs to generate the ramp voltage when a particular bias voltage of the multiple bias voltages is applied to the CMUT.
11. The apparatus of claim 10 , wherein the processing device is further configured to compute the capacitances of the one or more CMUTs in the ultrasound device based on the measurements of the parameter related to the capacitances of the one or more CMUTs in the ultrasound device.
12. The apparatus of claim 10 , wherein the processing device is further configured to count a number of the CMUTs having a membrane stuck to a substrate.
13. The apparatus of claim 12 , wherein the processing device is configured, when counting the number of the CMUTs having a membrane stuck to a substrate, to count a number of the CMUTs lacking a discontinuity in a curve of capacitance versus bias voltage for each of the one or more CMUTs.
14. The apparatus of claim 12 , wherein the processing device is configured to generate the notification based on the sets of measurements when the number of the CMUTs, a percentage of the CMUTs measured, and/or a percentage of the CMUTs in an array of the ultrasound device have a membrane stuck to the substrate.
15. The apparatus of claim 10 , wherein the notification comprises a notification that the ultrasound device should be replaced.
16. The apparatus of claim 10 , wherein the processing device is configured, when generating the notification, to generate the notification on a display screen of the processing device.
17. The apparatus of claim 10 , wherein the processing device is configured, when generating the notification, to transmit the notification to a supplier of the ultrasound device.