Dynamic ion filter for reducing highly abundant ions
The present disclosure relates to a device for filtering at least one selected ion from an ion beam includes a unit for creating an electric field for accelerating the ions of the ion beam along a flight path of predefinable length, and a controllable ion optical system, which delimits the flight path in one direction, and which is used to deflect the selected ion from a flight path of the ion beam. The device is further designed to control the ion optical system subject to a flight time of the selected ion along the flight path. The present disclosure also relates to a mass spectrometer having a device according to the present disclosure, and to a method for filtering at least one selected ion from an ion beam.
1. A device for filtering at least one selected ion from an ion beam, the device comprising:
a unit configured to generate an electric field capable of accelerating ions of the ion beam along a flight path of predefinable length;
an ion optical system configured to be controllable in a time-dependent manner, to delimit the flight path in one direction at an end portion of the flight path, and to deflect the at least one selected ion from the flight path of the ion beam;
an ion trap configured to accumulate or deplete at least one predefined ion within at least one predefinable range, which range comprises non-deflected ions of the ion beam, wherein the ion trap is disposed between the ion optical system and a detector configured to record mass spectra; and
a controller configured to control the ion optical system based on a flight time of the at least one selected ion along the flight path,
wherein the ion optical system is configured to be switched on during at least one time interval in which the at least one selected ion passes through the ion optical system as to deflect the at least one selected ion from the flight path, wherein the at least one selected ion has an intensity or number exceeding a predefinable limit value.
2. The device of claim 1 , further comprising the detector, which is configured to detect and/or determine the masses, charges, mass-to-charge ratios and/or intensities of the ions comprising the filtered ion beam.
3. The device of claim 1 , further comprising a computing unit configured to determine the flight times, masses, charges, mass-to-charge ratios and/or intensities of the ions comprising the ion beam.
4. The device of claim 1 , further comprising a control unit configured to control the ion optical system based on a flight time of the at least one selected ion along the flight path.
5. The device of claim 1 , wherein the ion optical system comprises at least one Bradbury-Nielson gate.
6. The device of claim 1 , wherein the ion trap is an orbitrap or a C-trap.
7. The device of claim 1 , further comprising a second ion optical system configured to direct the ion beam at least at a predefinable point in time such that the ion beam passes through the device.
8. A mass spectrometer comprising the device of claim 1 .
9. A method for filtering at least one selected ion from an ion beam, the method comprising:
accelerating ions comprising the ion beam along a flight path of predefinable length using a unit configured to generate an electric field capable of accelerating the ions;
deflecting the at least one selected ion from the flight path of the ion beam based on a flight time of the at least one selected ion along the flight path using an ion optical system;
controlling the ion optical system to be switched on during at least one time interval in which the at least one selected ion passes through the ion optical system as to deflect the at least one selected ion from the flight path, wherein the at least one selected ion has an intensity or number exceeding a predefinable limit value; and
accumulating or depleting at least one predefined ion within at least one predefinable range, which range comprises non-deflected ions of the ion beam using an ion trap disposed between the ion optical system and a detector configured to record mass spectra.
10. The method of claim 9 , wherein the at least one selected ion is selected based on at least one mass spectrum of the ion beam and/or based on the masses, charges, mass-to-charge ratios and/or intensities of the ions comprising the ion beam.
11. The method of claim 9 , wherein an accumulation factor or a depletion factor is determined.
12. The method of claim 11 , wherein the at least one predefined ion within the predefinable range is accumulated or depleted with a predefinable accumulation factor or a predefinable depletion factor, respectively.