IP Library Granted Patent US 11,848,245
Granted Patent B2
US 11,848,245 · App. 17/262,916 · Granted Dec 19, 2023

Power semiconductor apparatus

Inventors: Hironori Nagasaki (Tokyo, JP); Shintaro Tanaka (Tokyo, JP); Takashi Hirao (Tokyo, JP)
Assignee: Hitachi Astemo, Ltd.
H01L23/3121H01L23/4924H01L23/49541H01L24/32H01L25/18H02M7/003H01L23/367
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,848,245
App. No.
17/262,916
Granted
Dec 19, 2023
Kind
B2
Abstract

A power semiconductor apparatus includes a power semiconductor element having low and high potential side electrodes and a sense electrode, high and low potential side conductors electrically connected with the high potential side electrodes, respectively, a sense wiring electrically connected with the sense electrode, and a first metal portion facing the low potential side conductor or the low potential side conductor across the sense wiring. When viewed from an array direction of the sense wiring and the first metal portion, the sense wiring has a facing portion facing the high or low potential side conductor, the first metal portion forms a recess in a part overlapping the facing portion, and a depth of the recess is formed such that a distance between a bottom of the recess and the sense wiring is larger than a distance between the sense wiring and the high or low potential side conductor.

Claims (25)

1. A power semiconductor apparatus, comprising:

a power semiconductor element having a low potential side electrode, a high potential side electrode, and a sense electrode;

a high potential side conductor electrically connected with the high potential side electrode;

a low potential side conductor electrically connected with the low potential side electrode;

a sense wiring electrically connected with the sense electrode; and

a first metal portion facing the low potential side conductor or the low potential side conductor across the sense wiring,

wherein when viewed from a front view of the sense wiring and the first metal portion,

the sense wiring has a facing portion facing the high potential side conductor or the low potential side conductor,

the first metal portion forms a first recess in a part overlapping the facing portion, and

a depth of the first recess is formed such that a distance between a bottom of the fir recess and the sense wiring is larger than a distance between the sense wiring and the high potential side conductor or the low potential side conductor.

2. The power semiconductor apparatus according to claim 1 ,

wherein a width of the first recess is formed so as to be greater than a width of the sense wiring.

3. The power semiconductor apparatus according to claim 1 , comprising:

a second metal portion facing the first metal portion across the sense wiring and the low potential side electrode.

4. The power semiconductor apparatus according to claim 3 ,

wherein the second metal portion forms a second recess in a part of the sense wiring that overlaps the facing portion, and

a depth of the second recess is formed such that a distance between a bottom surface of the second recess and the sense wiring is greater than a distance between the sense wiring and the low potential side conductor.

5. The power semiconductor apparatus according to claim 4 ,

wherein a width of the second recess is formed so as to be greater than a width of the sense wiring.

6. The power semiconductor apparatus according to claim 1 ,

wherein the sense wiring includes a negative electrode sense wiring, and

comprises a positive electrode sense wiring different from the negative electrode sense wiring, and

when viewed from the front view of the sense wiring and the first metal portion,

the negative electrode sense wiring is provided so as to overlap the first recess or a second recess, and

the positive electrode sense wiring is provided so as not to overlap the first recess or the second recess.

Assignments (2)
CHANGE OF NAME Recorded Sep 2, 2021
From: HITACHI AUTOMOTIVE SYSTEMS, LTD.
To: HITACHI ASTEMO, LTD.
Reel/Frame 057655/0824 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 25, 2021
From: NAGASAKI, HIRONORI; TANAKA, SHINTARO; HIRAO, TAKASHI
To: HITACHI AUTOMOTIVE SYSTEMS, LTD.
Reel/Frame 055018/0794 →
Priority Claims (1)
JP 2018-140858 · Jul 27, 2018 · national
Continuity (1)
Related Publication 20210280483A1 · Sep 9, 2021