IP Library Granted Patent US 11,513,058
Granted Patent B2
US 11,513,058 · App. 17/313,457 · Granted Nov 29, 2022

Methods for modulating an intensity profile of a laser beam and systems for same

Inventors: Matthew Bahr (Fremont, CA); Keegan Owsley (Campbell, CA); Jizuo Zou (San Jose, CA)
Assignee: BECTON, DICKINSON AND COMPANY
G01N15/1459G01N2015/1006G01N2015/1438
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Quick Facts
Patent No.
US 11,513,058
App. No.
17/313,457
Granted
Nov 29, 2022
Kind
B2
Abstract

Aspects of the present disclosure include methods for modulating an intensity profile of a laser beam. Methods according to certain embodiments include irradiating an acousto-optic device with a laser to generate an output laser beam having a plurality of angularly deflected laser beams, capturing an image of the output laser beam, determining an intensity profile of the output laser beam along a horizontal axis from the captured image and adjusting one or more parameters of a waveform inputted into the acousto-optic device in response to the determined intensity profile to generate an output laser beam having a modulated intensity profile. Systems having a laser, an acousto-optic device, an imaging sensor and a waveform generator as well as non-transitory computer readable storage medium with instructions for practicing the subject methods are also described.

Claims (34)

1. A method for modulating an intensity profile of a laser in a particle analyzer, the method comprising:

irradiating an acousto-optic device with a laser to generate an output laser beam comprising a plurality of angularly deflected laser beams;

capturing an image of the output laser beam;

determining an intensity profile of the output laser beam along a horizontal axis from the captured image; and

adjusting one or more parameters of a waveform inputted into the acousto-optic device in response to the determined intensity profile to generate an output laser beam having a modulated intensity profile.

2. The method according to claim 1 , wherein the method comprises adjusting one or more tones of the inputted waveform.

3. The method according to claim 2 , wherein each tone of the inputted waveform comprises one or more sine waves.

4. The method according to claim 2 , wherein the method comprises adjusting an amplitude of the one or more tones of the inputted waveform.

5. The method according to claim 1 , wherein the method further comprises:

determining an amplitude of each angularly deflected laser beam in the output laser beam;

adjusting one or more parameters of the waveform inputted into the acousto-optic device for each angularly deflected laser beam.

6. The method according to claim 5 , wherein the method comprises adjusting the amplitude of the tone of the inputted waveform for each angularly deflected laser beam.

7. The method according to claim 5 , wherein the method comprises adjusting the frequency of the tone of the inputted waveform for each angularly deflected laser beam.

8. The method according to claim 1 , wherein one or more parameters of the inputted waveform are adjusted to generate an output laser beam having a substantially constant intensity profile along a horizontal axis.

9. The method according to claim 8 , wherein one or more parameters of the inputted waveform are adjusted to generate a plurality of angularly deflected laser beams having intensities which vary by 10% or less.

10. The method according to claim 8 , wherein one or more parameters of the inputted waveform are adjusted to generate a plurality of angularly deflected laser beams having intensities which vary by 5% or less.

11. The method according to claim 1 , wherein the method further comprises generating an intensity profile plot from the captured image of the output laser beam.

12. The method according to claim 1 , wherein the acousto-optic device is an acousto-optic deflector.

13. The method according to claim 1 , wherein each waveform inputted into the acousto-optic device is generated with an Arbitrary Waveform Generator (AWG).

14. The method according to claim 1 , wherein the plurality of angularly deflected laser beams comprise a local oscillator (LO) beam and a plurality of radiofrequency comb beams.

15. The method according to claim 1 , wherein the plurality of angularly deflected laser beams are spatially separated.

16. The method according to claim 15 , wherein the each angularly deflected laser beam at least partially overlaps with one other angularly deflected laser beam in the output laser beam.

17. The method according to claim 1 , wherein the particle analyzer is part of a flow cytometer.

18. A particle analyzer comprising:

a laser;

an acousto-optic device;

a waveform generator configured to input a waveform into the acousto-optic device to generate an output laser beam comprising a plurality of angularly deflected laser beams;

an imaging photosensor; and

a controller comprising a processor having memory operably coupled to the processor wherein the memory comprises instructions stored thereon, which when executed by the processor, cause the processor to:

capture an image of the output laser beam with the imaging photosensor;

determine an intensity profile of the output laser beam along a horizontal axis from the captured image; and

adjust one or more parameters of a waveform inputted into the acousto-optic device in response to the determined intensity profile to generate an output laser beam having a modulated intensity profile.

19. The particle analyzer according to claim 18 , wherein the acousto-optic device is an acousto-optic deflector.

20. The particle analyzer according to claim 18 , wherein the imaging photosensor is a camera.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 5, 2022
From: BAHR, MATTHEW; OWSLEY, KEEGAN; ZOU, JIZUO
To: BECTON, DICKINSON AND COMPANY
Reel/Frame 059502/0535 →
Continuity (2)
Provisional Application 63027080 · May 19, 2020
Related Publication 20210364413A1 · Nov 25, 2021