Microscope system, control method, and recording medium
A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.
1. A microscope system comprising:
a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification; and
a processor,
wherein:
the processor is configured to specify a type of a container in which a specimen is placed, and
when starting observation of the specimen placed in the container at the second magnification, the processor is further configured to:
specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and
control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.
2. The microscope system according to claim 1 , wherein the processor is configured to:
detect a structure corresponding to the type of the container based on the first image, and
specify the observation start position based at least on a result of detecting the structure.
3. The microscope system according to claim 2 , wherein the processor is configured to:
detect the specimen placed in the container based on the first image, and
specify the observation start position based on the result of detecting the structure and a result of detecting the specimen.
4. The microscope system according to claim 3 , wherein the structure corresponding to the type of the container is (i) a cover slip in a case where the type of the container is a microscope slide, (ii) a hole part provided in a dish in a case where the type of the container is the dish, and (iii) a well in a case where the type of the container is a multi-well plate.
5. The microscope system according to claim 2 , wherein the structure corresponding to the type of the container is (i) a cover slip in a case where the type of the container is a microscope slide, (ii) a hole part provided in a dish in a case where the type of the container is the dish, and (iii) a well in a case where the type of the container is a multi-well plate.
6. The microscope system according to claim 2 , wherein the processor is configured to, in a case where the type of the container is a microscope slide:
specify the observation start position from inside a cover slip overlapping the microscope slide, and
control the relative position such that the observation start position specified from inside the cover slip is contained in the field of view at the second magnification.
7. The microscope system according to claim 2 , wherein the processor is configured to, in a case where the type of the container is a dish:
specify the observation start position from inside the dish, and
control the relative position such that the observation start position specified from inside the dish is contained in the field of view at the second magnification.
8. The microscope system according to claim 2 , wherein the processor is configured to, in a case where the type of the container is a dish:
specify the observation start position from inside a hole part provided in the dish, and
control the relative position such that the observation start position specified from inside the hole part is contained in the field of view at the second magnification.
9. The microscope system according to claim 2 , wherein the processor is configured to, in a case where the type of the container is a multi-well plate:
specify the observation start position from inside a well provided in the multi-well plate, and
control the relative position such that the observation start position specified from inside the well is contained in the field of view at the second magnification.
10. The microscope system according to claim 2 , wherein the processor is configured to:
detect a staining state of the specimen placed in the container based on the first image, and
change a setting of an observation method of the microscope to an observation method corresponding to a result of detecting the staining state.
11. The microscope system according to claim 1 , wherein the processor is configured to, in a case where the type of the container is a microscope slide:
specify the observation start position from inside a cover slip overlapping the microscope slide, and
control the relative position such that the observation start position specified from inside the cover slip is contained in the field of view at the second magnification.
12. The microscope system according to claim 1 , wherein the processor is configured to, in a case where the type of the container is a dish:
specify the observation start position from inside the dish, and
control the relative position such that the observation start position specified from inside the dish is contained in the field of view at the second magnification.
13. The microscope system according to claim 1 , wherein the processor is configured to, in a case where the type of the container is a dish:
specify the observation start position from inside a hole part provided in the dish, and
control the relative position such that the observation start position specified from inside the hole part is contained in the field of view at the second magnification.
14. The microscope system according to claim 1 , wherein the processor is configured to, in a case where the type of the container is a multi-well plate:
specify the observation start position from inside a well provided in the multi-well plate, and
control the relative position such that the observation start position specified from inside the well is contained in the field of view at the second magnification.
15. The microscope system according to claim 1 , wherein the processor is configured to:
detect a staining state of the specimen placed in the container based on the first image, and
change a setting of an observation method of the microscope to an observation method corresponding to a result of detecting the staining state.
16. The microscope system according to claim 1 , further comprising:
a detection unit that outputs identification information identifying the type of the container by detecting an identification structure provided in a container holder that holds the container or in the container,
wherein the processor is configured to specify the type of the container based on the identification information outputted by the detection unit.
17. The microscope system according to claim 16 , wherein:
the identification structure is a magnet, and
the detection unit is a magnetic sensor.
18. The microscope system according to claim 1 , wherein the processor is configured to specify the type of the container based on the first image.
19. A control method, executed by a computer, of a microscope system provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, the control method comprising:
specifying a type of a container in which a specimen is placed;
when starting observation of the specimen placed in the container at the second magnification, specifying an observation start position according to the type of the container by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification; and
controlling a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.
20. A non-transitory recording medium storing a program, the program causing a computer of a microscope system provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification to execute processes comprising:
specifying a type of a container in which a specimen is placed;
when starting observation of the specimen placed in the container at the second magnification, specifying an observation start position according to the type of the container by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and
controlling a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.