IP Library Patent Application 17365046
Patent Application
App. No. 17/365,046

CMP POLISHING PAD

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Patent No.
US None
App. No.
17/365,046
Abstract

A polishing pad has a polishing layer comprising a polymer matrix comprising the reaction product of an isocyanate terminated urethane prepolymer and a chlorine-free aromatic polyamine cure agent and chlorine-free microelements. The microelements can be expanded, hollow microelements. The microelements can have a specific gravity measured of 0.01 to 0.2. The microelements can have a volume averaged particle size of 1 to 120 or 15 to 30 micrometers. The polishing layer is chlorine free.

Claims (13)

1 . A polishing pad useful in chemical mechanical polishing having a polishing layer comprising

a polymer matrix comprising the reaction product of an isocyanate terminated urethane prepolymer and a chlorine-free aromatic polyamine cure agent

and chlorine-free microelements having a specific gravity of 0.01 to 0.2 distributed within the polymer matrix.

2 . The polishing pad of claim 1 wherein the polishing layer has a chlorine content less than 0.1 wt % based on total weight of the polishing layer as determined by energy-dispersive X-ray spectroscopy.

3 . The polishing pad of claim 1 wherein the cure agent is an aromatic diamine.

4 . The polishing pad of claim 1 wherein the aromatic diamine has the formula

 where either R 1 and R 3 or R 1 and R 4 are amine groups or alkyl amine groups having 1 to 5 carbon atoms and R 2 , R 5 , R 6 , and whichever of R 3 or R 4 does not contain an amine containing group are independently selected in each occurrence from H, -L-alkyl groups of 1-4, carbon atoms, where L is a direct bond, or a linking group selected from O or S.

5 . The polishing pad of claim 1 wherein the cure agent comprises diethyl toluene diamine (DETDA), dimethyl thio-toluene diamine (DMTDA), or a combination thereof.

6 . The polishing pad of claim 1 wherein the microelements have a shell comprising an acrylonitrile copolymer.

7 . The polishing pad of claim 1 wherein the polishing layer comprises the microelement in an amount of 5 to 50 percent by volume based on total volume of the polishing layer portion.

8 . The polishing pad of claim 1 wherein the microelement has a volume averaged particle size of 1 to 120 micrometers.

9 . The polishing pad of claim 1 wherein the microelement has a wall thickness of 30 to 300 nanometers.

10 . A polishing pad useful in chemical mechanical polishing having a polishing layer comprising a polymer matrix comprising the reaction product of an isocyanate terminated urethane prepolymer and a chlorine-free aromatic polyamine cure agent and chlorine-free microelements distributed within the polymer matrix wherein the polishing layer has a chlorine content less than 0.01 wt % based on total weight of the polishing layer as determined by Combustion Ion Chromatography (CIC) as set out in ASTM D7359-18, wherein the chlorine-free microelements having a volume averaged particle size of 15 to 30 micrometers and an average shell wall thickness of 30 to 300 nanometers.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 21, 2021
From: QIAN, BAINIAN; ALDEN, DONNA M.; CIMOCH, MATTHEW; CHIOU, NAN-RONG; TSENG, SHENG-HUAN
To: ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC.
Reel/Frame 056937/0425 →