Constant current charging capacitor test
Systems, apparatuses and methods may provide for technology that applies a constant current to a capacitor, wherein the constant current causes a linear voltage increase in the capacitor, and determines a capacitance based on the constant current, a voltage change in the capacitor during the linear voltage increase, and a time change corresponding to the voltage change.
1. A solid state drive (SSD) comprising:
a non-volatile memory (NVM); and
a power management subsystem coupled to the NVM, the power management subsystem comprising:
a capacitor,
a charge circuit coupled to the capacitor via a first switch, wherein the charge circuit is to apply a constant current to the capacitor, and wherein the constant current causes a linear voltage increase in the capacitor,
a boost stage coupled to the capacitor via a second switch, wherein the boost stage is separate from the charge circuit and is to charge the capacitor to a voltage that is greater than an input voltage, and
a measurement circuit coupled to the capacitor, wherein the measurement circuit is to determine a capacitance of the capacitor based on the constant current, a voltage change in the capacitor during the linear voltage increase, and a time change corresponding to the voltage change.
2. The SSD of claim 1 , wherein the measurement circuit is to conduct a health check of the capacitor based on the capacitance before completion of a boost phase with respect to the capacitor.
3. The SSD of claim 1 , wherein the charge circuit is to remove the constant current from the capacitor, wherein removal of the constant current causes an instantaneous voltage shift at the capacitor, and wherein the measurement circuit is to determine an equivalent series resistance of the capacitor based on the instantaneous voltage shift.
4. The SSD of claim 3 , wherein the constant current is removed from the capacitor when the capacitor reaches an input voltage.
5. The SSD of claim 1 , wherein the constant current is applied during a boot of the SSD.
6. A power management subsystem comprising:
a capacitor;
a charge circuit coupled to the capacitor via a first switch, wherein the charge circuit is to apply a constant current to the capacitor, and wherein the constant current causes a linear voltage increase in the capacitor;
a boost stage coupled to the capacitor via a second switch, wherein the boost stage is separate from the charge circuit and is to charge the capacitor to a voltage that is greater than an input voltage, and
a measurement circuit coupled to the capacitor, wherein the measurement circuit is to determine a capacitance of the capacitor based on the constant current, a voltage change in the capacitor during the linear voltage increase, and a time change corresponding to the voltage change.
7. The power management subsystem of claim 6 , wherein the measurement circuit is to conduct a health check of the capacitor based on the capacitance before completion of a boost phase with respect to the capacitor.
8. The power management subsystem of claim 6 , wherein the charge circuit is to remove the constant current from the capacitor, wherein removal of the constant current causes an instantaneous voltage shift at the capacitor, and wherein the measurement circuit is to determine an equivalent series resistance of the capacitor based on the instantaneous voltage shift.
9. The power management subsystem of claim 8 , wherein the constant current is removed from the capacitor when the capacitor reaches an input voltage.
10. The power management subsystem of claim 6 , wherein the constant current is applied during a boot of a solid state drive containing the power management subsystem.
11. The power management subsystem of claim 6 , wherein the capacitor is a solid state drive holdup capacitor.
12. A method comprising:
applying, using a charge circuit coupled to a capacitor via a first switch, a constant current to the capacitor, wherein the constant current causes a linear voltage increase in the capacitor;
charging, using a boost stage coupled to the capacitor via a second switch, the capacitor to a voltage that is greater than an input voltage, wherein the boost stage is separate from the charge circuit, and
determining a capacitance of the capacitor based on the constant current, a voltage change in the capacitor during the linear voltage increase, and a time change corresponding to the voltage change.
13. The method of claim 12 , further including conducting a health check of the capacitor based on the capacitance before completion of a boost phase with respect to the capacitor.
14. The method of claim 12 , further including:
removing the constant current from the capacitor, wherein removal of the constant current causes an instantaneous voltage shift in the capacitor; and
determining an equivalent series resistance of the capacitor based on the instantaneous voltage shift.
15. The method of claim 14 , wherein the constant current is removed from the capacitor when the capacitor reaches an input voltage.
16. The method of claim 14 , further including charging the capacitor to a voltage that is greater than an input voltage.
17. The method of claim 12 , wherein the constant current is applied during a boot of a solid state drive.
18. The method of claim 12 , wherein the capacitor is a solid state drive holdup capacitor.