Device and method for detecting failure in MCU

1. A device for detecting a failure in a microcontroller unit (MCU), the device comprising:

a receiver receiving first watchdog output information from an electronic control device for determining whether the electronic control device has a failure;

a determination unit determining whether the electronic control device has the failure based on the first watchdog output information; and

a transmitter, upon determining that the electronic control device has the failure, transmitting a first reset signal to the electronic control device,

wherein the receiver further receives sensor state information from a sensor,

wherein the receiver further receives second watchdog output information, and wherein the second watchdog output information is obtained by merging sensor state information from the sensor and the first watchdog output information by a first register transfer level (RTL) logic,

wherein the first RTL logic counts occasions where either the sensor state information or the first watchdog output information includes failure information and, if the count is a predetermined number or more, produces the second watchdog output information.

2. The device of claim 1 ,

wherein the determination unit determines whether the electronic control device has the failure based on the first watchdog output information and the sensor state information.

3. The device of claim 2 , wherein the determination unit determines whether the sensor has a failure based on the sensor state information, and

wherein the transmitter transmits a result of determination of the failure in the sensor to the sensor.

4. The device of claim 1 , wherein the sensor state information is a result of determination of whether the sensor has a failure, by a processor included in the sensor.

5. The device of claim 1 , wherein the first watchdog output information includes a result of determining whether to reset the electronic control device based on sensing information received from the electronic control device.

6. A method for detecting a failure in an MCU, the method comprising:

receiving first watchdog output information from an electronic control device; determining whether the electronic control device has a failure based on the first watchdog output information; and

upon determining that the electronic control device has the failure, transmitting a first reset signal to the electronic control device,

wherein receiving the first watchdog output information further includes receiving sensor state information from a sensor,

wherein the first reset signal and the sensor state information from the sensor are merged into a second reset signal by an RTL logic,

wherein the RTL logic counts occasions where the sensor state information includes failure information and the first reset signal is received and, if the count is a predetermined number or more, produces the second reset signal.

7. The method of claim 6 , wherein

determining whether the electronic control device has the failure includes determining whether the electronic control device has the failure based on the first watchdog output information and the sensor state information.

8. The method of claim 7 , wherein determining whether the electronic control device has the failure includes determining whether the sensor has a failure based on the sensor state information, and wherein transmitting the first reset signal includes transmitting a result of determination of the failure in the sensor to the sensor.

9. The method of claim 6 , wherein the sensor state information is a result of determination of whether the sensor has a failure, by a processor included in the sensor.

10. The method of claim 6 , wherein the first watchdog output information includes a result of determining whether to reset the electronic control device based on sensing information received from the electronic control device.