Semiconductor device with a metal plate
In this semiconductor device, a positioning protrusion is formed at a side surface of a sealing resin from which one end of a main electrode wire protrudes. Thus, the outer size of the sealing resin can be reduced as compared to a case where a positioning protrusion is formed at the bottom of the sealing resin. In addition, a thickness regulating protrusion is provided with a space from solder. Thus, it is possible to prevent interface separation or crack that would occur starting from a contact part between the thickness regulating protrusion and the solder, whereby the life of a joining part between a semiconductor module and a cooler can be ensured. Accordingly, a semiconductor device having enhanced heat dissipation property and reliability is obtained without increase in the outer size of the semiconductor module.
1. A semiconductor device comprising a semiconductor module, the semiconductor module including:
a semiconductor element mounted at one surface of a metal member;
a metal plate provided at another surface of the metal member with an insulation sheet interposed therebetween;
a main electrode wire connected to the semiconductor element or the metal member; and
a sealing resin sealing the semiconductor element, the metal member, the insulation sheet, and the metal plate, with one surface of the metal plate exposed, wherein
the metal plate exposed from a bottom of the sealing resin and a cooling surface of a cooler are joined to each other via solder,
one end of the main electrode wire protrudes from a side surface of the sealing resin,
a positioning protrusion for positioning the semiconductor module and the cooler is formed at the side surface of the sealing resin from which the main electrode wire protrudes, and
a thickness regulating protrusion keeping a distance between the cooling surface and the semiconductor module constant and regulating a thickness of the solder is formed at the side surface or the bottom of the sealing resin.
2. The semiconductor device according to claim 1 , wherein
the positioning protrusion has a side surface protrusion protruding perpendicularly from the side surface of the sealing resin, and a distal end protrusion protruding toward the cooler from the side surface protrusion, and
the distal end protrusion is inserted into a recess formed in the cooling surface of the cooler.
3. The semiconductor device according to claim 1 , wherein
the thickness regulating protrusions are formed in at least three locations on the bottom of the sealing resin.
4. The semiconductor device according to claim 1 , wherein
the thickness regulating protrusion is formed at a peripheral part of the bottom of the sealing resin.
5. The semiconductor device according to claim 1 , wherein
the thickness regulating protrusion is formed with a length not less than a width of the main electrode wire, at a location corresponding to the main electrode wire on the bottom of the sealing resin.
6. The semiconductor device according to claim 1 , wherein
a space is provided between the thickness regulating protrusion and the solder.
7. The semiconductor device according to claim 1 , wherein
one end of the main electrode wire connected to the semiconductor element and one end of the main electrode wire connected to the metal member respectively protrude from two opposite side surfaces of the sealing resin, and
the positioning protrusions are provided at least one by one at the respective two side surfaces.
8. The semiconductor device according to claim 1 , wherein
the solder is joined to an entirety of the surface of the metal plate exposed from the bottom of the sealing resin.
9. The semiconductor device according to claim 1 , wherein
the metal member has a side surface in an inverted taper shape.
10. The semiconductor device according to claim 1 , wherein
the metal member has a cutout or a step at a side surface thereof.
11. The semiconductor device according to claim 1 , wherein
the metal plate has a side surface in an inverted taper shape or a shape in which a center part thereof protrudes.
12. A semiconductor device comprising a semiconductor module, the semiconductor module including:
a semiconductor element mounted at one surface of a metal member;
a metal plate provided at another surface of the metal member with an insulation sheet interposed therebetween;
a main electrode wire connected to the semiconductor element or the metal member; and
a sealing resin sealing the semiconductor element, the metal member, the insulation sheet, and the metal plate, with one surface of the metal plate exposed, wherein
the metal plate exposed from a bottom of the sealing resin and a cooling surface of a cooler are joined to each other via solder,
one end of the main electrode wire protrudes from a side surface of the sealing resin,
a positioning protrusion for positioning the semiconductor module and the cooler is formed at the side surface of the sealing resin from which the main electrode wire protrudes, and
the positioning protrusion also serves as a thickness regulating protrusion keeping a distance between the cooling surface and the semiconductor module constant and regulating a thickness of the solder.
13. The semiconductor device according to claim 12 , wherein
the positioning protrusion has a side surface protrusion protruding perpendicularly from the side surface of the sealing resin, and a distal end protrusion protruding toward the cooler from the side surface protrusion,
the side surface protrusion keeps the distance between the cooling surface and the semiconductor module constant, and
the distal end protrusion is inserted into a recess formed in the cooling surface of the cooler.
14. The semiconductor device according to claim 12 , wherein
separately from the positioning protrusion, a thickness regulating protrusion keeping the distance between the cooling surface and the semiconductor module constant and regulating the thickness of the solder is formed at the side surface or the bottom of the sealing resin.
15. The semiconductor device according to claim 12 , wherein
a space is provided between the positioning protrusion and the solder.
16. The semiconductor device according to claim 12 , wherein
one end of the main electrode wire connected to the semiconductor element and one end of the main electrode wire connected to the metal member respectively protrude from two opposite side surfaces of the sealing resin, and
the positioning protrusions are provided at least one by one at the respective two side surfaces.
17. The semiconductor device according to claim 12 , wherein
the solder is joined to an entirety of the surface of the metal plate exposed from the bottom of the sealing resin.
18. The semiconductor device according to claim 12 , wherein
the metal member has a side surface in an inverted taper shape.
19. The semiconductor device according to claim 12 , wherein
the metal member has a cutout or a step at a side surface thereof.
20. The semiconductor device according to claim 12 , wherein
the metal plate has a side surface in an inverted taper shape or a shape in which a center part thereof protrudes.