Stackable via package and method
A stackable via package includes a substrate having an upper surface and a trace on the upper surface, the trace including a terminal. A solder ball is on the terminal. The solder ball has a solder ball diameter A and a solder ball height D. A via aperture is formed in a package body enclosing the solder ball to expose the solder ball. The via aperture includes a via bottom having a via bottom diameter B and a via bottom height C from the upper surface of the substrate, where A<B and 0=<C<1/2×D. The shape of the via aperture prevents solder deformation of the solder column formed from the solder ball as well as prevents solder bridging between adjacent solder columns.
1. An electronic package comprising:
a substrate comprising a first substrate side facing a first vertical direction;
a terminal on the first substrate side;
a package interconnect on the terminal; and
a package body on the first substrate side and laterally surrounding the package interconnect,
wherein:
the package body comprises an aperture in which at least a portion of the package interconnect is positioned, the aperture being defined by an interior sidewall of the package body; and
in a vertical cross-section, the interior sidewall comprises:
a first sidewall portion that contacts the package interconnect and comprises a non-zero concave curvature; and
a second sidewall portion that does not contact the package interconnect and is more horizontal than the first sidewall portion.
2. The electronic package of claim 1 , wherein the package body comprises a molding material.
3. The electronic package of claim 1 , wherein the conductive ball is approximately spherical.
4. The electronic package of claim 1 , wherein in the vertical cross-section, the interior sidewall comprises a third sidewall portion that does not contact the package interconnect, and wherein the second sidewall portion is positioned vertically between the first sidewall portion and the third sidewall portion.
5. The electronic package of claim 4 , wherein in the vertical cross-section, the third sidewall portion is straighter than the first sidewall portion.
6. The electronic package of claim 1 , wherein the package interconnect comprises a solder.
7. The electronic package of claim 1 , wherein at a point of maximum lateral width of the package interconnect, the package interconnect is free of contact with the package body.
8. A method of forming an electronic package, the method comprising:
providing a first structure comprising:
a substrate comprising a first substrate side facing a first vertical direction;
a terminal on the first substrate side; and
a package interconnect on the terminal; and
forming a package body on the first substrate side and laterally surrounding the package interconnect,
wherein:
the package body comprises an aperture in which at least a portion of the package interconnect is positioned, the aperture being defined by an interior sidewall of the package body; and
in a vertical cross-section, the interior sidewall comprises:
a first sidewall portion that contacts the package interconnect and comprises a non-zero curvature, the first sidewall portion defining a first portion of the aperture having a first maximum width; and
a second sidewall portion that does not contact the package interconnect, the second sidewall portion directly vertically adjacent the first sidewall portion, the second sidewall portion defining a second portion of the aperture having a second maximum width that is greater than the first maximum width.
9. The method of claim 8 , wherein said forming the package body comprises molding an encapsulating material around the package interconnect, such that at least a portion of package interconnect is positioned in an aperture of the encapsulating material.
10. The method of claim of 9 , wherein said forming the package body comprises, after said molding the encapsulating material, expanding the aperture.
11. The method of claim 8 , wherein in the vertical cross-section, the interior sidewall comprises a third sidewall portion defining a third portion of the aperture having a third maximum width that is greater than the second maximum width.
12. The method of claim 11 , wherein in the vertical cross-section, the second sidewall portion is positioned vertically between the first sidewall portion and the third sidewall portion.
13. The method of claim 8 , wherein the package interconnect comprises a solder.
14. The method of claim 8 , wherein at a point of maximum lateral width of the package interconnect, the package interconnect is free of contact with the package body.
15. A method of manufacturing an electronic device, the method comprising:
providing a first structure comprising:
a substrate comprising a first substrate side facing a first vertical direction;
a first interconnection structure coupled to the first substrate side, the first interconnection structure comprising a first solder; and
an encapsulating material on the first substrate side and laterally surrounding the first solder, the encapsulating material comprising a first encapsulation side facing the first vertical direction, and a second encapsulation side facing the substrate,
where the first solder is entirely confined to an aperture;
enlarging the aperture around the first interconnection structure; and
after said enlarging the aperture, coupling a second solder to the first solder.
16. The method of claim 15 , wherein said enlarging the aperture comprises laser ablating a portion of the encapsulating material around the first interconnection structure.
17. The method of claim 15 , wherein the aperture is defined by an inner sidewall of the encapsulating material, the inner sidewall comprising, in a vertical cross-section:
a first sidewall portion that laterally narrows from the first encapsulation side toward the second encapsulation side;
a third sidewall portion that contacts the first interconnection structure; and
a second sidewall portion between the first sidewall portion and the third sidewall portion, where the second sidewall portion is more horizontal then the first and third sidewall portions.
18. The method of claim 15 , wherein at a point of maximum lateral width of the first interconnection structure, the first interconnection structure is free of contact with the encapsulating material.
19. The method of claim 15 , wherein the first substrate side comprises a first terminal; the first interconnection structure is coupled to the first terminal; the first structure comprises a solder mask material that contacts and laterally surrounds the first terminal such that no portion of the first interconnection structure contacts a lateral surface of the first terminal.
20. The method of claim 15 , wherein before said coupling the second solder to the first solder, no portion of the first solder protrudes from the first encapsulation side.
21. The method of claim 15 , wherein after said coupling the second solder to the first solder, the coupled second solder and first solder form an elongated solder structure.
22. The method of claim 15 , wherein the aperture comprises an aperture through only the encapsulating material.