IP Library Granted Patent US 12,136,796
Granted Patent B2
US 12,136,796 · App. 17/405,416 · Granted Nov 5, 2024

Electro-absorption modulated laser with integrated filter layer

Inventors: Dapeng Xu (Houston, TX); Jin Huang (Sugar Land, TX); Huanlin Zhang (Sugar Land, TX)
Assignee: Applied Optoelectronics, Inc.
H01S5/0265H01S5/026H01S5/0653H01S5/12H01S5/2022H01S5/22H01S5/34326H01S5/028H01S5/2054
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,136,796
App. No.
17/405,416
Granted
Nov 5, 2024
Kind
B2
Abstract

The present disclosure is generally directed to an EML with a filter layer disposed between an active region of the EML and a substrate of the EML to absorb a portion of unmodulated light energy, and preferably the unmodulated light energy caused by transverse electric (TE) substrate mode. The filter layer preferably comprises a material with an energy band gap (Eg) that is less than the energy band gap of the predetermined channel wavelength to absorb unmodulated laser light.

Claims (26)

1. An electro-absorption modulated laser (EML) to emit a predetermined channel wavelength, the EML comprising:

a substrate;

a distributed feedback (DFB) section provided by a first plurality of layers disposed on the substrate;

an electro-absorption modulator (EAM) section provided by a second plurality of layers disposed on the substrate;

an active region provided by the DFB section and the EAM section;

a filter layer disposed between the substrate and the active region, the filter layer comprising a material with an energy band gap less than an energy bandgap of the predetermined channel wavelength.

2. The EML of claim 1 , wherein the predetermined channel wavelength is in a range of 1260 to 1650 nm.

3. The EML of claim 2 , wherein the filter layer comprises indium gallium arsenide (InGaAs).

4. The EML of claim 3 , wherein the material forming the filter layer is selected from a group consisting of indium gallium arsenide (InGaAs), indium gallium arsenide phosphide (InGaAsP), indium gallium arsenide phosphide antimony (InGaAsSb), and aluminum gallium indium arsenic (AlGaInAs).

5. The EML of claim 1 , wherein the filter layer has an overall thickness in a range of 200 to 2000 Angstrom.

6. The EML of claim 1 , wherein the filter layer is disposed directly on the substrate.

7. The EML of claim 1 , wherein the active region includes a multi-quantum well (MQW), and wherein the filter layer is disposed from a waveguide core provided by the MQW at a first offset distance OD 1 .

8. The EML of claim 7 , wherein the first offset distance OD 1 is in a range of 1.5 to 3.0 microns.

9. The EML of claim 7 , further comprising a spacer layer disposed between the filter layer and the waveguide core of the MQW.

10. The EML of claim 9 , wherein the spacer layer comprises indium phosphide (InP).

11. The EML of claim 9 , wherein the first offset distance OD 1 is provided at least in part by the spacer layer.

12. The EML of claim 1 implemented as a buried heterostructure (BH) EML.

13. The EML of claim 1 implemented as a ridge-waveguide (RWG) EML.

14. A transmitter optical subassembly (TOSA) comprising:

an electro-absorption modulated laser (EML) to emit a predetermined channel wavelength, the EML comprising a plurality of layers disposed on a substrate to provide an active region, and wherein the EML includes a filter layer disposed between the substrate and the active region, the filter layer comprising a material with an energy band gap that is less than the energy band gap of the predetermined channel wavelength.

15. The TOSA of claim 14 , wherein the predetermined channel wavelength is in a range of 1260 to 1650 nm.

16. The TOSA of claim 14 , wherein the filter layer comprises indium gallium arsenide (InGaAs).

17. The TOSA of claim 14 , wherein the material forming the filter layer is selected from a group consisting of indium gallium arsenide (InGaAs), indium gallium arsenide phosphide (InGaAsP), indium gallium arsenide phosphide antimony (InGaAsSb), and aluminum gallium indium arsenic (AlGaInAs).

18. The TOSA of claim 14 , wherein the filter layer has an overall thickness in a range of 200 to 2000 Angstrom.

19. The EML of claim 1 , wherein the filter layer is configured to absorb at least a portion of unmodulated light.

20. The TOSA of claim 14 , wherein the filter layer is configured to absorb at least a portion of unmodulated light.

Assignments (4)
SECURITY INTEREST Recorded Aug 1, 2025
From: APPLIED OPTOELECTRONICS, INC.
To: BOKF, NA D/B/A BOK FINANCIAL
Reel/Frame 072338/0695 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Nov 20, 2023
From: CIT NORTHBRIDGE CREDIT LLC
To: APPLIED OPTOELECTRONICS, INC.
Reel/Frame 065630/0906 →
PATENT SECURITY AGREEMENT Recorded Nov 28, 2022
From: APPLIED OPTOELECTRONICS, INC.
To: CIT NORTHBRIDGE CREDIT LLC
Reel/Frame 062003/0523 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 18, 2021
From: XU, DAPENG; HUANG, JIN; ZHANG, HUANLIN
To: APPLIED OPTOELECTRONICS, INC.
Reel/Frame 057214/0657 →
Continuity (1)
Related Publication 20230053516A1 · Feb 23, 2023