Slit lamp microscope
A slit lamp microscope according to some aspect examples includes an illumination system and photographing system. The illumination system projects slit light onto an anterior segment of a subject's eye. The photographing system includes an optical system and an image sensor. The optical system directs light from the anterior segment onto which the slit light is being projected. The image sensor includes a light detecting surface that receives the light directed by the optical system. Further, a subject plane, a principal plane of the optical system, and the light detecting surface are arranged so as to satisfy a Scheimpflug condition. Here, the subject plane includes a focal point of the illumination system in which a position of the focal point is shifted on account of a refractive index of a tissue of the anterior segment.
1. A slit lamp microscope comprising:
an illumination system configured to project slit light onto an anterior segment of a subject's eye;
a photographing system that includes an optical system and an image sensor, the optical system being configured to direct light from the anterior segment onto which the slit light is being projected, and the image sensor including a light detecting surface that receives the light directed by the optical system;
a refractive index memory configured to store a refractive index of the anterior segment of the subject's eye;
a movement mechanism configured to move at least one of the illumination system and the photographing system; and
a controller configured to control the movement mechanism to move the at least one of the illumination system and the photographing system to shift a focal point of the illumination system by a shift angle determined based on the refractive index so that a subject plane including the shifted focal point, a principal plane of the optical system, and the light detecting surface are arranged so as to satisfy a Scheimpflug condition.
2. The slit lamp microscope of claim 1 , further comprising the movement mechanism configured to move both the illumination system and the photographing system,
wherein the photographing system is configured to acquire a plurality of images of the anterior segment by repetitively performing photography in parallel with movement of the illumination system and the photographing system by the movement mechanism.
3. The slit lamp microscope of claim 2 , further comprising a three dimensional image constructing processor configured to construct a three dimensional image based on the plurality of images.
4. The slit lamp microscope of claim 3 , further comprising a rendering processor configured to construct a rendered image by applying rendering to the three dimensional image.
5. The slit lamp microscope of claim 2 , further comprising an analyzing processor configured to apply predetermined analysis processing to at least one of the plurality of images or an image generated by processing at least one of the plurality of images.
6. The slit lamp microscope of claim 1 , wherein the shift angle belongs to a range of 3 to 13 degrees.
7. The slit lamp microscope of claim 6 , wherein the shift angle belongs to a range of 6 to 10 degrees.
8. A slit lamp microscope comprising:
an illumination system configured to project slit light onto an anterior segment of a subject's eye;
a photographing system that includes an optical system and an image sensor, the optical system being configured to direct light from the anterior segment onto which the slit light is being projected, and the image sensor including a light detecting surface that receives the light directed by the optical system;
an optical axis angle measuring instrument configured to measure an angle formed by an optical axis of the illumination system and an optical axis of the photographing system;
a movement mechanism configured to move at least one of the illumination system and the photographing system; and
a controller configured to control the movement mechanism to move the at least one of the illumination system and the photographing system to shift a focal point of the illumination system by a shift angle determined based on the angle so that a subject plane including the shifted focal point, a principal plane of the optical system, and the light detecting surface are arranged so as to satisfy a Scheimpflug condition.
9. A slit lamp microscope comprising:
an illumination system configured to project slit light onto an anterior segment of a subject's eye;
a photographing system that includes an optical system and an image sensor, the optical system being configured to direct light from the anterior segment onto which the slit light is being projected, and the image sensor including a light detecting surface that receives the light directed by the optical system;
an optical axis angle measuring instrument configured to measure an angle formed by an optical axis of the illumination system and an optical axis of the photographing system;
a corneal curvature radius measuring instrument configured to measure a corneal curvature radius of the anterior segment of the subject's eye;
a movement mechanism configured to move at least one of the illumination system and the photographing system; and
a controller configured to control the movement mechanism to move the at least one of the illumination system and the photographing system to shift a focal point of the illumination system by a shift angle determined based on the angle and the corneal curvature radius so that a subject plane including the shifted focal point, a principal plane of the optical system, and the light detecting surface are arranged so as to satisfy a Scheimpflug condition.
10. A slit lamp microscope comprising:
an illumination system configured to project slit light onto an anterior segment of a subject's eye;
a photographing system that includes an optical system and an image sensor, the optical system being configured to direct light from the anterior segment onto which the slit light is being projected, and the image sensor including a light detecting surface that receives the light directed by the optical system;
an optical axis angle measuring instrument configured to measure an angle formed by an optical axis of the illumination system and an optical axis of the photographing system;
an ocular refractive index measuring instrument configured to measure an ocular refractive index of the subject's eye;
a movement mechanism configured to move at least one of the illumination system and the photographing system; and
a controller configured to control the movement mechanism to move the at least one of the illumination system and the photographing system to shift a focal point of the illumination system by a shift angle determined based on the angle and the ocular refractive index so that a subject plane including the shifted focal point, a principal plane of the optical system, and the light detecting surface are arranged so as to satisfy a Scheimpflug condition.
11. A slit lamp microscope comprising:
an illumination system configured to project slit light onto an anterior segment of a subject's eye;
a photographing system that includes an optical system and an image sensor, the optical system being configured to direct light from the anterior segment onto which the slit light is being projected, and the image sensor including a light detecting surface that receives the light directed by the optical system;
an optical axis angle measuring instrument configured to measure an angle formed by an optical axis of the illumination system and an optical axis of the photographing system;
a corneal curvature radius measuring instrument configured to measure a corneal curvature radius of the anterior segment of the subject's eye;
an ocular refractive index measuring instrument configured to measure an ocular refractive index of the subject's eye;
a movement mechanism configured to move at least one of the illumination system and the photographing system; and
a controller configured to control the movement mechanism to move the at least one of the illumination system and the photographing system to shift a focal point of the illumination system by a shift angle determined based on the angle, the corneal curvature radius, and the ocular refractive index so that a subject plane including the shifted focal point, a principal plane of the optical system, and the light detecting surface are arranged so as to satisfy a Scheimpflug condition.