IP Library Granted Patent US 12,007,339
Granted Patent B2
US 12,007,339 · App. 17/470,661 · Granted Jun 11, 2024

Sample holder, system and method

Inventors: Thomas Anthony Case (Walnut Creek, CA); Susan Candell (Lafayette, CA); Naomi Kotwal (Dublin, CA); Allen Gu (Pleasanton, CA); Zheren Wu (San Jose, CA); Wayne Broderick (Pleasanton, CA)
Assignee: Carl Zeiss SMT Inc.
G01N23/04G01N23/083G01N2223/307G01N2223/309G01N2223/6113G01N2223/6462
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Quick Facts
Patent No.
US 12,007,339
App. No.
17/470,661
Granted
Jun 11, 2024
Kind
B2
Abstract

A sample holder for holding a sample during an X-ray imaging process includes a sample placement surface on which the sample is placed for positioning the sample in a depth direction of the sample holder. The sample holder also includes a first alignment portion for aligning the sample in a width direction of the sample holder, and a second alignment portion for aligning the sample in a height direction of the sample holder.

Claims (48)

1. A sample holder, comprising:

a sample placement surface configured to support a sample to position the sample in a first direction of the sample holder;

a first alignment portion configured to align the sample in a second direction of the sample holder;

a second alignment portion configured to align the sample in a third direction of the sample holder;

a first hook portion; and

a fixing element hooked into the first hook portion, the fixing element configured to press the sample against: i) the sample placement surface; ii) the first alignment portion; and iii) the second alignment portion,

wherein the first direction is perpendicular to the second direction, the first direction is perpendicular to the third direction, and the second direction is perpendicular to the third direction.

2. The sample holder of claim 1 , wherein:

the first alignment portion is perpendicular to the sample placement surface;

the second alignment portion is perpendicular to the sample placement surface; and

the second alignment portion is perpendicular to the first alignment portion.

3. The sample holder of claim 1 , further comprising a cut-out at an intersection of the first and second alignment portions.

4. The sample holder of claim 1 , wherein the fixing element extends diagonally over the sample placement surface.

5. The sample holder of claim 1 , wherein the fixing element comprises a flexible and radiation-stable material.

6. The sample holder of claim 1 , wherein the fixing element comprises ethylene propylene diene methylene rubber.

7. The sample holder of claim 1 , further comprising a second hook portion, wherein the fixing element is hooked into the second hook portion.

8. The sample holder of claim 7 , wherein the sample placement surface is between the first and second hook portions.

9. The sample holder of claim 8 , further comprising a rear surface opposite the sample placement surface, wherein the first hook portion comprises a notch in the rear surface to receive the fixing element, and the second hook portion comprises a notch in the rear surface to receive the fixing element.

10. The sample holder of claim 9 , wherein the first hook portion is flush with the sample placement surface, and the second hook portion protrudes from the sample placement surface in the first direction.

11. The sample holder of claim 7 , further comprising a rear surface opposite the sample placement surface, wherein the first hook portion comprises a notch in the rear surface to receive the fixing element, and the second hook portion comprises a notch in the rear surface to receive the fixing element.

12. The sample holder of claim 11 , wherein the first hook portion is flush with the sample placement surface, and the second hook portion protrudes from the sample placement surface in the first direction.

13. The sample holder of claim 7 , wherein the first hook portion is flush with the sample placement surface, and the second hook portion protrudes from the sample placement surface in the first direction.

14. The sample holder of claim 1 , further comprising a sample receptacle comprising a plurality of sample receiving sections, wherein each sample receiving section comprises a sample placement surface, a first alignment portion and a second alignment portion.

15. The sample holder of claim 14 , wherein the sample receptacle is integrally formed.

16. The sample holder of claim 14 , further comprising a post to which the sample receptacle is attached and a gripper disc to which the post is attached, wherein the post is fixed to the gripper disc in a form-locking manner by a key connection.

17. A system, comprising:

a radiation source configured to emit X-ray radiation;

a radiation detector configured to receive X-ray radiation emitted from the radiation source; and

a sample holder according to claim 1 ,

wherein the sample holder is between the radiation source and the radiation detector along a path of the X-ray radiation.

18. A method, comprising:

placing a sample on the sample holder of claim 1 ; and

passing X-ray radiation through the sample.

19. The method of claim 18 , further comprising using a detector to X-ray radiation that has passed through the sample.

20. A sample holder, comprising:

a sample placement surface configured to support a sample to position the sample in a first direction of the sample holder;

a first alignment portion configured to align the sample in a second direction of the sample holder;

a second alignment portion configured to align the sample in a third direction of the sample holder;

a sample receptacle comprising a plurality of sample receiving sections;

a post to which the sample receptacle is attached;

a gripper disc to which the post is attached; and

a fixing element configured to press the sample against: i) the sample placement surface; ii) the first alignment portion; and iii) the second alignment portion,

wherein:

the first direction is perpendicular to the second direction;

the first direction is perpendicular to the third direction;

the second direction is perpendicular to the third direction;

each sample receiving section comprises a sample placement surface, a first alignment portion and a second alignment portion; and

the post is fixed to the gripper disc in a form-locking manner by a key connection.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 2, 2022
From: CASE, THOMAS ANTHONY; CANDELL, SUSAN; KOTWAL, NAOMI; WU, ZHEREN; BRODERICK, WAYNE
To: CARL ZEISS X-RAY MICROSCOPY INC.
Reel/Frame 059779/0128 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 2, 2022
From: GU, ALLEN
To: CARL ZEISS SMT. INC.
Reel/Frame 059779/0197 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 2, 2022
From: CARL ZEISS X-RAY MICROSCOPY INC.
To: CARL ZEISS SMT INC.
Reel/Frame 059779/0407 →
Priority Claims (1)
DE 102019120109.8 · Jul 25, 2019 · national
Continuity (3)
Continuation PCTUS2020002318 · Mar 17, 2020
Provisional Application 62821090 · Mar 20, 2019
Related Publication 20210404977A1 · Dec 30, 2021
Cited By (1)
US 12,571,744