IP Library Granted Patent US 12,100,561
Granted Patent B2
US 12,100,561 · App. 17/481,718 · Granted Sep 24, 2024

Solid electrolytic capacitor containing a deoxidized anode

Inventors: Masayuki Wakatsuki (Shiga Pref., JP); Yusuke Sasaki (Shiga. Pref., JP); Shinpei Etou (Shiga Pref., JP)
Assignee: KYOCERA AVX Components Corporation
H01G9/15H01G9/0003H01G9/0036H01G9/028H01G9/032H01G9/0525H01G9/07H01G9/10H01G2009/05
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,100,561
App. No.
17/481,718
Granted
Sep 24, 2024
Kind
B2
Abstract

A capacitor that comprises a capacitor element is provided. The capacitor element comprises a deoxidized and sintered anode body that is formed from a powder having a specific charge of about 35,000 μF*V/g or more. Further, a dielectric overlies the anode body and a solid electrolyte overlies the dielectric. The capacitor also exhibits a normalized aged leakage current of about 0.1% or less.

Claims (37)

1. A solid electrolytic capacitor comprising a capacitor element, the capacitor element comprising a deoxidized and sintered anode body that is formed from a tantalum powder having a specific charge of about 100,000 to about 350,000 μF*V/g, a dielectric which includes tantalum pentoxide and that is formed at a forming voltage of about 35 volts or more that overlies the anode body, and a solid electrolyte that overlies the dielectric, wherein the capacitor exhibits a dielectric strength of about 0.4 V/nm or more and an Aged DCL of about 0.5 μA or less and a normalized aged leakage current of about 0.075% or less as determined according to the following equation:

Normalized Aged Leakage Current=100×(Aged DCL/CV )

wherein,

Aged DCL is the leakage current as measured at a temperature of about 23° C. and at a rated voltage for about 60 seconds after the capacitor is subjected to life testing at a temperature of 85° C. and the rated voltage for 120 hours and then allowed to recover for 60 minutes at a temperature of about 23° C.;

C is initial capacitance (Farads) as determined at a temperature of about 23° C. and an operating frequency of 120 Hz; and

V is the rated voltage (volts).

2. The solid electrolytic capacitor of claim 1 , wherein the Aged DCL is about 25 μA or less.

3. The solid electrolytic capacitor of claim 1 , wherein the solid includes manganese dioxide.

4. The solid electrolytic capacitor of claim 1 , further comprising:

an anode termination that is in electrical connection with the anode body;

a cathode termination that is in electrical connection with the solid electrolyte; and

a housing that encloses the capacitor element and leaves exposed at least a portion of the anode termination and the cathode termination.

5. The solid electrolytic capacitor of claim 4 , wherein the housing is formed from a resinous material that encapsulates the capacitor element.

6. The solid electrolytic capacitor of claim 1 , wherein the powder has a specific charge of from about 100,000 to about 300,000 μF*V/g.

7. The solid electrolytic capacitor of claim 1 , wherein a moisture barrier layer overlies the solid electrolyte.

8. The solid electrolytic capacitor of claim 1 , wherein there is no pre-sintering step prior to deoxidation.

9. The solid electrolytic capacitor of claim 1 , wherein the deoxidized and sintered anode body exhibits a degree of compressive strength of about 1 kilogram-force (“kg/”) or more.

10. A method for forming a solid electrolytic capacitor, the method comprising:

forming an anode by a process that includes compacting a powder which includes tantalum having a specific charge of about 100,000 to about 350,000 μF*V/g into a porous anode body, subjecting the porous anode body to a deoxidation process to form a deoxidized anode body, sintering the deoxidized anode body;

anodically oxidizing the deoxidized and sintered anode body at a forming voltage of about 35 volts or more to form a dielectric which includes tantalum pentoxide that overlies the anode body; and

forming a solid electrolyte that overlies the dielectric;

wherein the capacitor exhibits a dielectric strength of about 0.4 V/nm or more and an Aged DCL of about 0.5 μA or less and a normalized aged leakage current of about 0.075% or less as determined according to the following equation:

Normalized Aged Leakage Current=100×(Aged DCL/CV )

wherein,

Aged DCL is the leakage current as measured at a temperature of about 23° C. and at a rated voltage for about 60 seconds after the capacitor is subjected to life testing at a temperature of 85° C. and the rated voltage for 120 hours and then allowed to recover for 60 minutes at a temperature of about 23° C.;

C is initial capacitance (Farads) as determined at a temperature of about 23° C. and an operating frequency of 120 Hz; and

V is the rated voltage (volts).

11. The method of claim 10 , wherein an anode lead wire is connected to the porous anode body.

12. The method of claim 10 , wherein the deoxidization process includes inserting the porous anode body into an enclosure that contains a getter material.

13. The method of claim 12 , further comprising heating an atmosphere of the enclosure to a temperature of from about 700° ° C. to about 1,200° C.

14. The method of claim 10 , wherein sintering occurs at a temperature of from about 700° C. to about 1,600° C.

15. The method of claim 10 , further comprising pre-sintering the porous anode body prior to the deoxidation process.

16. The method of claim 10 , wherein the Aged DCL is about 0.25 μA or less.

17. The method of claim 10 , wherein the powder has a specific charge of from about 100,000 to about 300,000 μF*V/g.

18. The method of claim 10 , wherein the solid electrolyte includes manganese dioxide.

19. The method of claim 10 , further comprising forming a moisture barrier layer that overlies the solid electrolyte.

20. The method of claim 10 , further comprising no pre-sintering step prior to deoxidation.

Assignments (2)
CHANGE OF NAME Recorded Dec 22, 2021
From: AVX CORPORATION
To: KYOCERA AVX COMPONENTS CORPORATION
Reel/Frame 058563/0762 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 25, 2021
From: WAKATSUKI, MASAYUKI; SASAKI, YUSUKE; ETOU, SHINPEI
To: AVX CORPORATION
Reel/Frame 057891/0137 →
Continuity (2)
Provisional Application 63082071 · Sep 23, 2020
Related Publication 20220093344A1 · Mar 24, 2022