Hard disk format conversion method and apparatus, and storage device
This application provides a hard disk format conversion method and apparatus, and a storage device, and belongs to the field of storage technologies. In this application, a storage format of a storage unit is converted from an SMR format to a PMR format. Because IOPS in the PMR format is higher than IOPS in the SMR format, IOPS in the storage unit can be increased after the storage format is converted. Alternatively, a storage format of a storage unit is converted from the PMR format to the SMR format. Because a storage capacity in the SMR format is higher than a storage capacity in the PMR format, a storage capacity of the storage unit can be increased after the storage format is converted.
1. A hard disk format conversion method, wherein the method is applied to a storage device, and the method comprises:
determining a temperature condition of data stored in the storage device; and
instructing, based on the determined temperature condition, a storage unit in the storage device to disable a first parameter associated with the storage unit and enable a second parameter associated with the storage unit thereby causing the storage unit to be converted from a first storage format into a second storage format, wherein
the first storage format is one of a shingled magnetic recording (SMR) format and a perpendicular magnetic recording (PMR) format, and the second storage format is the other of the SMR format and the PMR format, the first parameter is configured to support the first storage format, and the second parameter is configured to support the second storage format.
2. The method according to claim 1 , wherein the first parameter and the second parameter are preconfigured in the storage device; the first parameter comprises any one of or a combination of a flying height, a distance between a reader and a writer in a tangent line, and a distance between the reader and the writer in a radial direction.
3. The method according to claim 1 , wherein prior to the instructing the storage unit to disable the first parameter and enable the second parameter, the method further comprises:
migrating, to another storage unit of the storage device, data stored in the storage unit.
4. The method according to claim 1 , wherein the determining the temperature condition of data stored in the storage device comprises:
determining cold data stored in the storage device reaches a specified first proportion threshold, wherein the cold data is data whose access frequency is lower than a temperature threshold;
wherein the first storage format is the PMR format and the second storage format is the SMR format.
5. The method according to claim 1 , wherein the determining the temperature condition of data stored in the storage device comprises:
determining hot data stored in the storage device reaches a specified second proportion threshold, wherein the hot data is data whose access frequency is higher than a temperature threshold;
wherein the first storage format is the SMR format and the second storage format is the PMR format.
6. The method according to claim 1 , wherein the determining the temperature condition of data stored in the storage device comprises:
determining, through machine learning, a temperature condition of data stored in the storage device, wherein the machine learning comprises a model obtained through training based on sample data and a temperature label of each piece of the sample data.
7. The method according to claim 1 , wherein the storage unit has data stored therein.
8. A hard disk format conversion apparatus, wherein the apparatus is applied to a storage device, and the apparatus comprises at least one processor configured to:
determine a temperature condition of data stored in the storage device; and
instruct, based on the determined temperature condition, a storage unit in the storage device to disable a first parameter associated with the storage unit and enable a second parameter associated with the storage unit thereby causing the storage unit to be converted from a first storage format into a second storage format, wherein
the first storage format is one of a shingled magnetic recording (SMR) format and a perpendicular magnetic recording (PMR) format and the second storage format is the other of the SMR format and the PMR format the first parameter is configured to support the first storage format, and the second parameter is configured to support the second storage format.
9. The apparatus according to claim 8 , wherein the first parameter and the second parameter are preconfigured in the storage device; the first parameter comprises any one of or a combination of a flying height, a distance between a reader and a writer in a tangent line, and a distance between the reader and the writer in a radial direction.
10. The apparatus according to claim 8 , wherein the
at least one processor is further configured to migrate, to another storage unit of the storage device, data stored in the storage unit.
11. The apparatus according to claim 8 , wherein the at least one processor is configured to determine cold data stored in the storage device reaches a specified first proportion threshold, wherein the cold data is data whose access frequency is lower than a temperature threshold;
and wherein the first storage format is the PMR format and the second storage format is the SMR format.
12. The apparatus according to claim 8 , wherein the at least one processor is configured to determine hot data stored in the storage device reaches a specified second proportion threshold, wherein the hot data is data whose access frequency is higher than a temperature threshold;
and wherein the first storage format is the SMR format and the second storage format is the PMR format.
13. The apparatus according to claim 8 , wherein the at least one processor is configured to determine, through machine learning, a temperature condition of data stored in the storage device, wherein the machine learning comprises a model obtained through training based on sample data and a temperature label of each piece of the sample data.
14. The apparatus according to claim 8 , wherein the storage unit has data stored therein.
15. A storage device comprising a processor and at least two zones, wherein the at least two zones comprise a shingled magnetic recording (SMR) zone and a perpendicular magnetic recording (PMR) zone; and
wherein the processor is configured to:
determine a temperature condition of data stored in the storage device; and
instruct, based on the determined temperature condition, a zone in the storage device to disable a first parameter associated with the zone and enable a second parameter associated with the zone thereby causing the zone to be converted from a first storage format into a second storage format, wherein
the first storage format is one of a shingled magnetic recording (SMR) format and a perpendicular magnetic recording (PMR) format, and the second storage format is the other of the SMR format and the PMR format the first parameter is configured to support the first storage format, and the second parameter is configured to support the second storage format.
16. The storage device according to claim 15 , wherein the first parameter and the second parameter are preconfigured in the storage device; the first parameter comprises any one of or a combination of a flying height, a distance between a reader and a writer in a tangent line, and a distance between the reader and the writer in a radial direction.
17. The storage device according to claim 15 , wherein the processor is further configured to migrate, to another zone of the storage device, the data stored in the zone.
18. The storage device according to claim 15 , wherein the processor is configured to determine cold data stored in the storage device reaches a specified first proportion threshold, wherein the cold data is data whose access frequency is lower than a temperature threshold; and
wherein the first storage format is the PMR format and the second storage format is the SMR format.
19. The storage device according to claim 15 , wherein the processor is configured to determine hot data stored in the storage device reaches a specified second proportion threshold, wherein the hot data is data whose access frequency is higher than a temperature threshold; and
wherein the first storage format is the SMR format and the second storage format is the PMR format.
20. The storage device according to claim 15 , wherein the storage unit has data stored therein.