Granted Patent B2

US 12,445,873 · App. 17/488,461 · Granted Oct 14, 2025

Inventors: Qinyan Jiang (Beijing, CN); Guoyu Zhang (Beijing, CN); Tsuyoshi Shimomura (Kawasaki, JP); Meiyi Jia (Beijing, CN)

Assignee: FUJITSU LIMITED

H04W24/08H04W24/10

Abstract

Claims (43)

1. An SSB-based measurement apparatus, applicable to a user equipment side, the apparatus comprising:

first receiving circuitry configured to receive a measurement object (MO) configuration, wherein the MO configuration includes indication information that includes:

MO-specific indication information indicating quasi co-location (QCL) relationships between synchronization signal blocks (SSBs), the MO-specific indication information being applicable for a cell that lacks applicable cell-specific indication information, and/or

cell-specific indication information indicating quasi co-location (QCL) relationships between synchronization signal blocks (SSBs), the cell-specific indication information being associated with a cell identifier of a cell for which the cell-specific indication information is applicable;

first measuring circuitry configured to obtain a first measurement result of a first cell according to the QCL relationships between the SSBs indicated by the MO-specific indication information in case that the first cell lacks applicable cell-specific indication information or by cell-specific indication information that is applicable for the first cell;

first generating circuitry configured to generate measurement information of the first cell according to the first measurement result of the first cell; and

first transmitting circuitry configured to transmit the measurement information to a network.

2. The apparatus according to claim 1 , wherein the first measuring circuitry comprises:

second measuring circuitry configured to obtain at least one second measurement result of the first cell according to the QCL relationships between SSBs to which the first cell corresponds, the second measurement result being of a beam level or an SSB time domain position level; and

second generating circuitry configured to generate the first measurement result according to at least one second measurement result of the at least one second measurement result.

3. The apparatus according to claim 2 , wherein the second measurement result is of a beam level, and

the second measuring circuitry comprises:

first selecting circuitry configured to select an SSB from multiple SSBs corresponding to a first beam and located at different candidate SSB time domain positions in a window; and

third generating circuitry configured to obtain the second measurement result corresponding to the first beam according to the selected SSB.

4. The apparatus according to claim 2 , wherein the second measurement result is of an SSB time domain position level, and

the second measuring circuitry comprises:

second selecting circuitry configured to select an SSB from multiple SSBs corresponding to a first SSB time domain position in different windows; and

fourth generating circuitry configured to obtain the second measurement result corresponding to the first SSB time domain position according to the selected SSB.

5. The apparatus according to claim 2 , wherein,

the second measurement result is of an SSB time domain position level, and comprises multiple second measurement results corresponding to different SSB time domain positions, and the second generating circuitry selects one of the multiple second measurement results or combines the multiple second measurement results according to the QCL relationships between the SSBs to which the first cell corresponds, and obtains the first measurement result according to the selected second measurement result or a result of combination.

6. The apparatus according to claim 5 , wherein,

different SSB time domain positions corresponding to the second measurement results correspond to the same beam.

7. The apparatus according to claim 1 , wherein the first generating circuitry comprises:

second generating circuitry configured to generate the measurement information of the beam level of the first cell according to the first measurement result; wherein the first measurement result of the first cell is of a beam level; or

third generating circuitry configured to generate the measurement information of the beam level of the first cell according to the first measurement result and the QCL relationships between the SSBs to which the first cell corresponds; wherein the first measurement result of the first cell is of an SSB time domain position level, the measurement information comprises SSB time domain position indices, and beams to which two SSB time domain position indices comprised in the measurement information are different.

8. The apparatus according to claim 7 , wherein,

for multiple first measurement results to which multiple SSB time domain positions corresponding to a beam correspond, the third generating circuitry selects one of the first measurement results or combines the multiple first measurement results, and generates the measurement information of the first cell corresponding to the beam according to the selected first measurement result or a result of combination.

9. The apparatus according to claim 1 , wherein,

the indication information includes at least one of the number of beams and an SSB grouping of the first cell, to indicate the QCL relationships between the SSBs to which the first cell corresponds.

10. The apparatus according to claim 1 , wherein the indication information is transmitted via at least one of a physical broadcast channel (PBCH), MAC signaling, and system information.

11. The apparatus according to claim 10 , wherein the indication information is further used by a user equipment in transceiving other signals and/or channels in the first cell.

12. The apparatus according to claim 10 , wherein the indication information is transmitted by the first cell.

13. The apparatus according to claim 12 , wherein the indication information is used only for measurement of the first cell, or the indication information is further used for SSB-based measurement of a second cell, frequency domain positions and SCSs of SSBs of the second cell and SSBs of the first cell are identical.

14. An apparatus, applicable to a network device side, the apparatus comprising:

second transmitting circuitry configured to transmit a measurement object (MO) configuration for SSB-based measurement to a user equipment, wherein

the MO configuration includes indication information that includes:

MO-specific indication information indicating quasi co-location (QCL) relationships between synchronization signal blocks (SSBs), the MO-specific indication information being applicable for a cell that lacks applicable cell-specific indication information, and/or

cell-specific indication information indicating quasi co-location (QCL) relationships between synchronization signal blocks (SSBs), the cell-specific indication information being associated with a cell identifier of a cell for which the cell-specific indication information is applicable.

15. The apparatus according to claim 14 , wherein the indication information is transmitted via dedicated RRC signaling.

16. The apparatus according to claim 14 , wherein,

the indication information comprises first indication information indicating the QCL relationships between the SSBs,

the first indication information comprising at least one of the number of beams and an SSB grouping.

17. The apparatus according to claim 14 , wherein the indication information indicates a QCL relationship between SSBs via indicating number of beams or number of non-QCLed SSBs.

Assignments (3)

Continuity (2)

References Cited (51)

Cited By (1)

US 12,713,257