IP Library Granted Patent US 11,828,711
Granted Patent B2
US 11,828,711 · App. 17/497,211 · Granted Nov 28, 2023

Method and system for inspecting repair or assembly operations

Inventors: Kurt D. Rueb (Kitchener, CA); Jeff Erbrecht (Waterloo, CA); Beth McAndless (Kitchener, CA); Vincent Tran (Kitchener, CA)
Assignee: VIRTEK VISION INTERNATIONAL INC
G01N21/8806G01N2021/888G01N2021/8861
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Quick Facts
Patent No.
US 11,828,711
App. No.
17/497,211
Granted
Nov 28, 2023
Kind
B2
Abstract

A method of identifying an item on a surface of a workpiece is disclosed. An optical device identifies an item on the surface of a workpiece. An item identification system includes a light projector and a photogrammetry system. One of the light projector and the photogrammetry system generates a three-dimensional coordinate system within the work cell. One of the light projector and the photogrammetry system identifies a location of the surface of the workpiece within the three-dimensional coordinates system. The controller calculates geometric location of the item on the surface of the work piece in the three-dimensional coordinate system as identified by the optical device. The controller signals the light projector to project a beam of light onto the surface of the workpiece identifying a disposition of the item disposed upon the surface of the workpiece.

Claims (17)

1. A method of identifying a geometric location of an item on a surface of a workpiece identified by an optical device, comprising the steps of:

providing a controller;

providing an item identification system including a light projector and a photogrammetry system;

using at least one of said light projector and said photogrammetry system for generating a three-dimensional coordinate system within a work cell;

using at least one of said light projector and said photogrammetry system for identifying a location of the surface of the workpiece within the three-dimensional coordinates system;

said controller calibrating the location of the surface of the workpiece within the three-dimensional coordinate system with the identified item by identifying a first transform and a second transform relative to the surface of the workpiece with said second transform being more accurate than said first transform;

said controller calculating geometric location of the item on the surface of the workpiece in the three-dimensional coordinate system as identified by said optical device; and

said controller signaling the light projector for projecting a beam of light onto the surface of the workpiece for identifying a disposition of the item disposed upon the surface of the workpiece.

2. The method set forth in claim 1 , wherein said step of identifying a disposition of the item is further defined by identifying a location of the item on the surface of the workpiece with the beam of light projected by the light projector.

3. The method set forth in claim 1 , wherein said step of identifying a disposition of the item on the surface of the workpiece is further defined by identifying a work function has been performed on the item identified on the surface of the workpiece.

4. The method set forth in claim 1 , wherein said step of identifying a first transform is further defined by identifying a plurality of transforms being disposed in a hierarchy of importance.

5. The method set forth in claim 1 , wherein said step of calibrating a location of the surface of the workpiece within the three-dimensional coordinate system is further defined by at least one of said light projector and said photogrammetry system identifying a feature of the surface of the workpiece and calibrating the feature within the three-dimensional coordinate system.

6. The method set forth in claim 4 , wherein said step of identifying a feature of the surface of the workpiece is further defined by identifying the feature with a handheld probe and reflecting a light beam from the light source off the probe to one of the photogrammetry device or a light sensor disposed at said light source.

7. The method set forth in claim 1 , wherein said step of providing a light projector and a photogrammetry device is further defined by providing a plurality of light projectors and a plurality of photogrammetry devices.

8. The method set forth in claim 1 , wherein said step of generating a three-dimensional coordinate system within said work cell is further defined by placing a reference in a known location of said work cell and locating said reference with at least one of said light projector and said photogrammetry device.

9. The method set forth in claim 1 , wherein said step of identifying an item on the surface of the workpiece is further defined by identifying a paint defect on a painted surface.

10. The method set forth in claim 9 , wherein said step of identifying a disposition of the item disposed upon the surface of the workpiece is further defined by identifying if a repair of the paint defect has been performed.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2021
From: RUEB, KURT D; MCANDLESS, BETH
To: VIRTEK VISION INTERNATIONAL, INC.
Reel/Frame 058419/0650 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2021
From: ERBRECHT, JEFF
To: VIRTEK VISION INTERNATIONAL, INC.
Reel/Frame 058420/0038 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2021
From: TRAN, VINCENT
To: VIRTEK VISION INTERNATIONAL, INC.
Reel/Frame 058420/0158 →
Continuity (2)
Provisional Application 63089866 · Oct 9, 2020
Related Publication 20220113259A1 · Apr 14, 2022