IP Library Granted Patent US 12,177,106
Granted Patent B2
US 12,177,106 · App. 17/497,608 · Granted Dec 24, 2024

Systems and methods for testing operations for distributed device systems

Inventor: Yishay Miller (Elad, IS)
Assignee: CORNING RESEARCH & DEVELOPMENT CORPORATION
H04L43/50H04B10/25752
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Quick Facts
Patent No.
US 12,177,106
App. No.
17/497,608
Granted
Dec 24, 2024
Kind
B2
Abstract

Systems and methods for testing operations for distributed device systems may use a test signal that is generated at a central unit and looped back internally within the central unit to test the central unit. The test signal may then be sent over a communication medium to a remote unit and looped back to the central unit to test the communication path. Further, the remote unit may include a testing circuit to test internally. By sequentially testing devices within the distributed device system, problems may be isolated and potentially repaired without having to return a device to a manufacturer facility. Even when such returns are needed, only the problematic device is returned, potentially saving time in the installation.

Claims (20)

1. A communication unit comprising:

an interface configured to be coupled to a communication medium for communication to a remote unit;

an operational mode circuit configured to process operational signals sent and received through the interface;

a testing circuit comprising a test signal generator circuit and a test signal checker circuit;

a switch coupled to the operational mode circuit and the testing circuit and configured to switch between test signals and the operational signals; and

a control circuit operatively coupled to the switch and the testing circuit, the control circuit configured to:

cause the testing circuit to generate a test signal;

cause the switch to select the test signal received from the testing circuit;

send the test signal to a circuit to be tested; and

receive a return signal at the testing circuit from the circuit to be tested;

wherein the testing circuit is configured to detect an error based on the test signal checker circuit.

2. The communication unit of claim 1 , wherein the communication unit comprises a central unit and the circuit to be tested is within the central unit.

3. The communication unit of claim 1 , wherein the communication unit comprises a central unit and the circuit to be tested is in the remote unit.

4. The communication unit of claim 1 , wherein the circuit to be tested comprises a common public radio interface (CPRI) intellectual property (IP) circuit.

5. The communication unit of claim 1 , wherein the circuit to be tested comprises a simple form-factor pluggable (SFP) circuit.

6. The communication unit of claim 1 integrated into a distributed router unit (DRU).

7. The communication unit of claim 6 , wherein the circuit to be tested comprises a downstream-facing common public radio interface (CPRI) intellectual property (IP) (CPRI IP) circuit.

8. The communication unit of claim 6 , wherein the circuit to be tested comprises an upstream-facing common public radio interface (CPRI) intellectual property (IP) (CPRI IP) circuit.

9. The communication unit of claim 1 , further comprising a jumper configured to route the test signal back to the testing circuit.

10. The communication unit of claim 1 integrated into a central unit of a distributed antenna system (DAS).

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 12, 2025
From: CORNING OPTICAL COMMUNICATIONS LLC
To: ANI ACQUISITION SUB, LLC
Reel/Frame 071270/0328 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 13, 2025
From: CORNING RESEARCH & DEVELOPMENT CORPORATION
To: CORNING OPTICAL COMMUNICATIONS LLC
Reel/Frame 070629/0125 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 13, 2022
From: MILLER, YISHAY
To: CORNING RESEARCH & DEVELOPMENT CORPORATION
Reel/Frame 062067/0287 →