Echelle spectrometer
Spectrometers include an optical assembly with optical elements arranged to receive light from a light source and direct the light along a light path to a multi-element detector, dispersing light of different wavelengths to different spatial locations on the multi-element detector. The optical assembly includes: (i) a collimator arranged in the light path to receive the light from the light source, the collimator including a mirror having a freeform surface; (2) a dispersive sub-assembly including an echelle grating, the dispersive sub-assembly being arranged in the light path to receive light from the collimator; and (3) a Schmidt telescope arranged in the light path to receive light from the dispersive sub-assembly and focus the light to a field, the multi-element detector being arranged at the field.
1. A spectrometer, comprising:
an optical assembly comprising a plurality of optical elements arranged to receive light from a light source and direct the light along a light path to a multi-element detector, dispersing light of different wavelengths to different spatial locations on the multi-element detector, the optical assembly comprising:
a collimator arranged in the light path to receive the light from the light source, the collimator comprising a mirror having a freeform surface;
a dispersive sub-assembly comprising an echelle grating, the dispersive sub-assembly being arranged in the light path to receive light from the collimator; and
a Schmidt telescope arranged in the light path to receive light from the dispersive sub-assembly and focus the light to a field, the multi-element detector being arranged at the field.
2. The spectrometer of claim 1 , wherein the freeform surface is shaped to reduce optical aberrations associated with the Schmidt telescope.
3. The spectrometer of claim 1 , wherein the freeform surface is shaped according to a parabolic surface modified by one or more non-zero coefficients of orthogonal polynomial functions.
4. The spectrometer of claim 1 , wherein the echelle grating is arranged to disperse the light into constituent wavelengths in a first plane and the collimator comprises a second dispersive optical element arranged to disperse the light into constituent wavelengths along a second plane orthogonal to the first plane.
5. The spectrometer of claim 4 , wherein the second dispersive optical element is selected from the group consisting of a diffraction grating, a prism, and a grism.
6. The spectrometer of claim 5 , wherein the second dispersive optical element is a prism comprising two flat, non-parallel surfaces arranged in the light path.
7. The spectrometer of claim 4 , wherein the second dispersive element is arranged in the light path so that the light makes a double pass through the second dispersive element.
8. The spectrometer of claim 7 , wherein the second dispersive element is arranged in the light path so that the light makes a first pass through the second dispersive element before incidence on the echelle grating and the light makes a second pass through the second dispersive element after incidence on the echelle grating.
9. The spectrometer of claim 7 , wherein the second dispersive element is arranged in the light path so that the light makes both passes through the second dispersive element after incidence on the echelle grating.
10. The spectrometer of claim 1 , wherein the Schmidt telescope is an off-axis Schmidt telescope.
11. The spectrometer of claim 1 , wherein the Schmidt telescope comprises a spherical mirror and a field lens.
12. The spectrometer of claim 11 , wherein the field lens comprises an aspheric lens configured to reduce a curvature of an image field of the Schmidt telescope.
13. The spectrometer of claim 11 , wherein the field lens is tilted with respect to an optical axis of the Schmidt telescope.
14. The spectrometer of claim 11 , wherein the Schmidt telescope comprises a Schmidt corrector arranged in the light path between the dispersive sub-assembly and the mirror of the Schmidt telescope.
15. The spectrometer of claim 14 , wherein the Schmidt corrector is a mirror.
16. The spectrometer of claim 14 , wherein the Schmidt corrector comprises an aspheric optical surface or a freeform surface.
17. The spectrometer of claim 1 , further comprising an aperture arranged in the light path between the light source and the optical assembly.
18. The spectrometer of claim 1 , wherein the optical assembly further comprises a Schmidt corrector arranged in the light path downstream from the dispersive sub-assembly.
19. The spectrometer of claim 1 , wherein the light source is an inductively coupled plasma (ICP) system.
20. The spectrometer of claim 1 , wherein the optical assembly is arranged for operation across a band of wavelengths in a range from about 160 nm to about 900 nm.
21. The spectrometer of claim 1 , wherein the optical assembly is configured such that the light is incident on the collimator only once along the light path.