POLARIMETRIC IMAGING CAMERA
In one example, an apparatus comprises: a semiconductor substrate comprising a first photodiode and a second photodiode, the first photodiode being positioned adjacent to the second photodiode along a first axis; a birefringent crystal positioned over the first photodiode and the second photodiode along a second axis perpendicular to the first axis; and a microlens positioned over the birefringent crystal along the second axis, the microlens having an asymmetric curvature along the first axis, an apex point of the curvature being positioned over the first photodiode along the second axis.
1 . An apparatus, comprising:
a semiconductor substrate comprising a first photodiode and a second photodiode, the first photodiode being positioned adjacent to the second photodiode along a first axis;
a birefringent crystal positioned over the first photodiode and the second photodiode along a second axis perpendicular to the first axis; and
a microlens positioned over the birefringent crystal along the second axis, the microlens having an asymmetric curvature along the first axis, an apex point of the asymmetric curvature being positioned over the first photodiode along the second axis.
2 . The apparatus of claim 1 , wherein the microlens is configured to focus incident light on the birefringent crystal over the first photodiode along the second axis.
3 . The apparatus of claim 2 , further comprising a wave plate sandwiched between the birefringent crystal and the semiconductor substrate, the wave plate being configured to rotate a polarization state of the incident light.
4 . The apparatus of claim 2 , wherein:
the birefringent crystal is configured to:
refract an ordinary ray component of the incident light by a first angle, the first angle being based on a first refractive index associated with the ordinary ray component, the ordinary ray component having a first electric field that is perpendicular to a principal plane of the birefringent crystal; and
refract an extraordinary ray component of the incident light by a second angle, the second angle being based on a second refractive index associated with the extraordinary ray component, the extraordinary ray component having a second electric field that is parallel with the principal plane of the birefringent crystal;
the first photodiode is configured to measure an intensity of the ordinary ray component; and
the second photodiode is configured to measure an intensity of the extraordinary ray component.
5 . The apparatus of claim 4 , wherein the second angle is related to the first angle based on the first refractive index, the second refractive index, and a third angle between an optical axis of the birefringent crystal and a surface normal of the birefringent crystal.
6 . The apparatus of claim 4 , wherein a depth of the birefringent crystal is based on: (i) a separation between a center of the first photodiode and a center of second photodiode and (ii) a wavelength of light of the extraordinary ray component and the ordinary ray component.
7 . The apparatus of claim 1 , wherein:
the semiconductor substrate comprises a deep trench isolation (DTI) formed between the first photodiode and the second photodiode along the first axis;
the first photodiode and the second photodiode are part of a pixel cell array comprising pixel cells;
each pixel cell comprises a plurality of photodiodes; and
the semiconductor substrate comprises DTI formed between the pixel cells of the pixel cell array.
8 . The apparatus of claim 1 , further comprising a layer of light absorption structure sandwiched between the birefringent crystal and the semiconductor substrate, the layer of light absorption structure being configured to enhance a light collection efficiency of each of the first photodiode and the second photodiode.
9 . The apparatus of claim 1 , further comprising a color filter sandwiched between the microlens and the semiconductor substrate along the second axis.
10 . The apparatus of claim 1 , wherein:
the first photodiode and the second photodiode are part of, respectively, a first sub-pixel and a second sub-pixel;
the apparatus is configured to:
generate a first pixel of a first image frame based on a first output of the first photodiode; and
generate a second pixel of a second image frame based on a second output of the second photodiode; and
the first pixel corresponds to the second pixel.
11 . An apparatus comprising an array of pixel cells, each pixel cell comprising:
a first photodiode and a second photodiode formed in a semiconductor substrate, the first photodiode being positioned adjacent to the second photodiode along a first axis;
a birefringent crystal positioned over the first photodiode and the second photodiode along a second axis perpendicular to the first axis; and
a microlens positioned over the birefringent crystal along the second axis, the microlens having an asymmetric curvature, an apex point of the asymmetric curvature being positioned over the first photodiode along the second axis.
12 . The apparatus of claim 11 , wherein the asymmetric curvature is a first asymmetric curvature, wherein:
each pixel cell, of the array of pixel cells, further comprises a third photodiode and a fourth photodiode;
the first photodiode, the second photodiode, the third photodiode, and the fourth photodiode forms a two-by-two array of photodiodes;
the microlens is positioned over the two-by-two array of photodiodes along the second axis; and
the microlens has a second asymmetric curvature along a third axis along which the first photodiode is positioned adjacent to the third photodiode, the third axis being perpendicular to each of the first axis and the second axis.
13 . The apparatus of claim 11 , wherein principal planes of the birefringent crystal for each pixel cell of the array of pixel cells are parallel with each other.
14 . The apparatus of claim 11 , wherein:
a first principal plane of the birefringent crystal of a first pixel cell of the array of pixel cells is parallel with a first direction;
a second principal plane of the birefringent crystal of a second pixel cell of the array of pixel cells is parallel with a second direction; and
the first direction is perpendicular to the second direction.
15 . The apparatus of claim 11 , further comprising:
a processor configured to process outputs of the array of pixel cells to generate image frames; and
a display of a mobile device configured to display content based on the image frames.
16 . The apparatus of claim 15 , wherein the mobile device comprises a head-mounted display (HMID).
17 . A method comprising:
refracting light incident light, using a microlens, to produce refracted light, wherein:
a first photodiode is positioned adjacent to a second photodiode in a semiconductor substrate along a first axis;
the microlens is positioned over a birefringent crystal along a second axis;
the second axis is orthogonal to the first axis;
the microlens has an asymmetric curvature along the first axis and an apex point of the asymmetric curvature is positioned over the first photodiode along the second axis;
separating the refracted light into a first component of light and a second component of light, using the birefringent crystal, wherein the birefringent crystal is positioned over the first photodiode and the second photodiode along the second axis;
detecting the first component of light using the first photodiode; and
detecting the second component of light using the second photodiode.
18 . The method of claim 17 , wherein the first component of light is a first linear polarization, and the second component of light is a second linear polarization orthogonal to the first linear polarization.
19 . The method of claim 17 , wherein:
the microlens is part of an optical element; and
the method further comprises generating image frames using an array of optical elements.
20 . The method of claim 17 , wherein:
detecting the first component of light using the first photodiode comprises measuring an ordinary ray component of light from the birefringent crystal; and
detecting the second component of light using the second photodiode comprises measuring an extraordinary ray component of light from the birefringent crystal.