IP Library Granted Patent US 12,578,438
Granted Patent B2
US 12,578,438 · App. 17/516,398 · Granted Mar 17, 2026

Device and method for scanning frequency-modulated continuous-wave LiDAR range measurement

Inventor: Vladimir Davydenko (Bad Herrenalb, DE)
Assignee: Scantinel Photonics GmbH
G01S7/4817G01S17/42G01S17/58G01S17/931
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Quick Facts
Patent No.
US 12,578,438
App. No.
17/516,398
Granted
Mar 17, 2026
Kind
B2
Abstract

A device for scanning range measurement to an object has a light source that generates an optical output signal having a varying frequency. A plurality of optical processing units are connected optically in parallel to the light source. Each processing unit has an optical distribution matrix with a plurality of optical switches that distribute the optical output signals from the light source selectively to different optical waveguides. A plurality of free space couplers outcouple the optical output signals into the free space, and couple optical output signals, which were reflected on the object, into the associated optical waveguides as optical measurement signals. A polarization sensitive light splitter directs the optical measurement signals detectors that detect a superposition of the optical measurement signals with the optical output signals supplied via a local oscillator light path.

Claims (52)

1 . A device for scanning range measurement to an object, comprising

a light source configured to generate an optical output signal having a varying frequency,

a plurality of optical processing units that are connected optically in parallel to the light source, wherein each processing unit comprises:

an optical distribution matrix comprising a plurality of optical switches and configured to distribute the optical output signal, which is supplied to the respective processing unit, selectively to different optical waveguides,

a plurality of free space couplers, wherein there is a one-to-one correspondence between the optical waveguides and the free space couplers such that each free space coupler is connected to an associated optical waveguide, and wherein each free space coupler is configured to

outcouple the optical output signal guided in the associated optical waveguides into the free space, and

to couple an optical output signal, which was reflected on the object, into the associated optical waveguide as an optical measurement signal,

and wherein each processing unit further comprises

a detector configured to detect a superposition of the optical measurement signal with the optical output signal generated by the light source and supplied via a local oscillator light path, and

a photonically integrated polarization sensitive light splitter directing the optical measurement signal guided in the associated optical waveguide to the detector,

and wherein the device further comprises

a deflection optical unit configured to deflect the optical output signals outcoupled from the free space couplers so that they are emitted in different directions, and

an evaluation unit configured to determine the range to the object from the superposition detected by the detectors.

2 . The device of claim 1 , wherein the deflection optical unit has a front focal plane in which the free space couplers or images of the free space couplers are arranged.

3 . The device of claim 1 , wherein the light source is configured to generate multiple optical output signals having a varying frequency in different frequency bands simultaneously.

4 . The device of claim 1 , wherein the light source is configured to generate an optical output signal having a frequency that linearly rises and linearly falls alternately over time.

5 . The device of claim 1 , wherein the polarization sensitive light splitter is arranged in a light path between one of the free space couplers and the optical distribution matrix.

6 . The device of claim 1 , wherein the polarization sensitive light splitter is arranged in a light path between the light source and the optical distribution matrix.

7 . The device of claim 1 , comprising a waveplate arranged in free space so that at least the optical output signals outcoupled from two free space couplers impinge on the waveplate.

8 . The device of claim 1 , wherein each processing unit comprises a polarization rotator arranged in a light path between the polarization sensitive light splitter and the detector or in the local oscillator light path.

9 . The device of claim 1 , wherein each processing unit comprises a variable attenuator arranged in the local oscillator light path.

10 . A method for scanning range measurement to an object, comprising the following steps:

a) generating optical output signals having a varying frequency with a light source;

b) guiding the optical output signals through multiple optical processing units that are arranged optically in parallel;

c) distributing, in each optical processing unit, the optical output signals to a plurality of optical waveguides using optical switches of a distribution matrix;

d) outcoupling, in each optical processing unit, the optical output signal into the free space with a plurality of free space couplers, wherein there is a one-to-one correspondence between the optical waveguides and the free space couplers such that each free space coupler is connected to an associated optical waveguide, and wherein optical output signals outcoupled at different points in time are emitted in different directions;

e) coupling, in each optical processing unit, optical output signals, which have been reflected on the object, as optical measurement signals into the optical waveguides;

f) changing a polarization direction of the optical measurement signals;

g) guiding, in each optical processing unit, the optical measurements signals guided in the associated optical waveguide via a photonically integrated polarization sensitive light splitter to a detector of the respective processing unit;

h) detecting a superposition of the optical measurement signals with the optical output signals generated by the light source; and

i) determining the range to the object based on the detected superposition.

11 . The method of claim 10 , wherein the measurement optical signals impinge on the polarization sensitive light splitter after passing the distribution matrix.

12 . The method of claim 10 , wherein the measurement optical signals impinge on the polarization sensitive light splitter without passing the distribution matrix.

13 . The method of claim 10 , wherein the polarization direction of the optical measurement signals is changed before the superposition with the optical output signals.

14 . The method of claim 10 , wherein the optical signals generated by the light source are variably attenuated before they are superimposed with the measurement optical signals.

15 . A device for scanning range measurement to an object, comprising

a light source configured to generate an optical output signal having a varying frequency,

a plurality of optical processing units that are connected optically in parallel to the light source, wherein each processing unit comprises:

an optical distribution matrix comprising a plurality of optical switches and configured to distribute the optical output signal, which is supplied to the respective processing unit, selectively to different optical waveguides,

a plurality of free space couplers, wherein there is a one-to-one correspondence between the optical waveguides and the free space couplers such that each free space coupler is connected to an associated optical waveguide, and wherein each free space coupler is configured to

outcouple the optical output signal guided in the associated optical waveguides into the free space, and

to couple an optical output signal, which was reflected on the object, into the associated optical waveguide as an optical measurement signal,

and wherein each processing unit further comprises

a detector configured to detect a superposition of the optical measurement signal with the optical output signal generated by the light source and supplied via a local oscillator light path, and

a photonically integrated polarization sensitive light splitter directing the optical measurement signal guided in the associated optical waveguide to the detector and arranged in a light path between one of the free space couplers and the optical distribution matrix,

and wherein the device further comprises

a waveplate arranged in free space so that at least the optical output signals outcoupled from two free space couplers impinge on the waveplate,

a deflection optical unit configured to deflect the optical output signals outcoupled from the free space couplers so that they are emitted in different directions, and

an evaluation unit configured to determine the range to the object from the superposition detected by the detectors.

16 . The device of claim 15 , wherein the light source is configured to generate an optical output signal having a frequency that linearly rises and linearly falls alternately over time.

17 . The device of claim 15 , wherein each processing unit comprises a polarization rotator arranged in a light path between the polarization sensitive light splitter and the detector or in the local oscillator light path.

18 . The device of claim 15 , wherein each processing unit comprises a variable attenuator arranged in the local oscillator light path.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2026
From: SCANTINEL PHOTONICS GMBH
To: SCANTINEL GMBH
Reel/Frame 075353/0757 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 24, 2021
From: DAVYDENKO, VLADIMIR
To: SCANTINEL PHOTONICS GMBH
Reel/Frame 058201/0458 →
Priority Claims (1)
EP 21168784 · Apr 16, 2021 · regional
Continuity (1)
Related Publication 20220334227A1 · Oct 20, 2022
References Cited (17)
US 8913636B2 · Roos et al. · 2014 [cited by applicant]
US 11709240B2 · Rezk · 2023 [cited by examiner]
US 20170371227A1 · Skirlo et al. · 2017 [cited by applicant]
US 20180364336A1 · Hosseini et al. · 2018 [cited by applicant]
US 20190265574A1 · Skirlo et al. · 2019 [cited by applicant]
US 20190377135A1 · Mansouri Rad et al. · 2019 [cited by applicant]
US 20200088884A1 · Sayyah · 2020 [cited by examiner]
US 20200124711A1 · Rezk et al. · 2020 [cited by applicant]
US 20210096228A1 · Behzadi · 2021 [cited by examiner]
US 20210096259A1 · Piggott et al. · 2021 [cited by applicant]
US 20210181320A1 · Oza · 2021 [cited by examiner]
US 20210367679A1 · Zhao · 2021 [cited by examiner]
US 20220137198A1 · Hamidi · 2022 [cited by examiner]
US 20220146645A1 · Michaels · 2022 [cited by examiner]
WO WO2021021654A1 · 2021 [cited by applicant]
Scantinel Photonics GmbH, Extended European Search Report, Application No. 21168784.3, Sep. 29, 2021, 7 pgs. [cited by applicant]
Heck, Highly Integrated Optical Phased Arrays: Photonic Integrated Circuits for Optical Beam Shaping and Beam Steering, Dec. 10, 2015, 16 pgs. [cited by applicant]