Systems, methods, and devices for high-speed input/output margin testing
A margin testing device includes at least one interface structured to connect to a device under test (DUT) one or more controllers structured to create a set of test signals based on a sequence of pseudo random data and one or more pre-defined parameters, and an output structured to send the set of test signals to the DUT. Methods and a system for testing a DUT with the disclosed margin tester and other testing device are also described.
1. A margin testing device, comprising:
at least one interface structured to connect to a device under test (DUT);
one or more controllers structured to create a set of test signals based on a sequence of pseudo random data and one or more pre-defined parameters; and
an output structured to send the set of test signals to the DUT.
2. The margin testing device of claim 1 in which the pre-defined parameters include parameters for testing time margin, voltage margin, or both time margin and voltage margin.
3. The margin testing device of claim 1 , further comprising an arbitrary waveform generator input to the one or more controllers, in which the one or more controllers combines a signal received on the arbitrary waveform generator input with a randomly generated binary number to create the sequence of pseudo random data.
4. The margin testing device of claim 1 , further comprising a trigger output that generates a trigger signal based on a state of the DUT.
5. The margin testing device of claim 1 , further comprising a user interface through which a user may modify the pre-defined parameters used to create an operating envelope that limits the test signals in the set of test signals.
6. The margin testing device of claim 5 in which test results are displayed on a test report screen of the user interface, and in which one of the test results is that a particular test passed within a threshold amount of failing.
7. The margin testing device of claim 6 in which the threshold amount is user definable.
8. A method of operating a margin tester, comprising:
generating a pseudo random binary data sequence;
creating a set of test signals based on the pseudo random binary data sequence and one or more pre-defined parameters; and
sending the set of test signals to a device under test (DUT).
9. The method of claim 8 further comprising limiting the one or more pre-defined parameters by adding a time margin to the pseudo random binary data sequence, adding a voltage margin to the pseudo random binary data sequence, or adding both a time margin and a voltage margin to the pseudo random binary data sequence.
10. The method of claim 8 , in which generating a pseudo random binary data sequence comprises generating a pseudo random binary data sequence using an arbitrary waveform generator as an input.
11. The method of claim 8 , further comprising generating a trigger signal based on a state of the DUT.
12. The method of claim 8 , further comprising accepting the pre-defined parameters from a user through a user interface.
13. The method of claim 12 , further comprising displaying test results on a test report screen of the user interface, in which one of the test results is that a particular test passed within a threshold amount of failing.
14. The method of claim 13 , further comprising accepting the threshold amount from the user through the user interface.
15. A testing system, comprising:
an oscilloscope coupleable to a device under test through one or more data probes through which the oscilloscope may capture signals on the device under test; and
a margin testing device, including:
at least one interface structured to connect to the device under test,
a pseudo random binary sequence generator configured to generate a sequence of pseudo random binary data,
a controller to generate test signals that represent the sequence of pseudo random binary data,
an operating envelope definer to limit the test signals to one or more pre-defined signal parameters, and
an output structured to send the limited test signals to the device under test.
16. The testing system of claim 15 in which the one or more pre-defined signal parameters include time margin, voltage margin, or both time margin and voltage margin.
17. The testing system of claim 15 , further comprising an arbitrary waveform generator input to the pseudo random binary sequence generator, in which the pseudo random binary sequence generator combines a waveform signal received on the waveform generator input with a randomly generated binary number to generate the sequence of pseudo random binary data.
18. The testing system of claim 15 , further comprising a trigger output of the margin testing device that generates a trigger signal based on a state of the device under test, and further comprising a trigger input of the oscilloscope to receive the trigger signal.
19. The testing system of claim 15 , further comprising a user interface through which a user may modify the pre-defined signal parameters used to create an operating envelope.
20. The testing system of claim 19 in which test results are displayed on a test report screen of the user interface, and in which one of the test results is that a particular test passed within a threshold amount of failing.